title: Dictionary-based image reconstruction for superresolution in integrated circuit imaging.
abstract: Resolution improvement through signal processing techniques for integrated circuit imaging is becoming more crucial as the rapid decrease in integrated circuit dimensions continues. Although there is a significant effort to push the limits of optical resolution for backside fault analysis through the use of solid immersion lenses, higher order laser beams, and beam apodization, signal processing techniques are required for additional improvement. In this work, we propose a sparse image reconstruction framework which couples overcomplete dictionary-based representation with a physics-based forward model to improve resolution and localization accuracy in high numerical aperture confocal microscopy systems for backside optical integrated circuit analysis. The effectiveness of the framework is demonstrated on experimental data.
authors.forename: T Berkin
authors.initials: TB
authors.lastname: Cilingiroglu
authors.forename: Aydan
authors.initials: A
authors.lastname: Uyar
authors.forename: Ahmet
authors.initials: A
authors.lastname: Tuysuzoglu
authors.forename: W Clem
authors.initials: WC
authors.lastname: Karl
authors.forename: Janusz
authors.initials: J
authors.lastname: Konrad
authors.forename: Bennett B
authors.initials: BB
authors.lastname: Goldberg
authors.forename: M Selim
authors.initials: MS
authors.lastname: Ünlü