title: A posteriori correction of camera characteristics from large image data sets.
abstract: Large datasets are emerging in many fields of image processing including: electron microscopy, light microscopy, medical X-ray imaging, astronomy, etc. Novel computer-controlled instrumentation facilitates the collection of very large datasets containing thousands of individual digital images. In single-particle cryogenic electron microscopy ("cryo-EM"), for example, large datasets are required for achieving quasi-atomic resolution structures of biological complexes. Based on the collected data alone, large datasets allow us to precisely determine the statistical properties of the imaging sensor on a pixel-by-pixel basis, independent of any "a priori" normalization routinely applied to the raw image data during collection ("flat field correction"). Our straightforward "a posteriori" correction yields clean linear images as can be verified by Fourier Ring Correlation (FRC), illustrating the statistical independence of the corrected images over all spatial frequencies. The image sensor characteristics can also be measured continuously and used for correcting upcoming images.
authors.affiliation: 1] Leiden Institute of Chemistry, Leiden University, 2333 CC Leiden, The Netherlands [2] The Institute of Nanoscopy, Maastricht University, 6211 LK Maastricht, The Netherlands.
authors.forename: Pavel
authors.initials: P
authors.lastname: Afanasyev
authors.affiliation: The Institute of Nanoscopy, Maastricht University, 6211 LK Maastricht, The Netherlands.
authors.forename: Raimond B G
authors.initials: RB
authors.lastname: Ravelli
authors.affiliation: Netherlands Centre for Electron Nanoscopy (NeCEN), 2333 CC Leiden, The Netherlands.
authors.forename: Rishi
authors.initials: R
authors.lastname: Matadeen
authors.affiliation: 1] Netherlands Centre for Electron Nanoscopy (NeCEN), 2333 CC Leiden, The Netherlands [2] FEI Company, 5651 GG Eindhoven, The Netherlands.
authors.forename: Sacha
authors.initials: S
authors.lastname: De Carlo
authors.affiliation: FEI Company, 5651 GG Eindhoven, The Netherlands.
authors.forename: Gijs
authors.initials: G
authors.lastname: van Duinen
authors.affiliation: 1] Leiden Institute of Chemistry, Leiden University, 2333 CC Leiden, The Netherlands [2] The Institute of Nanoscopy, Maastricht University, 6211 LK Maastricht, The Netherlands.
authors.forename: Bart
authors.initials: B
authors.lastname: Alewijnse
authors.affiliation: The Institute of Nanoscopy, Maastricht University, 6211 LK Maastricht, The Netherlands.
authors.forename: Peter J
authors.initials: PJ
authors.lastname: Peters
authors.affiliation: Leiden Institute of Chemistry, Leiden University, 2333 CC Leiden, The Netherlands.
authors.forename: Jan-Pieter
authors.initials: JP
authors.lastname: Abrahams
authors.affiliation: Brazilian Nanotechnology National Laboratory - LNNano, CNPEM, C.P. 6192, 13083-970 Campinas SP, Brasil.
authors.forename: Rodrigo V
authors.initials: RV
authors.lastname: Portugal
authors.affiliation: Image Science Software GmbH, Gillweg 3, D-14193 Berlin, Germany.
authors.forename: Michael
authors.initials: M
authors.lastname: Schatz
authors.affiliation: 1] Leiden Institute of Chemistry, Leiden University, 2333 CC Leiden, The Netherlands [2] Brazilian Nanotechnology National Laboratory - LNNano, CNPEM, C.P. 6192, 13083-970 Campinas SP, Brasil [3] Faculty of Natural Sciences, Imperial College London, London SW7 2AZ, UK.
authors.forename: Marin
authors.initials: M
authors.lastname: van Heel