title: Electron Correlation Microscopy: A New Technique for Studying Local Atom Dynamics Applied to a Supercooled Liquid.
abstract: Electron correlation microscopy (ECM) is a new technique that utilizes time-resolved coherent electron nanodiffraction to study dynamic atomic rearrangements in materials. It is the electron scattering equivalent of photon correlation spectroscopy with the added advantage of nanometer-scale spatial resolution. We have applied ECM to a Pd40Ni40P20 metallic glass, heated inside a scanning transmission electron microscope into a supercooled liquid to measure the structural relaxation time τ between the glass transition temperature T g and the crystallization temperature, T x . τ determined from the mean diffraction intensity autocorrelation function g 2(t) decreases with temperature following an Arrhenius relationship between T g and T g +25 K, and then increases as temperature approaches T x . The distribution of τ determined from the g 2(t) of single speckles is broad and changes significantly with temperature.
authors.affiliation: 1Department of Materials Science and Engineering,University of Wisconsin-Madison,Madison,WI 53706,USA.
authors.forename: Li
authors.initials: L
authors.lastname: He
authors.affiliation: 1Department of Materials Science and Engineering,University of Wisconsin-Madison,Madison,WI 53706,USA.
authors.forename: Pei
authors.initials: P
authors.lastname: Zhang
authors.affiliation: 2Ames Laboratory,Department of Materials Science and Engineering,Iowa State University,Ames,IA 50011,USA.
authors.forename: Matthew F
authors.initials: MF
authors.lastname: Besser
authors.affiliation: 2Ames Laboratory,Department of Materials Science and Engineering,Iowa State University,Ames,IA 50011,USA.
authors.forename: Matthew Joseph
authors.initials: MJ
authors.lastname: Kramer
authors.affiliation: 1Department of Materials Science and Engineering,University of Wisconsin-Madison,Madison,WI 53706,USA.
authors.forename: Paul M
authors.initials: PM
authors.lastname: Voyles
keywords: bulk metallic glass; electron correlation microscopy; fluctuation electron microscopy; scanning transmission electron microscopy; x-ray photon correlation spectroscopy