title: Localization-based full-field microscopy: how to attain super-resolved images.
abstract: In this study, we have investigated localization-based microscopy to achieve full-field super-resolution. For localized sampling, we have considered combs consisting of unit pulses and near-fields localized by surface nanoapertures. Achievable images after reconstruction were assessed in terms of peak signal-to-noise ratio (PSNR). It was found that spatial switching of individual pulses may be needed to break the diffraction limit. Among the parameters, the resolution was largely determined by sampling period while the effect of width of a sampling pulse on PSNR was relatively limited. For the range of sampling parameters that we considered, the highest resolution achievable is estimated to be 70 nm, which can further be enhanced by optimizing the localization parameters.
authors.affiliation: School of Electrical and Electronic Engineering Yonsei University, Seoul, 120-749 Korea.
authors.forename: Taehwang
authors.initials: T
authors.lastname: Son
authors.affiliation: School of Electrical and Electronic Engineering Yonsei University, Seoul, 120-749 Korea.
authors.forename: Wonju
authors.initials: W
authors.lastname: Lee
authors.affiliation: School of Electrical and Electronic Engineering Yonsei University, Seoul, 120-749 Korea.
authors.forename: Donghyun
authors.initials: D
authors.lastname: Kim