title: Versatile atomic force microscopy setup combined with micro-focused X-ray beam.
abstract: Micro-focused X-ray beams produced by third generation synchrotron sources offer new perspective of studying strains and processes at nanoscale. Atomic force microscope setup combined with a micro-focused synchrotron beam allows precise positioning and nanomanipulation of nanostructures under illumination. In this paper, we report on integration of a portable commercial atomic force microscope setup into a hard X-ray synchrotron beamline. Details of design, sample alignment procedure, and performance of the setup are presented.
authors.affiliation: Institut für Angewandte Physik und Zentrum für Mikrostrukturforschung, Jungiusstraße 11, D-20355 Hamburg, Germany.
authors.forename: T
authors.initials: T
authors.lastname: Slobodskyy
authors.affiliation: DESY Photon Science, Notkestraße 85, 22607 Hamburg, Germany.
authors.forename: A V
authors.initials: AV
authors.lastname: Zozulya
authors.affiliation: Institut für Angewandte Physik und Zentrum für Mikrostrukturforschung, Jungiusstraße 11, D-20355 Hamburg, Germany.
authors.forename: R
authors.initials: R
authors.lastname: Tholapi
authors.affiliation: Institut für Angewandte Physik und Zentrum für Mikrostrukturforschung, Jungiusstraße 11, D-20355 Hamburg, Germany.
authors.forename: L
authors.initials: L
authors.lastname: Liefeith
authors.affiliation: DESY Photon Science, Notkestraße 85, 22607 Hamburg, Germany.
authors.forename: M
authors.initials: M
authors.lastname: Fester
authors.affiliation: DESY Photon Science, Notkestraße 85, 22607 Hamburg, Germany.
authors.forename: M
authors.initials: M
authors.lastname: Sprung
authors.affiliation: Institut für Angewandte Physik und Zentrum für Mikrostrukturforschung, Jungiusstraße 11, D-20355 Hamburg, Germany.
authors.forename: W
authors.initials: W
authors.lastname: Hansen