Soft X-ray angle-resolved photoemission with micro-positioning techniques for metallic V₂O₃.
Soft X-ray angle-resolved photoemission has been performed for metallic V2O3. By combining a microfocus beam (40 µm × 65 µm) and micro-positioning techniques with a long-working-distance microscope, it has been possible to observe band dispersions from tiny cleavage surfaces with a typical size of several tens of µm. The photoemission spectra show a clear position dependence, reflecting the morphology of the cleaved sample surface. By selecting high-quality flat regions on the sample surface, it has been possible to perform band mapping using both photon-energy and polar-angle dependences, opening the door to three-dimensional angle-resolved photoemission spectroscopy for typical three-dimensional correlated materials where large cleavage planes are rarely obtained.
Graduate School of Engineering Science, Osaka University, Machikaneyama 1-3, Toyonaka, Osaka 560-8531, Japan.
Hidenori
H
Fujiwara
Graduate School of Engineering Science, Osaka University, Machikaneyama 1-3, Toyonaka, Osaka 560-8531, Japan.
Takayuki
T
Kiss
Graduate School of Engineering Science, Osaka University, Machikaneyama 1-3, Toyonaka, Osaka 560-8531, Japan.
Yuki K
YK
Wakabayashi
Faculty of Science and Engineering, Konan University, Okamoto 8-9-1, Kobe, Hyogo 658-8501, Japan.
Yoshito
Y
Nishitani
Graduate School of Engineering Science, Osaka University, Machikaneyama 1-3, Toyonaka, Osaka 560-8531, Japan.
Takeo
T
Mori
Graduate School of Engineering Science, Osaka University, Machikaneyama 1-3, Toyonaka, Osaka 560-8531, Japan.
Yuki
Y
Nakata
Graduate School of Engineering Science, Osaka University, Machikaneyama 1-3, Toyonaka, Osaka 560-8531, Japan.
Satoshi
S
Kitayama
Graduate School of Engineering Science, Osaka University, Machikaneyama 1-3, Toyonaka, Osaka 560-8531, Japan.
Kazuaki
K
Fukushima
Graduate School of Engineering Science, Osaka University, Machikaneyama 1-3, Toyonaka, Osaka 560-8531, Japan.
Shinji
S
Ikeda
Graduate School of Engineering Science, Osaka University, Machikaneyama 1-3, Toyonaka, Osaka 560-8531, Japan.
Hiroto
H
Fuchimoto
Graduate School of Engineering Science, Osaka University, Machikaneyama 1-3, Toyonaka, Osaka 560-8531, Japan.
Yosuke
Y
Minowa
Randall Laboratory of Physics, University of Michigan, Ann Arbor, MI 48109, USA.
Sung-Kwan
SK
Mo
Advanced Light Source, Lawrence Berkeley National Laboratory, Berkeley, CA 94720, USA.
Jonathan D
JD
Denlinger
Randall Laboratory of Physics, University of Michigan, Ann Arbor, MI 48109, USA.
James W
JW
Allen
Department of Physics, Purdue University, West Lafayette, IN 47907, USA.
Patricia
P
Metcalf
Department of Chemistry, Graduate School of Science, Kyoto University, Oiwake Town, Kitashirakawa, Sakyo, Kyoto 606-8502, Japan.
Masaki
M
Imai
Department of Chemistry, Graduate School of Science, Kyoto University, Oiwake Town, Kitashirakawa, Sakyo, Kyoto 606-8502, Japan.
Kazuyoshi
K
Yoshimura
Institute of Scientific and Industrial Research, Osaka University, Mihogaoka 8-1, Ibaraki, Osaka 567-0047, Japan.
Shigemasa
S
Suga
Japan Synchrotron Radiation Research Institute (JASRI), Kouto 1-1-1, Sayo, Hyogo 679-5198, Japan.
Takayuki
T
Muro
Graduate School of Engineering Science, Osaka University, Machikaneyama 1-3, Toyonaka, Osaka 560-8531, Japan.
Akira
A
Sekiyama
angle-resolved photoemission spectroscopy (ARPES); micro-positioning; soft X-ray; strongly correlated oxide