title: Development of a novel straining holder for transmission electron microscopy compatible with single tilt-axis electron tomography.
abstract: We have developed a newly designed straining specimen holder for in situ transmission electron microscopy (TEM) compatible with high-angle single tilt-axis electron tomography. The holder can deform a TEM specimen under tensile stress with the strain rate between 1.5 × 10(-6) and 5.2 × 10(-3) s(-1). We have also confirmed that the maximum tilt angle of the specimen holder reaches ±60° with a rectangular shape aluminum specimen. The new specimen holder, termed as 'straining and tomography holder', will have wide range potential applications in materials science.
authors.affiliation: Institute for Materials Research, Tohoku University, 2-1-1 Katahira, Aoba-ku, Sendai 980-8577, Japan ksato@imr.tohoku.ac.jp.
authors.forename: K
authors.initials: K
authors.lastname: Sato
authors.affiliation: Mel-Build Corporation, Nishi-ku, Fukuoka 819-0052, Japan.
authors.forename: H
authors.initials: H
authors.lastname: Miyazaki
authors.affiliation: Mel-Build Corporation, Nishi-ku, Fukuoka 819-0052, Japan.
authors.forename: T
authors.initials: T
authors.lastname: Gondo
authors.affiliation: FEI Company Japan Ltd., Minato-ku, Tokyo 108-0075, Japan.
authors.forename: S
authors.initials: S
authors.lastname: Miyazaki
authors.affiliation: Department of Materials Science and Engineering, Virginia Tech, Blacksburg, VA 24061, USA.
authors.forename: M
authors.initials: M
authors.lastname: Murayama
authors.affiliation: Department of Engineering Sciences for Electronics and Materials, Kyushu University, Kasuga, 6-1 Kasugakoen, Kasuga, Fukuoka 816-8580, Japan.
authors.forename: S
authors.initials: S
authors.lastname: Hata
keywords: dynamic 3D observation; electron tomography; in situ deformation; in situ transmission electron microscopy