title: Grain rotation and lattice deformation during photoinduced chemical reactions revealed by in situ X-ray nanodiffraction.
abstract: In situ X-ray diffraction (XRD) and transmission electron microscopy (TEM) have been used to investigate many physical science phenomena, ranging from phase transitions, chemical reactions and crystal growth to grain boundary dynamics. A major limitation of in situ XRD and TEM is a compromise that has to be made between spatial and temporal resolution. Here, we report the development of in situ X-ray nanodiffraction to measure high-resolution diffraction patterns from single grains with up to 5 ms temporal resolution. We observed, for the first time, grain rotation and lattice deformation in chemical reactions induced by X-ray photons: Br(-) + hv → Br + e(-) and e(-) + Ag(+) → Ag(0). The grain rotation and lattice deformation associated with the chemical reactions were quantified to be as fast as 3.25 rad s(-1) and as large as 0.5 Å, respectively. The ability to measure high-resolution diffraction patterns from individual grains with a temporal resolution of several milliseconds is expected to find broad applications in materials science, physics, chemistry and nanoscience.
authors.affiliation: Department of Physics &Astronomy and California NanoSystems Institute, University of California, Los Angeles, California 90095, USA.
authors.forename: Zhifeng
authors.initials: Z
authors.lastname: Huang
authors.affiliation: Institut für Röntgenphysik, Georg-August-Universität Göttingen, Friedrich-Hund-Platz 1 37077 Göttingen, Germany.
authors.forename: Matthias
authors.initials: M
authors.lastname: Bartels
authors.affiliation: Department of Physics &Astronomy and California NanoSystems Institute, University of California, Los Angeles, California 90095, USA.
authors.forename: Rui
authors.initials: R
authors.lastname: Xu
authors.affiliation: Institut für Röntgenphysik, Georg-August-Universität Göttingen, Friedrich-Hund-Platz 1 37077 Göttingen, Germany.
authors.forename: Markus
authors.initials: M
authors.lastname: Osterhoff
authors.affiliation: Institut für Röntgenphysik, Georg-August-Universität Göttingen, Friedrich-Hund-Platz 1 37077 Göttingen, Germany.
authors.forename: Sebastian
authors.initials: S
authors.lastname: Kalbfleisch
authors.affiliation: DESY, Notkestr. 85 22607 Hamburg, Germany.
authors.forename: Michael
authors.initials: M
authors.lastname: Sprung
authors.affiliation: Department of Precision Science and Technology, Graduate School of Engineering, Osaka University, 2-1 Yamada-oka, Suita, Osaka 565-0871, Japan.
authors.forename: Akihiro
authors.initials: A
authors.lastname: Suzuki
authors.affiliation: Department of Precision Science and Technology, Graduate School of Engineering, Osaka University, 2-1 Yamada-oka, Suita, Osaka 565-0871, Japan.
authors.forename: Yukio
authors.initials: Y
authors.lastname: Takahashi
authors.affiliation: Kodak Technology Center, Eastman Kodak Company, Rochester, New York 14650-2106, USA.
authors.forename: Thomas N
authors.initials: TN
authors.lastname: Blanton
authors.affiliation: Institut für Röntgenphysik, Georg-August-Universität Göttingen, Friedrich-Hund-Platz 1 37077 Göttingen, Germany.
authors.forename: Tim
authors.initials: T
authors.lastname: Salditt
authors.affiliation: Department of Physics &Astronomy and California NanoSystems Institute, University of California, Los Angeles, California 90095, USA.
authors.forename: Jianwei
authors.initials: J
authors.lastname: Miao