title: Nano-level position resolution for particle tracking in digital in-line holographic microscopy.
abstract: Three-dimensional particle tracking in biological systems is a quickly growing field, many techniques have been developed providing tracking characters. Digital in-line holographic microscopy is a valuable technique for particle tracking. However, the speckle noise, out-of-focus signals and twin image influenced the particle tracking. Here an adaptive noise reduction method based on bidimensional ensemble empirical mode decomposition is introduced into digital in-line holographic microscopy. It can eliminate the speckle noise and background of the hologram adaptively. Combined with the three-dimensional deconvolution approach in the reconstruction, the particle feature would be identified effectively. Tracking the fixed beads on the cover-glass with piezoelectric stage through multiple holographic images demonstrate the tracking resolution, which approaches 2 nm in axial direction and 1 nm in transverse direction. This would facilitate the development and use in the biological area such as living cells and single-molecule approaches.
authors.affiliation: State Key Laboratory of Precision Measuring Technology & Instruments, Tianjin University, Tianjin, 300072, China.
authors.forename: H
authors.initials: H
authors.lastname: Lei
authors.affiliation: State Key Laboratory of Precision Measuring Technology & Instruments, Tianjin University, Tianjin, 300072, China.
authors.forename: X
authors.initials: X
authors.lastname: Hu
authors.affiliation: Key Laboratory of Opto-Electronics Information Technology, Tianjin University, Tianjin, 300072, China.
authors.forename: P
authors.initials: P
authors.lastname: Zhu
authors.affiliation: State Key Laboratory of Precision Measuring Technology & Instruments, Tianjin University, Tianjin, 300072, China.
authors.forename: X
authors.initials: X
authors.lastname: Chang
authors.affiliation: State Key Laboratory of Precision Measuring Technology & Instruments, Tianjin University, Tianjin, 300072, China.
authors.forename: Y
authors.initials: Y
authors.lastname: Zeng
authors.affiliation: State Key Laboratory of Precision Measuring Technology & Instruments, Tianjin University, Tianjin, 300072, China.
authors.forename: C
authors.initials: C
authors.lastname: Hu
authors.affiliation: State Key Laboratory of Precision Measuring Technology & Instruments, Tianjin University, Tianjin, 300072, China.|Department of Chemistry, University of British Columbia, Vancouver, BC, V6T 1Z1, Canada.
authors.forename: H
authors.initials: H
authors.lastname: Li
authors.affiliation: State Key Laboratory of Precision Measuring Technology & Instruments, Tianjin University, Tianjin, 300072, China.
authors.forename: X
authors.initials: X
authors.lastname: Hu
mesh_terms: D000465:Algorithms; D004867:Equipment Design; D006696:Holography / Q000295:instrumentation / Q000379:methods; D007091:Image Processing, Computer-Assisted; D008853:Microscopy / Q000295:instrumentation / Q000379:methods*
keywords: Digital holographic microscopy; empirical mode decomposition; image analysis; measurement; particle