title: Reliability of neuronal information conveyed by unreliable neuristor-based leaky integrate-and-fire neurons: a model study.
abstract: We conducted simulations on the neuronal behavior of neuristor-based leaky integrate-and-fire (NLIF) neurons. The phase-plane analysis on the NLIF neuron highlights its spiking dynamics--determined by two nullclines conditional on the variables on the plane. Particular emphasis was placed on the operational noise arising from the variability of the threshold switching behavior in the neuron on each switching event. As a consequence, we found that the NLIF neuron exhibits a Poisson-like noise in spiking, delimiting the reliability of the information conveyed by individual NLIF neurons. To highlight neuronal information coding at a higher level, a population of noisy NLIF neurons was analyzed in regard to probability of successful information decoding given the Poisson-like noise of each neuron. The result demonstrates highly probable success in decoding in spite of large variability--due to the variability of the threshold switching behavior--of individual neurons.
authors.affiliation: Electronic Materials Research Center, Korea Institute of Science and Technology, 136-791 Seoul, Republic of Korea.|Department of Materials Science and Engineering and Inter-university Semiconductor Research Center, Seoul National University, 151-744 Seoul, Republic of Korea.
authors.forename: Hyungkwang
authors.initials: H
authors.lastname: Lim
authors.affiliation: Electronic Materials Research Center, Korea Institute of Science and Technology, 136-791 Seoul, Republic of Korea.|Department of Materials Science and Engineering, Seoul National University of Science and Technology, 139-743 Seoul, Republic of Korea.
authors.forename: Vladimir
authors.initials: V
authors.lastname: Kornijcuk
authors.affiliation: Electronic Materials Research Center, Korea Institute of Science and Technology, 136-791 Seoul, Republic of Korea.|Department of Materials Science and Engineering and Inter-university Semiconductor Research Center, Seoul National University, 151-744 Seoul, Republic of Korea.
authors.forename: Jun Yeong
authors.initials: JY
authors.lastname: Seok
authors.affiliation: Electronic Materials Research Center, Korea Institute of Science and Technology, 136-791 Seoul, Republic of Korea.
authors.forename: Seong Keun
authors.initials: SK
authors.lastname: Kim
authors.affiliation: Electronic Materials Research Center, Korea Institute of Science and Technology, 136-791 Seoul, Republic of Korea.
authors.forename: Inho
authors.initials: I
authors.lastname: Kim
authors.affiliation: Department of Materials Science and Engineering and Inter-university Semiconductor Research Center, Seoul National University, 151-744 Seoul, Republic of Korea.
authors.forename: Cheol Seong
authors.initials: CS
authors.lastname: Hwang
authors.affiliation: Electronic Materials Research Center, Korea Institute of Science and Technology, 136-791 Seoul, Republic of Korea.
authors.forename: Doo Seok
authors.initials: DS
authors.lastname: Jeong
mesh_terms: D000818:Animals; D006801:Humans; D008959:Models, Neurological; D009474:Neurons / Q000502:physiology*; D009435:Synaptic Transmission / Q000502:physiology*