title: In situbending of an Au nanowire monitored by micro Laue diffraction.
abstract: This article reports on the first successful combination of micro Laue (µLaue) diffraction with an atomic force microscope forin situnanomechanical tests of individual nanostructures.In situthree-point bending on self-suspended gold nanowires was performed on the BM32 beamline at the ESRF using a specially designed atomic force microscope. During the bending process of the self-suspended wire, the evolution of µLaue diffraction patterns was monitored, allowing for extraction of the bending angle of the nanowire. This bending compares well with finite element analysis taking into account elastic constant bulk values and geometric nonlinearities. This novel experimental setup opens promising perspectives for studying mechanical properties at the nanoscale.
authors.affiliation: Aix-Marseille Université, CNRS, Université de Toulon, IM2NP UMR 7334, 13397 Marseille, France.
authors.forename: Cédric
authors.initials: C
authors.lastname: Leclere
authors.affiliation: Aix-Marseille Université, CNRS, Université de Toulon, IM2NP UMR 7334, 13397 Marseille, France.
authors.forename: Thomas W
authors.initials: TW
authors.lastname: Cornelius
authors.affiliation: Aix-Marseille Université, CNRS, Université de Toulon, IM2NP UMR 7334, 13397 Marseille, France.
authors.forename: Zhe
authors.initials: Z
authors.lastname: Ren
authors.affiliation: Aix-Marseille Université, CNRS, Université de Toulon, IM2NP UMR 7334, 13397 Marseille, France.
authors.forename: Anton
authors.initials: A
authors.lastname: Davydok
authors.affiliation: CEA, INAC, SP2M/NRS, 17 rue des Martyrs, 38054 Grenoble, France.
authors.forename: Jean-Sébastien
authors.initials: JS
authors.lastname: Micha
authors.affiliation: CEA, INAC, SP2M/NRS, 17 rue des Martyrs, 38054 Grenoble, France.
authors.forename: Odile
authors.initials: O
authors.lastname: Robach
authors.affiliation: Max Plank Institute for Intelligent Systems, Heisenbergstrasse 3, 70569 Stuttgart, Germany.
authors.forename: Gunther
authors.initials: G
authors.lastname: Richter
authors.affiliation: Université Pierre et Marie Curie, CNRS, Institut des Nanosciences de Paris UMR7588, 4 place Jussieu, 75005 Paris, France.
authors.forename: Laurent
authors.initials: L
authors.lastname: Belliard
authors.affiliation: Aix-Marseille Université, CNRS, Université de Toulon, IM2NP UMR 7334, 13397 Marseille, France.
authors.forename: Olivier
authors.initials: O
authors.lastname: Thomas
keywords: Au nanowires; micro-beam Laue diffraction; nanomechanical testing