title: A polarized digital shearing speckle pattern interferometry system based on temporal wavelet transformation.
abstract: Digital shearing speckle pattern interferometry (DSSPI) has been recognized as a practical tool in testing strain. The DSSPI system which is based on temporal analysis is attractive because of its ability to measure strain dynamically. In this paper, such a DSSPI system with Wollaston prism has been built. The principles and system arrangement are described and the preliminary experimental result of the displacement-derivative test of an aluminum plate is shown with the wavelet transformation method and the Fourier transformation method. The simulations have been conducted with the finite element method. The comparison of the results shows that quantitative measurement of displacement-derivative has been realized.
authors.affiliation: Key Laboratory of Luminescence and Optical Information of Ministry of Education, Beijing Jiaotong University, Beijing 100044, China.
authors.forename: Ziang
authors.initials: Z
authors.lastname: Feng
authors.affiliation: Key Laboratory of Luminescence and Optical Information of Ministry of Education, Beijing Jiaotong University, Beijing 100044, China.
authors.forename: Zhan
authors.initials: Z
authors.lastname: Gao
authors.affiliation: Key Laboratory of Luminescence and Optical Information of Ministry of Education, Beijing Jiaotong University, Beijing 100044, China.
authors.forename: Xiaoqiong
authors.initials: X
authors.lastname: Zhang
authors.affiliation: Key Laboratory of Luminescence and Optical Information of Ministry of Education, Beijing Jiaotong University, Beijing 100044, China.
authors.forename: Shengjia
authors.initials: S
authors.lastname: Wang
authors.affiliation: Key Laboratory of Luminescence and Optical Information of Ministry of Education, Beijing Jiaotong University, Beijing 100044, China.
authors.forename: Dong
authors.initials: D
authors.lastname: Yang
authors.affiliation: Key Laboratory of Luminescence and Optical Information of Ministry of Education, Beijing Jiaotong University, Beijing 100044, China.
authors.forename: Hao
authors.initials: H
authors.lastname: Yuan
authors.affiliation: Key Laboratory of Luminescence and Optical Information of Ministry of Education, Beijing Jiaotong University, Beijing 100044, China.
authors.forename: Jie
authors.initials: J
authors.lastname: Qin