title: High pressure Laue diffraction and its application to study microstructural changes during the α → β phase transition in Si.
abstract: An approach using polychromatic x-ray Laue diffraction is described for studying pressure induced microstructural changes of materials under pressure. The advantages of this approach with respect to application of monochromatic x-ray diffraction and other techniques are discussed. Experiments to demonstrate the applications of the method have been performed on the α → β phase transition in Si at high pressures using a diamond anvil cell. We present the characterization of microstructures across the α-β phase transition, such as morphology of both the parent and product phases, relative orientation of single-crystals, and deviatoric strains. Subtle inhomogeneous strain of the single-crystal sample caused by lattice rotations becomes detectable with the approach.
authors.affiliation: High Pressure Collaborative Access Team, Geophysical Laboratory, Carnegie Institution of Washington, Argonne, Illinois 60439, USA.
authors.forename: D
authors.initials: D
authors.lastname: Popov
authors.affiliation: High Pressure Collaborative Access Team, Geophysical Laboratory, Carnegie Institution of Washington, Argonne, Illinois 60439, USA.
authors.forename: C
authors.initials: C
authors.lastname: Park
authors.affiliation: High Pressure Collaborative Access Team, Geophysical Laboratory, Carnegie Institution of Washington, Argonne, Illinois 60439, USA.
authors.forename: C
authors.initials: C
authors.lastname: Kenney-Benson
authors.affiliation: High Pressure Collaborative Access Team, Geophysical Laboratory, Carnegie Institution of Washington, Argonne, Illinois 60439, USA.
authors.forename: G
authors.initials: G
authors.lastname: Shen