title: Photoacoustic signal and noise analysis for Si thin plate: signal correction in frequency domain.
abstract: Methods for photoacoustic signal measurement, rectification, and analysis for 85 μm thin Si samples in the 20-20 000 Hz modulation frequency range are presented. Methods for frequency-dependent amplitude and phase signal rectification in the presence of coherent and incoherent noise as well as distortion due to microphone characteristics are presented. Signal correction is accomplished using inverse system response functions deduced by comparing real to ideal signals for a sample with well-known bulk parameters and dimensions. The system response is a piece-wise construction, each component being due to a particular effect of the measurement system. Heat transfer and elastic effects are modeled using standard Rosencweig-Gersho and elastic-bending theories. Thermal diffusion, thermoelastic, and plasmaelastic signal components are calculated and compared to measurements. The differences between theory and experiment are used to detect and correct signal distortion and to determine detector and sound-card characteristics. Corrected signal analysis is found to faithfully reflect known sample parameters.
authors.affiliation: Institute of Physics, University of Belgrade, Pregrevica 118, 11080 Belgrade-Zemun, Serbia.
authors.forename: D D
authors.initials: DD
authors.lastname: Markushev
authors.affiliation: Institute of Physics, University of Belgrade, Pregrevica 118, 11080 Belgrade-Zemun, Serbia.
authors.forename: M D
authors.initials: MD
authors.lastname: Rabasović
authors.affiliation: Institute for Multidisciplinary Researches, University of Belgrade, P.O. Box 33, 11030 Belgrade, Serbia.
authors.forename: D M
authors.initials: DM
authors.lastname: Todorović
authors.affiliation: Institute of Nuclear Sciences "Vinca", University of Belgrade, P.O. Box 522, 11001 Belgrade, Serbia.
authors.forename: S
authors.initials: S
authors.lastname: Galović
authors.affiliation: Department of Chemistry and Biochemistry, Utah State University, Logan, Utah 84322-0300, USA.
authors.forename: S E
authors.initials: SE
authors.lastname: Bialkowski