title: Performance of bent-crystal x-ray microscopes for high energy density physics research.
abstract: We present calculations for the field of view (FOV), image fluence, image monochromaticity, spectral acceptance, and image aberrations for spherical crystal microscopes, which are used as self-emission imaging or backlighter systems at large-scale high energy density physics facilities. Our analytic results are benchmarked with ray-tracing calculations as well as with experimental measurements from the 6.151 keV backlighter system at Sandia National Laboratories. The analytic expressions can be used for x-ray source positions anywhere between the Rowland circle and object plane. This enables quick optimization of the performance of proposed but untested, bent-crystal microscope systems to find the best compromise between FOV, image fluence, and spatial resolution for a particular application.
authors.forename: Marius S
authors.initials: MS
authors.lastname: Schollmeier
authors.forename: Matthias
authors.initials: M
authors.lastname: Geissel
authors.forename: Jonathon E
authors.initials: JE
authors.lastname: Shores
authors.forename: Ian C
authors.initials: IC
authors.lastname: Smith
authors.forename: John L
authors.initials: JL
authors.lastname: Porter