title: Erratum: An X-ray diffractometer using mirage diffraction. Erratum.
abstract: Errors in the article by Fukamachi, Jongsukswat, Ju, Negishi, Hirano & Kawamura [J. Appl. Cryst.(2014),47, 1267-1272] are corrected.[This corrects the article DOI: 10.1107/S1600576714012114.].
authors.affiliation: Saitama Institute of Technology , Fukaya, Saitama 369-0293, Japan.
authors.forename: Tomoe
authors.initials: T
authors.lastname: Fukamachi
authors.affiliation: Saitama Institute of Technology , Fukaya, Saitama 369-0293, Japan.
authors.forename: Sukswat
authors.initials: S
authors.lastname: Jongsukswat
authors.affiliation: Saitama Institute of Technology , Fukaya, Saitama 369-0293, Japan.
authors.forename: Dongying
authors.initials: D
authors.lastname: Ju
authors.affiliation: Saitama Institute of Technology , Fukaya, Saitama 369-0293, Japan.
authors.forename: Riichirou
authors.initials: R
authors.lastname: Negishi
authors.affiliation: Institute of Material Structure Science, KEK-PF, High Energy Accelerator Research Organization , Tsukuba, Ibaraki 305-0801, Japan.
authors.forename: Keiichi
authors.initials: K
authors.lastname: Hirano
authors.affiliation: University of Yamanashi , Kofu 400-8510, Japan.
authors.forename: Takaaki
authors.initials: T
authors.lastname: Kawamura
keywords: X-ray difractometers; dynamical theory of X-ray diffraction; interference fringes; mirage diffraction; mirage fringes; monochromators