title: Using Magnetic Coupling to Improve the (1)H/(2)H Double Tuned Circuit.
abstract: We report in this paper an analysis of double-tuned (1)H/(2)H circuits that are capacitively or inductively matched to 50 Ω ports. In this analysis we use a novel new parameter called the circuit fill factor (CFF). It provides a means of characterizing the performance degradation associated with additional inductors in the circuit in addition to circuit losses. This parameter allows for quick and insightful analysis of multiple tuned circuits for efficiency. It is also shown that magnetically coupled double-tuned circuits are less prone to unwanted spurious resonances due to their general symmetry which eliminates multiple ground paths in the circuit.
authors: Agilent Laboratories, Agilent Technologies Inc., 5301 Stevens Creek Blvd., Santa Clara, CA 95501, United States.
authors: Bob
authors: B
authors: Taber
authors: JEOL USA, 1101 Library Ln., San Jose, CA 95116, United States. Electronic address: toby.zens@sbcglobal.net.
authors: Albert
authors: A
authors: Zens
keywords: Double-tuned circuit; Magnetic coupling