title: Semiconductor-enhanced Raman scattering for highly robust SERS sensing: the case of phosphate analysis.
abstract: Quantitative analysis of phosphate anions was achieved by measurement of "turn-off" SERS based on the first-layer effect of a chemical mechanism. More importantly, our results demonstrate that it is possible, by means of semiconductor-enhanced Raman scattering, to enhance the SERS sensing performance including stability and reproducibility.
authors.affiliation: Department of Chemistry, School of Science and Technology, Kwansei Gakuin University, Sanda, Hyogo 669-1337, Japan. jiwei@kwansei.ac.jp ozaki@kwansei.ac.jp.
authors.forename: Wei
authors.initials: W
authors.lastname: Ji
authors.forename: Wei
authors.initials: W
authors.lastname: Song
authors.forename: Ichiro
authors.initials: I
authors.lastname: Tanabe
authors.forename: Yue
authors.initials: Y
authors.lastname: Wang
authors.forename: Bing
authors.initials: B
authors.lastname: Zhao
authors.forename: Yukihiro
authors.initials: Y
authors.lastname: Ozaki
mesh_terms: D010316:Particle Size; D010710:Phosphates / Q000032:analysis*; D012666:Semiconductors; D013059:Spectrum Analysis, Raman / Q000379:methods*; D013499:Surface Properties
chemical_list: D010710:Phosphates