title: Improved Zernike-type phase contrast for transmission electron microscopy.
abstract: Zernike phase contrast has been recognized as a means of recording high-resolution images with high contrast using a transmission electron microscope. This imaging mode can be used to image typical phase objects such as unstained biological molecules or cryosections of biological tissue. According to the original proposal discussed in Danev and Nagayama (2001) and references therein, the Zernike phase plate applies a phase shift of π/2 to all scattered electron beams outside a given scattering angle and an image is recorded at Gaussian focus or slight underfocus (below Scherzer defocus). Alternatively, a phase shift of -π/2 is applied to the central beam using the Boersch phase plate. The resulting image will have an almost perfect contrast transfer function (close to 1) from a given lowest spatial frequency up to a maximum resolution determined by the wave length, the amount of defocus and the spherical aberration of the microscope. In this paper, I present theory and simulations showing that this maximum spatial frequency can be increased considerably without loss of contrast by using a Zernike or Boersch phase plate that leads to a phase shift between scattered and unscattered electrons of only π /4, and recording images at Scherzer defocus. The maximum resolution can be improved even more by imaging at extended Scherzer defocus, though at the cost of contrast loss at lower spatial frequencies.
authors: Royal Institute of Technology, School of Technology and Health and Karolinska Institutet, Department of Biosciences and Nutrition at Novum, 14183, Huddinge, Sweden.
authors: P J B
authors: PJ
authors: Koeck
mesh_terms: D016616:Cryoultramicrotomy; D004583:Electrons; D007091:Image Processing, Computer-Assisted / Q000379:methods; D046529:Microscopy, Electron, Transmission / Q000295:instrumentation*; D008858:Microscopy, Phase-Contrast / Q000379:methods*
keywords: Boersch phase plate; Zernike phase plate; cryotransmission electron microscopy; phase contrast; weak phase object approximation