title: Theoretical analysis of reflection high-energy electron diffraction (RHEED) and reflection high-energy positron diffraction (RHEPD) intensity oscillations expected for the perfect layer-by-layer growth.
abstract: Predictions from two theoretical models, allowing one to determine the phase of intensity oscillations, are compared for reflected beams of electrons and positrons. Namely, results of the precise dynamical calculations are compared with results obtained using a simplified approach. Within the simplified model, changes in the specularly reflected beam intensity, expected to occur during the deposition of new atoms, are described with the help of interfering waves and the effect of refraction, and respective approximate analytical formulas are employed to determine the phase of the oscillations. It is found that the simplified model is very useful for understanding the physics ruling the appearance of intensity oscillations. However, it seems that the model with the realistic potential is more suitable for carrying out interpretations of experimental data.
authors: AGH University of Science and Technology, Faculty of Metals Engineering and Industrial Computer Science, al. Mickiewicza 30, 30-059 Kraków, Poland.
authors: Zbigniew
authors: Z
authors: Mitura
keywords: RHEED; RHEPD; dynamical diffraction theory; nanolayers