title: Evanescent-Wave Cavity Ring-Down Ellipsometry.
abstract: We introduce the new technique of evanescent-wave cavity ring-down ellipsometry (EW-CRDE), used for the measurement of ellipsometric angles of samples at a solid-gas or solid-liquid interface, and achieve phase-shift measurements with precision of ∼0.01°. We demonstrate the technique by measuring the time-dependent refractive index of methanol-water mixtures and thin films at the liquid/fused-silica interface, showing that the monitoring of monolayers on microsecond time scales using EW-CRDE should be achievable.
authors: †Institute of Electronic Structure and Laser, Foundation for Research and Technology-Hellas, 71110 Heraklion-Crete, Greece.|‡Department of Chemistry, George Fox University, Newberg, Oregon 97132, United States.
authors: Michael A
authors: MA
authors: Everest
authors: †Institute of Electronic Structure and Laser, Foundation for Research and Technology-Hellas, 71110 Heraklion-Crete, Greece.
authors: Vassilis M
authors: VM
authors: Papadakis
authors: †Institute of Electronic Structure and Laser, Foundation for Research and Technology-Hellas, 71110 Heraklion-Crete, Greece.
authors: Katerina
authors: K
authors: Stamataki
authors: †Institute of Electronic Structure and Laser, Foundation for Research and Technology-Hellas, 71110 Heraklion-Crete, Greece.
authors: Stelios
authors: S
authors: Tzortzakis
authors: †Institute of Electronic Structure and Laser, Foundation for Research and Technology-Hellas, 71110 Heraklion-Crete, Greece.
authors: Benoit
authors: B
authors: Loppinet
authors: †Institute of Electronic Structure and Laser, Foundation for Research and Technology-Hellas, 71110 Heraklion-Crete, Greece.
authors: T Peter
authors: TP
authors: Rakitzis
keywords: adsorption; cavity ring-down; ellipsometry; evanescent wave; thin films