title: A Simple Metric for Determining Resolution in Optical, Ion, and Electron Microscope Images.
abstract: A resolution metric intended for resolution analysis of arbitrary spatially calibrated images is presented. By fitting a simple sigmoidal function to pixel intensities across slices of an image taken perpendicular to light-dark edges, the mean distance over which the light-dark transition occurs can be determined. A fixed multiple of this characteristic distance is then reported as the image resolution. The prefactor is determined by analysis of scanning transmission electron microscope high-angle annular dark field images of Si. This metric has been applied to optical, scanning electron microscope, and helium ion microscope images. This method provides quantitative feedback about image resolution, independent of the tool on which the data were collected. In addition, our analysis provides a nonarbitrary and self-consistent framework that any end user can utilize to evaluate the resolution of multiple microscopes from any vendor using the same metric.
authors.affiliation: Boulder Laboratories,National Institute of Standards and Technology,Boulder,CO 80305,USA.
authors.forename: Alexandra E
authors.initials: AE
authors.lastname: Curtin
authors.affiliation: Boulder Laboratories,National Institute of Standards and Technology,Boulder,CO 80305,USA.
authors.forename: Ryan
authors.initials: R
authors.lastname: Skinner
authors.affiliation: Boulder Laboratories,National Institute of Standards and Technology,Boulder,CO 80305,USA.
authors.forename: Aric W
authors.initials: AW
authors.lastname: Sanders
keywords: Rayleigh criterion; helium ion microscopy; microscopy; optical microscopy