title: Statistical detection of EEG synchrony using empirical bayesian inference.
abstract: There is growing interest in understanding how the brain utilizes synchronized oscillatory activity to integrate information across functionally connected regions. Computing phase-locking values (PLV) between EEG signals is a popular method for quantifying such synchronizations and elucidating their role in cognitive tasks. However, high-dimensionality in PLV data incurs a serious multiple testing problem. Standard multiple testing methods in neuroimaging research (e.g., false discovery rate, FDR) suffer severe loss of power, because they fail to exploit complex dependence structure between hypotheses that vary in spectral, temporal and spatial dimension. Previously, we showed that a hierarchical FDR and optimal discovery procedures could be effectively applied for PLV analysis to provide better power than FDR. In this article, we revisit the multiple comparison problem from a new Empirical Bayes perspective and propose the application of the local FDR method (locFDR; Efron, 2001) for PLV synchrony analysis to compute FDR as a posterior probability that an observed statistic belongs to a null hypothesis. We demonstrate the application of Efron's Empirical Bayes approach for PLV synchrony analysis for the first time. We use simulations to validate the specificity and sensitivity of locFDR and a real EEG dataset from a visual search study for experimental validation. We also compare locFDR with hierarchical FDR and optimal discovery procedures in both simulation and experimental analyses. Our simulation results showed that the locFDR can effectively control false positives without compromising on the power of PLV synchrony inference. Our results from the application locFDR on experiment data detected more significant discoveries than our previously proposed methods whereas the standard FDR method failed to detect any significant discoveries.
authors.affiliation: ATR Neural Information Analysis Laboratories, Kyoto 619-0288, Japan.
authors.forename: Archana K
authors.initials: AK
authors.lastname: Singh
authors.affiliation: National Institute of Advanced Industrial Science and Technology (AIST), Tsukuba 305-8568 Japan.
authors.forename: Hideki
authors.initials: H
authors.lastname: Asoh
authors.affiliation: National Institute of Advanced Industrial Science and Technology (AIST), Tsukuba 305-8568 Japan.
authors.forename: Yuji
authors.initials: Y
authors.lastname: Takeda
authors.affiliation: National Institute of Advanced Industrial Science and Technology (AIST), Tsukuba 305-8568 Japan.
authors.forename: Steven
authors.initials: S
authors.lastname: Phillips
mesh_terms: D001499:Bayes Theorem; D003198:Computer Simulation; D003627:Data Interpretation, Statistical; D004569:Electroencephalography / Q000706:statistics & numerical data*; D005189:False Positive Reactions; D006801:Humans; D015233:Models, Statistical; D011336:Probability
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