title: Wavefront measurement made by an off-the-shelf laser-scanning pico projector.
abstract: Focal plane testing methods such as the Shack-Hartmann wavefront sensor and phase-shifting deflectometry are valuable tools for optical testing. In this study, we propose a novel wavefront slope testing method that uses a scanning galvo laser, in which a single-mode Gaussian beam scans the pupils of the tested optics in the system. In addition, the ray aberration is reconstructed by the four-step phase-shifting measurement by modulating the angular domain. The measured wavefront is verified by a Fizeau interferometer in terms of Zernike polynomials.
authors.forename: Jia-Wei
authors.initials: JW
authors.lastname: Chen
authors.forename: Chao-Wen
authors.initials: CW
authors.lastname: Liang
authors.forename: Sheng-Hui
authors.initials: SH
authors.lastname: Chen