title: Field-effect transistors based on amorphous black phosphorus ultrathin films by pulsed laser deposition.
abstract: Amorphous black phosphorus (a-BP) ultrathin films are deposited by pulsed laser deposition. a-BP field-effect trans-istors, exhibiting high carrier mobility and moderate on/off current ratio, are demonstrated. Thickness dependence of the bandgap, mobility, and on/off ratio are observed. These results offer not only a new nanoscale member in the BP family, but also a new opportunity to develop nano-electronic devices.
authors.affiliation: Department of Applied Physics, The Hong Kong Polytechnic University, Hung Hom Kowloon, Hong Kong, P. R. China.
authors.forename: Zhibin
authors.initials: Z
authors.lastname: Yang
authors.affiliation: Department of Applied Physics, The Hong Kong Polytechnic University, Hung Hom Kowloon, Hong Kong, P. R. China.
authors.forename: Jianhua
authors.initials: J
authors.lastname: Hao
authors.affiliation: Department of Applied Physics, The Hong Kong Polytechnic University, Hung Hom Kowloon, Hong Kong, P. R. China.
authors.forename: Shuoguo
authors.initials: S
authors.lastname: Yuan
authors.affiliation: Department of Applied Physics, The Hong Kong Polytechnic University, Hung Hom Kowloon, Hong Kong, P. R. China.
authors.forename: Shenghuang
authors.initials: S
authors.lastname: Lin
authors.affiliation: Department of Applied Physics, The Hong Kong Polytechnic University, Hung Hom Kowloon, Hong Kong, P. R. China.
authors.forename: Hei Man
authors.initials: HM
authors.lastname: Yau
authors.affiliation: Department of Applied Physics, The Hong Kong Polytechnic University, Hung Hom Kowloon, Hong Kong, P. R. China.
authors.forename: Jiyan
authors.initials: J
authors.lastname: Dai
authors.affiliation: Department of Applied Physics, The Hong Kong Polytechnic University, Hung Hom Kowloon, Hong Kong, P. R. China.
authors.forename: Shu Ping
authors.initials: SP
authors.lastname: Lau
keywords: amorphous ultrathin films; black phosphorus; field-effect transistors; pulsed laser deposition; wafer-scale