title: Enhanced Fracture Resistance of Flexible ZnO:Al Thin Films in Situ Sputtered on Bent Polymer Substrates.
abstract: Improving the fracture resistance of inorganic thin films is one of the key challenges in flexible electronic devices. A nonconventional in situ sputtering method is introduced to induce residual compressive stress in ZnO:Al thin films during deposition on a bent polymer substrate. The films grown under a larger prebending strain resulted in a higher fracture resistance to applied strains by exhibiting a ∼ 70% improvement in crack-initiating critical strain compared with the reference sample grown without bending. This significant improvement is attributed to the induced residual stress, which helps to prevent the formation of cracks by counteracting the applied strain.
authors.affiliation: Department of Materials Science and Engineering, Yonsei University, Seoul 120-749, Korea.
authors.forename: Hong Rak
authors.initials: HR
authors.lastname: Choi
authors.affiliation: Department of Materials Science and Engineering, Yonsei University, Seoul 120-749, Korea.
authors.forename: Senthil Kumar
authors.initials: SK
authors.lastname: Eswaran
authors.affiliation: Department of Materials Science and Engineering, Yonsei University, Seoul 120-749, Korea.
authors.forename: Seung Min
authors.initials: SM
authors.lastname: Lee
authors.affiliation: Department of Materials Science and Engineering, Yonsei University, Seoul 120-749, Korea.
authors.forename: Yong Soo
authors.initials: YS
authors.lastname: Cho
keywords: ZnO thin films; crack density; flexible electronics; fracture energy; transparent conducting oxide