title: Charge Blinking Statistics of Semiconductor Nanocrystals Revealed by Carbon Nanotube Single Charge Sensors.
abstract: We demonstrate the relation between the optical blinking of colloidal semiconductor nanocrystals (NCs) and their electrical charge blinking for which we provide the first experimental observation of power-law statistics. To show this, we harness the performance of CdSe/ZnS NCs coupled with carbon nanotube field-effect transistors (CNTFETs), which act as single charge-sensitive electrometers with submillisecond time resolution, at room temperature. A random telegraph signal (RTS) associated with the NC single-trap charging is observed and exhibits power-law temporal statistics (τ(-α), with α in the range of ∼1-3), and a Lorentzian current noise power spectrum with a well-defined 1/f(2) corner. The spectroscopic analysis of the NC-CNTFET devices is consistent with the charging of NC defect states with a charging energy of Ec ≥ 200 meV. These results pave the way for a deeper understanding of the physics and technology of nanocrystal-based optoelectronic devices.
authors.affiliation: Institute of Electronics Microelectronics and Nanotechnology, IEMN-CNRS UMR 8520 , Avenue Poincaré CS60069, 59652 Villeneuve d'Ascq France.|Faculty of Physics, Warsaw University of Technology , Koszykowa 75, 00-662 Warsaw, Poland.
authors.forename: Ewa
authors.initials: E
authors.lastname: Zbydniewska
authors.affiliation: Faculty of Physics, Warsaw University of Technology , Koszykowa 75, 00-662 Warsaw, Poland.
authors.forename: Anna
authors.initials: A
authors.lastname: Duzynska
authors.affiliation: Institute of Electronics Microelectronics and Nanotechnology, IEMN-CNRS UMR 8520 , Avenue Poincaré CS60069, 59652 Villeneuve d'Ascq France.|Lille Centre for Infection and Immunity, Cellular Microbiology of Infectious Pathogens, CNRS UMR8204, INSERM U1019, University of Lille Nord-de-France, Institut Pasteur de Lille , F-59019 Lille, France.
authors.forename: Michka
authors.initials: M
authors.lastname: Popoff
authors.affiliation: Institute of Electronics Microelectronics and Nanotechnology, IEMN-CNRS UMR 8520 , Avenue Poincaré CS60069, 59652 Villeneuve d'Ascq France.
authors.forename: Djamila
authors.initials: D
authors.lastname: Hourlier
authors.affiliation: Institute of Electronics Microelectronics and Nanotechnology, IEMN-CNRS UMR 8520 , Avenue Poincaré CS60069, 59652 Villeneuve d'Ascq France.
authors.forename: Stéphane
authors.initials: S
authors.lastname: Lenfant
authors.affiliation: Faculty of Physics, Warsaw University of Technology , Koszykowa 75, 00-662 Warsaw, Poland.
authors.forename: Jaroslaw
authors.initials: J
authors.lastname: Judek
authors.affiliation: Faculty of Physics, Warsaw University of Technology , Koszykowa 75, 00-662 Warsaw, Poland.
authors.forename: Mariusz
authors.initials: M
authors.lastname: Zdrojek
authors.affiliation: Institute of Electronics Microelectronics and Nanotechnology, IEMN-CNRS UMR 8520 , Avenue Poincaré CS60069, 59652 Villeneuve d'Ascq France.
authors.forename: Thierry
authors.initials: T
authors.lastname: Mélin
keywords: Carbon nanotube field effect transistor; band gap defects; charge blinking; colloidal nanocrystals; random telegraph noise; room-temperature single charge sensing