title: Investigation of the depth-profiling capabilities of the Storing Matter technique.
abstract: The so-called Storing Matter technique allows the matrix effect observed in secondary ion mass spectrometry to be successfully circumvented. We therefore investigate in this work the depth-profiling capabilities of the Storing Matter technique with a goal of developing protocols for quantitative depth profiles. The effect of the steps involved in the Storing Matter process on the main parameters such as the depth resolution and the dynamic range is studied experimentally and by simulations. A semi-automated process consisting of the sputter-deposition process on a rotating collector in the Storing Matter instrument followed by a complete analysis of the collector by secondary ion mass spectrometry is defined. This protocol is applied to depth profile a B implant in Si and a Sn/Zn multilayered sample, and the results are compared with those obtained with conventional secondary ion mass spectrometry.
authors.affiliation: Advanced Instrumentation for Ion Nano-Analytics (AINA), MRT Department, Luxembourg Institute of Science Technology (LIST), 41 rue du Brill, Belvaux, L-4422, Luxembourg.
authors.forename: B
authors.initials: B
authors.lastname: Kasel
authors.affiliation: Advanced Instrumentation for Ion Nano-Analytics (AINA), MRT Department, Luxembourg Institute of Science Technology (LIST), 41 rue du Brill, Belvaux, L-4422, Luxembourg.
authors.forename: T
authors.initials: T
authors.lastname: Wirtz
keywords: SIMS; Storing Matter; depth profiling; matrix effect; quantification; secondary ion mass spectrometry