title: Origin and compensation of imaging artefacts in localization-based super-resolution microscopy.
abstract: Interpretation of high resolution images provided by localization-based microscopy techniques is a challenge due to imaging artefacts that can be categorized by their origin. They can be introduced by the optical system, by the studied sample or by the applied algorithms. Some artefacts can be eliminated via precise calibration procedures, others can be reduced only below a certain value. Images studied both theoretically and experimentally are qualified either by pattern specific metrics or by a more general metric based on fluorescence correlation spectroscopy.
authors.affiliation: Department of Optics and Quantum Electronics, University of Szeged, Szeged, Dóm tér 9, 6720, Hungary. Electronic address: erdelyim@physx.u-szeged.hu.
authors.forename: M
authors.initials: M
authors.lastname: Erdélyi
authors.affiliation: Department of Optics and Quantum Electronics, University of Szeged, Szeged, Dóm tér 9, 6720, Hungary.
authors.forename: J
authors.initials: J
authors.lastname: Sinkó
authors.affiliation: Department of Optics and Quantum Electronics, University of Szeged, Szeged, Dóm tér 9, 6720, Hungary.
authors.forename: R
authors.initials: R
authors.lastname: Kákonyi
authors.affiliation: Department of Applied Informatics, University of Szeged, Boldogasszony sgt. 6, 6725, Hungary.
authors.forename: A
authors.initials: A
authors.lastname: Kelemen
authors.affiliation: Department of Chemical Engineering and Biotechnology, University of Cambridge, New Museums Site, Pembroke Street, Cambridge CB2 3RA, UK.
authors.forename: E
authors.initials: E
authors.lastname: Rees
authors.affiliation: Department of Optics and Quantum Electronics, University of Szeged, Szeged, Dóm tér 9, 6720, Hungary.
authors.forename: D
authors.initials: D
authors.lastname: Varga
authors.affiliation: Department of Optics and Quantum Electronics, University of Szeged, Szeged, Dóm tér 9, 6720, Hungary.
authors.forename: G
authors.initials: G
authors.lastname: Szabó
mesh_terms: D000465:Algorithms; D016477:Artifacts; D002138:Calibration; D008856:Microscopy, Fluorescence / Q000379:methods*
keywords: Imaging artefacts; Localization error; Localization microscopy; Super-resolution microscopy