title: Standardless Quantification of Heavy Elements by Electron Probe Microanalysis.
abstract: Absolute Mα and Mβ X-ray intensities were measured for the elements Pt, Au, Pb, U, and Th by electron impact for energies ranging from 6 to 38 keV. Experimental data were obtained by measuring the X-ray intensity emitted from bulk samples with an electron microprobe using high-resolution wavelength-dispersive spectrometers. Recorded X-ray intensities were converted into absolute X-ray yields by evaluation of the detector efficiency and then compared with X-ray intensities calculated by means of Monte Carlo simulations. Simulated Mα and Mβ X-ray intensities were found to be in good agreement with the measurements, allowing their use in standardless quantification methods. A procedure and a software program were developed to accurately obtain virtual standard values. Standardless quantifications of Pb and U were tested on standards of PbS, PbTe, PbCl2, vanadinite, and UO2.
authors.affiliation: †GM, CNRS, Université de Montpellier, Place E. Bataillon, F-34095 Montpellier, France.|‡CEA, DEN, DTEC, SGCS, LMAC, F-30207 Bagnols-sur-Cèze, France.
authors.forename: Aurélien
authors.initials: A
authors.lastname: Moy
authors.affiliation: †GM, CNRS, Université de Montpellier, Place E. Bataillon, F-34095 Montpellier, France.
authors.forename: Claude
authors.initials: C
authors.lastname: Merlet
authors.affiliation: §CEA, DEN, DEC, SA3C, F-13108 Saint-Paul-lès-Durance Cedex, France.
authors.forename: Olivier
authors.initials: O
authors.lastname: Dugne