Simultaneous nanocalorimetry and fast XRD measurements to study the silicide formation in Pd/a-Si bilayers.
The use of a membrane-based chip nanocalorimeter in a powder diffraction beamline is described. Simultaneous wide-angle X-ray scattering and scanning nanocalorimetric measurements are performed on a thin-film stack of palladium/amorphous silicon (Pd/a-Si) at heating rates from 0.1 to 10 K s(-1). The nanocalorimeter works under a power-compensation scheme previously developed by the authors. Kinetic and structural information of the consumed and created phases can be obtained from the combined techniques. The formation of Pd2Si produces a broad calorimetric peak that contains overlapping individual processes. It is shown that Pd consumption precedes the formation of the crystalline Pd2Si phase and that the crystallite size depends on the heating rate of the experiment.
Departament de Física, Universitat Autònoma de Barcelona, Cerdanyola del Vallès, 08193, Spain.
Manel
M
Molina-Ruiz
Departament de Física, Universitat Autònoma de Barcelona, Cerdanyola del Vallès, 08193, Spain.
Pablo
P
Ferrando-Villalba
Departament de Física, Universitat Autònoma de Barcelona, Cerdanyola del Vallès, 08193, Spain.
Cristian
C
Rodríguez-Tinoco
Departament de Física, Universitat Autònoma de Barcelona, Cerdanyola del Vallès, 08193, Spain.
Gemma
G
Garcia
Departament de Física, Universitat Autònoma de Barcelona, Cerdanyola del Vallès, 08193, Spain.
Javier
J
Rodríguez-Viejo
ALBA Synchrotron Radiation Facility, Cerdanyola del Vallès 08290, Spain.
Inma
I
Peral
Departament de Física, Universitat Autònoma de Barcelona, Cerdanyola del Vallès, 08193, Spain.
Aitor F
AF
Lopeandía
WAXS; nanocalorimetry; thin-film stack