title: Perpendicular Magnetic Anisotropy and Spin Glass-like Behavior in Molecular Beam Epitaxy Grown Chromium Telluride Thin Films.
abstract: Reflection high-energy electron diffraction (RHEED), scanning tunneling microscopy (STM), vibrating sample magnetometry, and other physical property measurements are used to investigate the structure, morphology, magnetic, and magnetotransport properties of (001)-oriented Cr2Te3 thin films grown on Al2O3(0001) and Si(111)-(7×7) surfaces by molecular beam epitaxy. Streaky RHEED patterns indicate flat smooth film growth on both substrates. STM studies show the hexagonal arrangements of surface atoms. Determination of the lattice parameter from the atomically resolved STM image is consistent with the bulk crystal structures. Magnetic measurements show the film is ferromagnetic, having a Curie temperature of about 180 K, and a spin glass-like behavior was observed below 35 K. Magnetotransport measurements show the metallic nature of the film with a perpendicular magnetic anisotropy along the c-axis.
authors.affiliation: Microelectronics Research Center, The University of Texas at Austin, Austin, Texas 78758, United States.
authors.forename: Anupam
authors.initials: A
authors.lastname: Roy
authors.affiliation: Microelectronics Research Center, The University of Texas at Austin, Austin, Texas 78758, United States.
authors.forename: Samaresh
authors.initials: S
authors.lastname: Guchhait
authors.affiliation: Microelectronics Research Center, The University of Texas at Austin, Austin, Texas 78758, United States.
authors.forename: Rik
authors.initials: R
authors.lastname: Dey
authors.affiliation: Microelectronics Research Center, The University of Texas at Austin, Austin, Texas 78758, United States.
authors.forename: Tanmoy
authors.initials: T
authors.lastname: Pramanik
authors.affiliation: Microelectronics Research Center, The University of Texas at Austin, Austin, Texas 78758, United States.
authors.forename: Cheng-Chih
authors.initials: CC
authors.lastname: Hsieh
authors.affiliation: Microelectronics Research Center, The University of Texas at Austin, Austin, Texas 78758, United States.
authors.forename: Amritesh
authors.initials: A
authors.lastname: Rai
authors.affiliation: Microelectronics Research Center, The University of Texas at Austin, Austin, Texas 78758, United States.
authors.forename: Sanjay K
authors.initials: SK
authors.lastname: Banerjee
keywords: chromium telluride; ferromagnetic metal; magnetoresistance; molecular beam epitaxy; perpendicular magnetic anisotropy; scanning tunneling microscopy; spin glass