Dielectric Breakdown of Single-Crystal Strontium Titanate.
Measurements of the intrinsic dielectric breakdown strength of single-crystal strontium titanate over a temperature range from -195° to + 100°C and under both pulse and dc conditions are described; dc breakdown at + 100°C is thermal in origin. At room temperature and at -40°C the breakdown strength is independent of duration of applied field and of sample configuration and hence may properly be termed intrinsic. At -80° and -195°C, both the values of breakdown strength and the scatter of the data depend strongly on sample configuration. The breakdown strength unexpectedly decreases with increasing temperature. Current-voltage curves show an anomalous saturation effect at low temperature. These effects may be qualitatively explained by postulating that the high electrostrictive stress causes the creation of electron trapping centers.
Raytheon Research Division, Waltham, Massachusetts.
Harrison H
HH
Barrett