Broadband High-Performance Infrared Antireflection Nanowires Facilely Grown on Ultrafast Laser Structured Cu Surface.
Infrared antireflection is an essential issue in many fields such as thermal imaging, sensors, thermoelectrics, and stealth. However, a limited antireflection capability, narrow effective band, and complexity as well as high cost in implementation represent the main unconquered problems, especially on metal surfaces. By introducing precursor micro/nano structures via ultrafast laser beforehand, we present a novel approach for facile and uniform growth of high-quality oxide semiconductor nanowires on a Cu surface via thermal oxidation. Through the enhanced optical phonon dissipation of the nanowires, assisted by light trapping in the micro structures, ultralow total reflectance of 0.6% is achieved at the infrared wavelength around 17 μm and keeps steadily below 3% over a broad band of 14-18 μm. The precursor structures and the nanowires can be flexibly tuned by controlling the laser processing procedure to achieve desired antireflection performance. The presented approach possesses the advantages of material simplicity, structure reconfigurability, and cost-effectiveness for mass production. It opens a new path to realize unique functions by integrating semiconductor nanowires onto metal surface structures.
Laser Materials Processing Research Centre, School of Materials Science and Engineering, Tsinghua University , Beijing 100084, P. R. China.|State Key Laboratory of Precision Measurement Technology and Instruments, Department of Precision Instrument, Tsinghua University , Beijing 100084, P. R. China.
Peixun
P
Fan
State Key Laboratory of Precision Measurement Technology and Instruments, Department of Precision Instrument, Tsinghua University , Beijing 100084, P. R. China.
Benfeng
B
Bai
Laser Materials Processing Research Centre, School of Materials Science and Engineering, Tsinghua University , Beijing 100084, P. R. China.
Jiangyou
J
Long
Laser Materials Processing Research Centre, School of Materials Science and Engineering, Tsinghua University , Beijing 100084, P. R. China.
Dafa
D
Jiang
State Key Laboratory of Precision Measurement Technology and Instruments, Department of Precision Instrument, Tsinghua University , Beijing 100084, P. R. China.
Guofan
G
Jin
Laser Materials Processing Research Centre, School of Materials Science and Engineering, Tsinghua University , Beijing 100084, P. R. China.
Hongjun
H
Zhang
Laser Materials Processing Research Centre, School of Materials Science and Engineering, Tsinghua University , Beijing 100084, P. R. China.
Minlin
M
Zhong
Metal; antireflection; infrared; nanowire; structuring; ultrafast laser