title: Enhanced interference-pattern visibility using multislit optical superposition method for imaging-type two-dimensional Fourier spectroscopy.
abstract: A solution is found for the problem of phase cancellation between adjacent bright points in wavefront-division phase-shift interferometry. To this end, a design is proposed that optimizes the visibility of the interference pattern from multiple slits. The method is explained in terms of Fraunhofer diffraction and convolution imaging. Optical simulations verify the technique. The final design can be calculated using a simple equation.
authors.forename: Wei
authors.initials: W
authors.lastname: Qi
authors.forename: Yo
authors.initials: Y
authors.lastname: Suzuki
authors.forename: Shun
authors.initials: S
authors.lastname: Sato
authors.forename: Masaru
authors.initials: M
authors.lastname: Fujiwara
authors.forename: Natsumi
authors.initials: N
authors.lastname: Kawashima
authors.forename: Satoru
authors.initials: S
authors.lastname: Suzuki
authors.forename: Pradeep
authors.initials: P
authors.lastname: Abeygunawardhana
authors.forename: Kenji
authors.initials: K
authors.lastname: Wada
authors.forename: Akira
authors.initials: A
authors.lastname: Nishiyama
authors.forename: Ichiro
authors.initials: I
authors.lastname: Ishimaru