title: Polarization Properties in Apertureless-Type Scanning Near-Field Optical Microscopy.
abstract: Polarization properties of apertureless-type scanning near-field optical microscopy (a-SNOM) were measured experimentally and were also analyzed using a finite-difference time-domain (FDTD) simulation. Our study reveals that the polarization properties in the a-SNOM are maintained and the a-SNOM works as a wave plate expressed by a Jones matrix. The measured signals obtained by the lock-in detection technique could be decomposed into signals scattered from near-field region and background signals reflected by tip and sample. Polarization images measured by a-SNOM with an angle resolution of 1° are shown. FDTD analysis also reveals the polarization properties of light in the area between a tip and a sample are p-polarization in most of cases.
authors.affiliation: Department of Materials Science and Technology, Nagaoka University of Technology, 940-2188 Kamitomioka, Nagaoka, Niigta, Japan. t_bashi@mst.nagaokaut.ac.jp.
authors.forename: Takayuki
authors.initials: T
authors.lastname: Ishibashi
authors.affiliation: Department of Materials Science and Technology, Nagaoka University of Technology, 940-2188 Kamitomioka, Nagaoka, Niigta, Japan. yongfu_sai@mst.nagaokaut.ac.jp.
authors.forename: Yongfu
authors.initials: Y
authors.lastname: Cai
keywords: FDTD; Jones matrix; Polarization property; a-SNOM