Publisher's Note: "Monte-Carlo simulation of noise in hard X-ray Transmission Crystal Spectrometers: Identification of contributors to the background noise and shielding optimization" [Rev. Sci. Instrum. 85, 11D615 (2014)].
CEA, DAM, DIF, F-91297 Arpajon, France.
I
I
Thfoin
CEA, DAM, DIF, F-91297 Arpajon, France.
C
C
Reverdin
CELIA, Université de Bordeaux-CNRS-CEA, F-33405 Talence, France.
S
S
Hulin
Laboratoire Kastler Brossel, ENS, CNRS, UPMC, 75005 Paris Cedex, France.
C I
CI
Szabo
LULI Ecole Polytechnique, CNRS, CEA, UPMC, 91128 Palaiseau, France.
S
S
Bastiani-Ceccotti
CELIA, Université de Bordeaux-CNRS-CEA, F-33405 Talence, France.
D
D
Batani
LULI Ecole Polytechnique, CNRS, CEA, UPMC, 91128 Palaiseau, France.
E
E
Brambrink
LULI Ecole Polytechnique, CNRS, CEA, UPMC, 91128 Palaiseau, France.
M
M
Koenig
CEA, DAM, DIF, F-91297 Arpajon, France.
A
A
Duval
CEA, Centre de Saclay, IRFU, F-91191 Gif-sur-Yvette, France.
X
X
Leboeuf
CEA, DAM, DIF, F-91297 Arpajon, France.
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L
Lecherbourg
CEA, DAM, DIF, F-91297 Arpajon, France.
B
B
Rossé
University of Milano, via Celoria 16, 20133 Milano, Italy.
A
A
Morace
CELIA, Université de Bordeaux-CNRS-CEA, F-33405 Talence, France.
J J
JJ
Santos
CELIA, Université de Bordeaux-CNRS-CEA, F-33405 Talence, France.
X
X
Vaisseau
CELIA, Université de Bordeaux-CNRS-CEA, F-33405 Talence, France.
C
C
Fourment
CELIA, Université de Bordeaux-CNRS-CEA, F-33405 Talence, France.
L
L
Giuffrida
LULI Ecole Polytechnique, CNRS, CEA, UPMC, 91128 Palaiseau, France.
M
M
Nakatsutsumi