title: Advanced method of phase shift measurement from variances of interferogram differences.
abstract: A new approach to the problem of measuring the phase shift from variances of interferogram differences based on Fourier domain analysis is proposed. It is shown that the use of true variance of the interferogram differences and spatial apodization of interferograms increases the accuracy of the phase shift of the measurement. Numerical simulations and experiments are presented.
authors.forename: Gennady
authors.initials: G
authors.lastname: Vishnyakov
authors.forename: Gennady
authors.initials: G
authors.lastname: Levin
authors.forename: Vladimir
authors.initials: V
authors.lastname: Minaev
authors.forename: Nikolay
authors.initials: N
authors.lastname: Nekrasov