title: Time-dependent mechanical-electrical coupled behavior in single crystal ZnO nanorods.
abstract: Nanoscale time-dependent mechanical-electrical coupled behavior of single crystal ZnO nanorods was systematically explored, which is essential for accessing the long-term reliability of the ZnO nanorod-based flexible devices. A series of compression creep tests combined with in-situ electrical measurement was performed on vertically-grown single crystal ZnO nanorods. Continuous measurement of the current (I)-voltage (V) curves before, during, after the creep tests revealed that I is non-negligibly increased as a result of the time-dependent deformation. Analysis of the I-V curves based on the thermionic emission-diffusion theory allowed extraction of nanorod resistance, which was shown to decrease as time-dependent deformation. Finally, based on the observations in this study, a simple analytical model for predicting the reduction in nanorod resistance as a function of creep strain that is induced from diffusional mechanisms is proposed, and this model was demonstrated to be in an excellent agreement with the experimental results.
authors.affiliation: 1] Division of Materials Science and Engineering, Hanyang University, Seoul 133-791, Korea [2] Graduate School of EEWS, Korea Advanced Institute of Science and Technology, Daejeon 305-701, Korea.
authors.forename: Yong-Jae
authors.initials: YJ
authors.lastname: Kim
authors.affiliation: Graduate School of EEWS, Korea Advanced Institute of Science and Technology, Daejeon 305-701, Korea.
authors.forename: Tae Gwang
authors.initials: TG
authors.lastname: Yun
authors.affiliation: Division of Materials Science and Engineering, Hanyang University, Seoul 133-791, Korea.
authors.forename: In-Chul
authors.initials: IC
authors.lastname: Choi
authors.affiliation: Division of Materials Science and Engineering, Hanyang University, Seoul 133-791, Korea.
authors.forename: Sungwoong
authors.initials: S
authors.lastname: Kim
authors.affiliation: Division of Materials Science and Engineering, Hanyang University, Seoul 133-791, Korea.
authors.forename: Won Il
authors.initials: WI
authors.lastname: Park
authors.affiliation: Graduate School of EEWS, Korea Advanced Institute of Science and Technology, Daejeon 305-701, Korea.
authors.forename: Seung Min
authors.initials: SM
authors.lastname: Han
authors.affiliation: Division of Materials Science and Engineering, Hanyang University, Seoul 133-791, Korea.
authors.forename: Jae-il
authors.initials: JI
authors.lastname: Jang