title: Polarization influence on reflectance measurements in the spatial frequency domain.
abstract: In this work, we quantify the influence of crossed polarizers on reflectance measurements in the spatial frequency domain. The use of crossed polarizers is a very common approach for suppression of specular surface reflections. However, measurements are typically evaluated using a non-polarized scalar theory. The consequences of this discrepancy are the focus of our study, and we also quantify the related errors of the derived optical properties. We used polarized Monte Carlo simulations for forward calculation of the reflectance from different samples. The samples' scatterers are assumed to be spherical, allowing for the calculation of the scattering functions by Mie theory. From the forward calculations, the reduced scattering coefficient [Formula: see text] and the absorption coefficient μa were derived by means of a scalar theory, as commonly used. Here, we use the analytical solution of the scalar radiative transfer equation. With this evaluation approach, which does not consider polarization, we found large errors in [Formula: see text] and μa in the range of 25% and above. Furthermore, we investigated the applicability of the use of a reference measurement to reduce these errors as suggested in literature. We found that this method is not able to generally improve the accuracy of measurements in the spatial frequency domain. Our general recommendation is to apply a polarized theory when using crossed polarizers.
authors.affiliation: Institut für Lasertechnologien in der Medizin und Meßtechnik, Helmholtzstr. 12, D-89081 Ulm, Germany.
authors.forename: J
authors.initials: J
authors.lastname: Wiest
authors.forename: N
authors.initials: N
authors.lastname: Bodenschatz
authors.forename: A
authors.initials: A
authors.lastname: Brandes
authors.forename: A
authors.initials: A
authors.lastname: Liemert
authors.forename: A
authors.initials: A
authors.lastname: Kienle
mesh_terms: D065638:Absorption, Radiation; D000465:Algorithms; D003198:Computer Simulation; D006801:Humans; D009010:Monte Carlo Method; D055620:Optical Phenomena; D019047:Phantoms, Imaging; D017785:Photons; D012542:Scattering, Radiation