title: High-resolution quantitative determination of dielectric function by using scattering scanning near-field optical microscopy.
abstract: A new method for high-resolution quantitative measurement of the dielectric function by using scattering scanning near-field optical microscopy (s-SNOM) is presented. The method is based on a calibration procedure that uses the s-SNOM oscillating dipole model of the probe-sample interaction and quantitative s-SNOM measurements. The nanoscale capabilities of the method have the potential to enable novel applications in various fields such as nano-electronics, nano-photonics, biology or medicine.
authors.affiliation: Center for Microscopy - Microanalysis and Information Processing, University Politehnica of Bucharest.
authors.forename: D E
authors.initials: DE
authors.lastname: Tranca
authors.affiliation: Center for Microscopy - Microanalysis and Information Processing, University Politehnica of Bucharest.
authors.forename: S G
authors.initials: SG
authors.lastname: Stanciu
authors.affiliation: Center for Microscopy - Microanalysis and Information Processing, University Politehnica of Bucharest.
authors.forename: R
authors.initials: R
authors.lastname: Hristu
authors.affiliation: Center for Microscopy - Microanalysis and Information Processing, University Politehnica of Bucharest.
authors.forename: C
authors.initials: C
authors.lastname: Stoichita
authors.affiliation: Department of Physics and Energy, University of Limerick.
authors.forename: S A M
authors.initials: SA
authors.lastname: Tofail
authors.affiliation: Center for Microscopy - Microanalysis and Information Processing, University Politehnica of Bucharest.
authors.forename: G A
authors.initials: GA
authors.lastname: Stanciu