Aberration-corrected STEM for atomic-resolution imaging and analysis.
Aberration-corrected scanning transmission electron microscopes are able to form electron beams smaller than 100 pm, which is about half the size of an average atom. Probing materials with such beams leads to atomic-resolution images, electron energy loss and energy-dispersive X-ray spectra obtained from single atomic columns and even single atoms, and atomic-resolution elemental maps. We review briefly how such electron beams came about, and show examples of applications. We also summarize recent developments that are propelling aberration-corrected scanning transmission electron microscopes in new directions, such as complete control of geometric aberration up to fifth order, and ultra-high-energy resolution EELS that is allowing vibrational spectroscopy to be carried out in the electron microscope.
Nion Co., Kirkland, Washington, U.S.A.|Department of Physics, Arizona State University, Tempe, Arizona, U.S.A.
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Krivanek
Nion Co., Kirkland, Washington, U.S.A.
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Lovejoy
Nion Co., Kirkland, Washington, U.S.A.
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Dellby
Aberration correction; electron energy loss spectroscopy; electron monochromator; energy-analyzed Rutherford scattering; energy-dispersive X-ray spectroscopy; high-order aberrations; monochromated electron beams; scanning transmission electron microscopy (STEM); vibrational spectroscopy