title: BINoculars: data reduction and analysis software for two-dimensional detectors in surface X-ray diffraction.
abstract: BINocularsis a tool for data reduction and analysis of large sets of surface diffraction data that have been acquired with a two-dimensional X-ray detector. The intensity of each pixel of a two-dimensional detector is projected onto a three-dimensional grid in reciprocal-lattice coordinates using a binning algorithm. This allows for fast acquisition and processing of high-resolution data sets and results in a significant reduction of the size of the data set. The subsequent analysis then proceeds in reciprocal space. It has evolved from the specific needs of the ID03 beamline at the ESRF, but it has a modular design and can be easily adjusted and extended to work with data from other beamlines or from other measurement techniques. This paper covers the design and the underlying methods employed in this software package and explains howBINocularscan be used to improve the workflow of surface X-ray diffraction measurements and analysis.
authors: Huygens-Kamerlingh Onnes Laboratory, Leiden University, PO Box 9504, 2300 RA Leiden, The Netherlands.
authors: Sander
authors: S
authors: Roobol
authors: Huygens-Kamerlingh Onnes Laboratory, Leiden University, PO Box 9504, 2300 RA Leiden, The Netherlands ; ESRF, 71 avenue des Martyrs, 38000 Grenoble, France.
authors: Willem
authors: W
authors: Onderwaater
authors: ESRF, 71 avenue des Martyrs, 38000 Grenoble, France.
authors: Jakub
authors: J
authors: Drnec
authors: ESRF, 71 avenue des Martyrs, 38000 Grenoble, France.
authors: Roberto
authors: R
authors: Felici
authors: Huygens-Kamerlingh Onnes Laboratory, Leiden University, PO Box 9504, 2300 RA Leiden, The Netherlands.
authors: Joost
authors: J
authors: Frenken
keywords: X-ray diffraction; data analysis; data reduction; reciprocal-space mapping