title: Two-dimensional misorientation mapping by rocking dark-field transmission electron microscopy.
abstract: In this paper we introduce an approach for precise orientation mapping of crystalline specimens by means of transmission electron microscopy. We show that local orientation values can be reconstructed from experimental dark-field image data acquired at different specimen tilts and multiple Bragg reflections. By using the suggested method it is also possible to determine the orientation of the tilt axis with respect to the image or diffraction pattern. The method has been implemented to automatically acquire the necessary data and then map crystal orientation for a given region of interest. We have applied this technique to a specimen prepared from a Ni-based super-alloy CMSX-4. The functionality and limitations of our method are discussed and compared to those of other techniques available.
authors.affiliation: Institute for Experimental Physics, University of Ulm, Albert-Einstein-Allee 11, 89081 Ulm, Germany. Electronic address: dmitry.tyutyunnikov@uni-ulm.de.
authors.forename: Dmitry
authors.initials: D
authors.lastname: Tyutyunnikov
authors.affiliation: Department of Engineering Sciences for Electronics and Materials, Faculty of Engineering Sciences, Kyushu University, Kasuga, Fukuoka 816-8580, Japan.
authors.forename: Masatoshi
authors.initials: M
authors.lastname: Mitsuhara
authors.affiliation: Institute for Experimental Physics, University of Ulm, Albert-Einstein-Allee 11, 89081 Ulm, Germany.
authors.forename: Christoph T
authors.initials: CT
authors.lastname: Koch
keywords: Crystal lattice misorientation mapping; Dark-field imaging; Ni-based superalloy; Numerical optimization; Transmission electron microscopy