Editorial: Measurement Invariance.
Department of Methods and Statistics, Utrecht University Utrecht, Netherlands ; Optentia Research Program, Faculty of Humanities, North-West University Vanderbijlpark, South Africa.
Rens
R
Van De Schoot
Department of Political Sciences, University of Giessen Giessen, Germany ; International Laboratory of Social-Cultural Research, Research University Higher School of Economics Moscow, Russia.
Peter
P
Schmidt
Nijmegen School of Management, Institute for Management Research, Radboud University Nijmegen Nijmegen, Netherlands ; School of Sociology and Population Studies, Renmin University of China Beijing, China ; Department of Personnel Management and Work and Organizational Psychology, Ghent University Ghent, Belgium.
Alain
A
De Beuckelaer
Department of Methods and Statistics, Utrecht University Utrecht, Netherlands.
Kimberley
K
Lek
Department of Methods and Statistics, Utrecht University Utrecht, Netherlands.
Marielle
M
Zondervan-Zwijnenburg
Bayesian models; approximate measurement invariance; confirmatory factor analysis; measurement invariance; partial measurement invariance; questionnaires