title: Conductive-AFM Patterning of Organic Semiconductors.
abstract: Using a conductive atomic force microscope (c-AFM) redox-writing technique, it is shown that it is possible to locally, and reversibly, pattern conducting, and nonconducting features on the surface of a low molecular weight aniline-based organic (semi)-conductor thin film using a commercial c-AFM. It is shown that application of a voltage between the tip and sample causes localized redox reactions at the surface without damage.
authors.affiliation: School of Chemistry, University of Bristol, Bristol, BS8 1TS, UK.|Bristol Centre for Functional Nanomaterials, Centre for Nanoscience and Quantum Information, University of Bristol, Tyndall Avenue, Bristol, BS8 1FD, UK.
authors.forename: Benjamin P
authors.initials: BP
authors.lastname: Brown
authors.affiliation: School of Physics, University of Bristol, Bristol, BS8 1TL, UK.|Centre for Nanoscience and Quantum Information, University of Bristol, Bristol, BS8 1FD, UK.
authors.forename: Loren
authors.initials: L
authors.lastname: Picco
authors.affiliation: School of Physics, University of Bristol, Bristol, BS8 1TL, UK.|Centre for Nanoscience and Quantum Information, University of Bristol, Bristol, BS8 1FD, UK.
authors.forename: Mervyn J
authors.initials: MJ
authors.lastname: Miles
authors.affiliation: School of Chemistry, University of Bristol, Bristol, BS8 1TS, UK.
authors.forename: Charl F J
authors.initials: CF
authors.lastname: Faul
keywords: AFM; conductive AFM; high-speed AFM; organic semiconductors; redox writing; tetraaniline