title: Time-of-flight secondary ion mass spectroscopy with bismuth primary ions of clean and air-exposed surfaces of tellurium.
abstract: The regularity of Bi(+), Bi(3+) and Bi(3++) primary ions in the time- of-flight secondary ion mass spectroscopy fragment pattern of air oxidized Te and Bi(+) direct-current scan cleaned Te is discussed. The most intensive fragments for a cleaned Te surface are positive and negative Tex and BiTex clusters. The sequence of secondary ion cluster formation is Bi-Te alloying followed by sputtering and ionization. For oxidized Te the chemical composition of the produced TexOy fragments satisfies the relation y=2x for positive fragments and y=2x+1 for negative ones. Experimental findings are in a good agreement with the results predicted by Plog's model for TeO2.
authors.affiliation: Center for Microelectronics and Nanotechnology, Rzeszow University, Rejtana 16A, Rzeszow 35-959, Poland. malgorzata.trzyna@gmail.com.
authors.forename: Malgorzata
authors.initials: M
authors.lastname: Trzyna
authors.affiliation: Center for Microelectronics and Nanotechnology, Rzeszow University, Rejtana 16A, Rzeszow 35-959, Poland. nberchen@gmail.com.
authors.forename: Nicolas
authors.initials: N
authors.lastname: Berchenko
authors.affiliation: ION-TOF GmbH, Heisenberg str. 15, Muenster, 48149, Germany. derk.rading@iontof.com.
authors.forename: Derk
authors.initials: D
authors.lastname: Rading
authors.affiliation: Center for Innovation and Transfer of Natural Sciences and Engineering Knowledge, Rzeszow University, Rejtana 16A, Rzeszow 35-959, Poland. cebulski@univ.rzeszow.pl.
authors.forename: Jozef
authors.initials: J
authors.lastname: Cebulski