title: Focused electron beam induced deposition as a tool to create electron vortices.
abstract: Focused electron beam induced deposition (FEBID) is a microscopic technique that allows geometrically controlled material deposition with very high spatial resolution. This technique was used to create a spiral aperture capable of generating electron vortex beams in a transmission electron microscope (TEM). The vortex was then fully characterized using different TEM techniques, estimating the average orbital angular momentum to be ∼0.8ℏ per electron with almost 60% of the beam ending up in the ℓ=1 state.
authors.affiliation: EMAT, University of Antwerp, Groenenborgerlaan 171, 2020 Antwerp, Belgium. Electronic address: armand.beche@uantwerpen.be.
authors.forename: A
authors.initials: A
authors.lastname: Béché
authors.affiliation: Graz Centre for Electron Microscopy, Steyrergasse 17, 8010 Graz, Austria.
authors.forename: R
authors.initials: R
authors.lastname: Winkler
authors.affiliation: Graz Centre for Electron Microscopy, Steyrergasse 17, 8010 Graz, Austria; Institute for Electron Microscopy and Nanoanalysis, Graz University of Technology, Steyrergasse 17, A-8010 Graz, Austria.
authors.forename: H
authors.initials: H
authors.lastname: Plank
authors.affiliation: Institute for Electron Microscopy and Nanoanalysis, Graz University of Technology, Steyrergasse 17, A-8010 Graz, Austria.
authors.forename: F
authors.initials: F
authors.lastname: Hofer
authors.affiliation: EMAT, University of Antwerp, Groenenborgerlaan 171, 2020 Antwerp, Belgium.
authors.forename: J
authors.initials: J
authors.lastname: Verbeeck
keywords: Focused electron beam induced deposition (FEBID); Holography; Transmission electron microscope (TEM); Vortex