title: Phase measurement of soft x-ray multilayer mirrors.
abstract: We propose a new model enabling the extraction of the phase of a multilayer mirror from photocurrent measurements in the soft x rays. In this range, the effects of the mean free path of the electrons inside the stack can no longer be neglected, which prevents the phase reconstruction by conventional photocurrent measurements. The new model takes into account this phenomenon and thus extends up to the x rays the applicability range of the technique. This approach has been validated through a numerical and experimental study of chromium/scandium multilayers used near 360 eV. To our knowledge, this work constitutes the first measurement of the phase of a multilayer mirror in the soft x-ray range.
authors.forename: Sébastien
authors.initials: S
authors.lastname: de Rossi
authors.forename: Charles
authors.initials: C
authors.lastname: Bourassin-Bouchet
authors.forename: Evgueni
authors.initials: E
authors.lastname: Meltchakov
authors.forename: Angelo
authors.initials: A
authors.lastname: Giglia
authors.forename: Stefano
authors.initials: S
authors.lastname: Nannarone
authors.forename: Franck
authors.initials: F
authors.lastname: Delmotte