title: Probing Charges on the Atomic Scale by Means of Atomic Force Microscopy.
abstract: Kelvin probe force spectroscopy was used to characterize the charge distribution of individual molecules with polar bonds. Whereas this technique represents the charge distribution with moderate resolution for large tip-molecule separations, it fails for short distances. Here, we introduce a novel local force spectroscopy technique which allows one to better disentangle electrostatic from other contributions in the force signal. It enables one to obtain charge-related maps at even closer tip-sample distances, where the lateral resolution is further enhanced. This enhanced resolution allows one to resolve contrast variations along individual polar bonds.
authors: Institute of Experimental and Applied Physics, University of Regensburg, 93053 Regensburg, Germany.
authors: F
authors: F
authors: Albrecht
authors: Institute of Experimental and Applied Physics, University of Regensburg, 93053 Regensburg, Germany.
authors: J
authors: J
authors: Repp
authors: Institute of Inorganic Chemistry, University of Regensburg, 93053 Regensburg, Germany.
authors: M
authors: M
authors: Fleischmann
authors: Institute of Inorganic Chemistry, University of Regensburg, 93053 Regensburg, Germany.
authors: M
authors: M
authors: Scheer
authors: Institute of Physics of the Academy of Sciences of the Czech Republic, 16253 Prague, Czech Republic.
authors: M
authors: M
authors: Ondráček
authors: Institute of Physics of the Academy of Sciences of the Czech Republic, 16253 Prague, Czech Republic.
authors: P
authors: P
authors: Jelínek