title: Tuning Localized Surface Plasmon Resonance in Scanning Near-Field Optical Microscopy Probes.
abstract: A reproducible route for tuning localized surface plasmon resonance in scattering type near-field optical microscopy probes is presented. The method is based on the production of a focused-ion-beam milled single groove near the apex of electrochemically etched gold tips. Electron energy-loss spectroscopy and scanning transmission electron microscopy are employed to obtain highly spatially and spectroscopically resolved maps of the milled probes, revealing localized surface plasmon resonance at visible and near-infrared wavelengths. By changing the distance L between the groove and the probe apex, the localized surface plasmon resonance energy can be fine-tuned at a desired absorption channel. Tip-enhanced Raman spectroscopy is applied as a test platform, and the results prove the reliability of the method to produce efficient scattering type near-field optical microscopy probes.
authors.affiliation: †Departamento de Física, Universidade Federal de Minas Gerais, Belo Horizonte, MG 30123-970, Brazil.|‡Divisão de Metrologia de Materiais, Instituto Nacional de Metrologia, Qualidade e Tecnologia (INMETRO), Duque de Caxias, RJ 25250-020, Brazil.
authors.forename: Thiago L
authors.initials: TL
authors.lastname: Vasconcelos
authors.affiliation: ‡Divisão de Metrologia de Materiais, Instituto Nacional de Metrologia, Qualidade e Tecnologia (INMETRO), Duque de Caxias, RJ 25250-020, Brazil.
authors.forename: Bráulio S
authors.initials: BS
authors.lastname: Archanjo
authors.affiliation: §Departamento de Física, Universidade Federal de Juiz de Fora, Juiz de Fora, MG 36036-900, Brazil.
authors.forename: Benjamin
authors.initials: B
authors.lastname: Fragneaud
authors.affiliation: ‡Divisão de Metrologia de Materiais, Instituto Nacional de Metrologia, Qualidade e Tecnologia (INMETRO), Duque de Caxias, RJ 25250-020, Brazil.
authors.forename: Bruno S
authors.initials: BS
authors.lastname: Oliveira
authors.affiliation: ⊥Department of Micro- and Nanosciences, Aalto University, Tietotie 3, 02150 Espoo, Finland.
authors.forename: Juha
authors.initials: J
authors.lastname: Riikonen
authors.affiliation: ⊥Department of Micro- and Nanosciences, Aalto University, Tietotie 3, 02150 Espoo, Finland.
authors.forename: Changfeng
authors.initials: C
authors.lastname: Li
authors.affiliation: †Departamento de Física, Universidade Federal de Minas Gerais, Belo Horizonte, MG 30123-970, Brazil.
authors.forename: Douglas S
authors.initials: DS
authors.lastname: Ribeiro
authors.affiliation: †Departamento de Física, Universidade Federal de Minas Gerais, Belo Horizonte, MG 30123-970, Brazil.
authors.forename: Cassiano
authors.initials: C
authors.lastname: Rabelo
authors.affiliation: †Departamento de Física, Universidade Federal de Minas Gerais, Belo Horizonte, MG 30123-970, Brazil.
authors.forename: Wagner N
authors.initials: WN
authors.lastname: Rodrigues
authors.affiliation: †Departamento de Física, Universidade Federal de Minas Gerais, Belo Horizonte, MG 30123-970, Brazil.
authors.forename: Ado
authors.initials: A
authors.lastname: Jorio
authors.affiliation: ‡Divisão de Metrologia de Materiais, Instituto Nacional de Metrologia, Qualidade e Tecnologia (INMETRO), Duque de Caxias, RJ 25250-020, Brazil.|∥Departamento de Engenharia Metalúrgica e de Materiais, Universidade Federal do Rio de Janeiro, Rio de Janeiro, RJ 21941-972, Brazil.
authors.forename: Carlos A
authors.initials: CA
authors.lastname: Achete
authors.affiliation: †Departamento de Física, Universidade Federal de Minas Gerais, Belo Horizonte, MG 30123-970, Brazil.|‡Divisão de Metrologia de Materiais, Instituto Nacional de Metrologia, Qualidade e Tecnologia (INMETRO), Duque de Caxias, RJ 25250-020, Brazil.
authors.forename: Luiz Gustavo
authors.initials: LG
authors.lastname: Cançado
keywords: EELS; FIB; SNOM; TERS; localized surface plasmon resonance; near-field