title: Low voltage and high ON/OFF ratio field-effect transistors based on CVD MoS2 and ultra high-k gate dielectric PZT.
abstract: MoS2 and other atomic-level thick layered materials have been shown to have a high potential for outperforming Si transistors at the scaling limit. In this work, we demonstrate a MoS2 transistor with a low voltage and high ON/OFF ratio. A record small equivalent oxide thickness of ∼1.1 nm has been obtained by using ultra high-k gate dielectric Pb(Zr0.52Ti0.48)O3. The low threshold voltage (<0.5 V) is comparable to that of the liquid/gel gated MoS2 transistor. The small sub-threshold swing of 85.9 mV dec(-1), the high ON/OFF ratio of ∼10(8) and the negligible hysteresis ensure a high performance of the MoS2 transistor operating at 1 V. The extracted field-effect mobility of 1-10 cm(2) V(-1) s(-1) suggests a high crystalline quality of the CVD-grown MoS2 flakes. The combination of the two-dimensional layered semiconductor and the ultra high-k dielectric may enable the development of low-power electronic applications.
authors.affiliation: Department of Applied Physics, The Hong Kong Polytechnic University, Kowloon, Hong Kong, China. ychai@polyu.edu.hk.
authors.forename: Changjian
authors.initials: C
authors.lastname: Zhou
authors.forename: Xinsheng
authors.initials: X
authors.lastname: Wang
authors.forename: Salahuddin
authors.initials: S
authors.lastname: Raju
authors.forename: Ziyuan
authors.initials: Z
authors.lastname: Lin
authors.forename: Daniel
authors.initials: D
authors.lastname: Villaroman
authors.forename: Baoling
authors.initials: B
authors.lastname: Huang
authors.forename: Helen Lai-Wa
authors.initials: HL
authors.lastname: Chan
authors.forename: Mansun
authors.initials: M
authors.lastname: Chan
authors.forename: Yang
authors.initials: Y
authors.lastname: Chai