title: XTOP: high-resolution X-ray diffraction and imaging.
abstract: The latest virtual special issue ofJournal of Applied Crystallographyincludes some highlights of the 12th Conference on High-Resolution X-ray Diffraction and Imaging (XTOP), which took place in Villard-de-Lans and Grenoble in September 2014.
authors.affiliation: Université Grenoble Alpes, INAC-SP2M, F-38000 Grenoble-Alpes, France ; CEA, INAC-SP2M, F-38000 Grenoble, France.
authors.forename: Vincent
authors.initials: V
authors.lastname: Favre-Nicolin
authors.affiliation: ESRF, 71 avenue des Martyrs, CS 40220, 38043 Grenoble Cedex 9, France.
authors.forename: José
authors.initials: J
authors.lastname: Baruchel
authors.affiliation: Laboratoire des Matériaux et du Génie Physique, Grenoble INP - Minatec, Grenoble, France.
authors.forename: Hubert
authors.initials: H
authors.lastname: Renevier
authors.affiliation: Université Grenoble Alpes, INAC-SP2M, F-38000 Grenoble-Alpes, France ; CEA, INAC-SP2M, F-38000 Grenoble, France.
authors.forename: Joël
authors.initials: J
authors.lastname: Eymery
authors.affiliation: École Nationale Supérieure des Mines, SMS-EMSE, CNRS:UMR 5307, LGF, Saint-Étienne, France.
authors.forename: András
authors.initials: A
authors.lastname: Borbély
keywords: editorial; high-resolution X-ray diffraction; imaging