title: High-resolution moiré interferometry for quantitative low-cost, real-time surface profilometry.
abstract: A two-dimensional optical profilometry system has been developed in which fringe projection and image processing methods allow for image acquisition and analysis at video frame rates with μm-scale precision in an inexpensive portable device. The device presented can be used to interrogate any uniformly reflective surface, imaging an area of approximately 10 square centimeters and providing a real-time digital display of the surface's contours. The presented system has the ability to resolve surface features with a lateral resolution of <50  μm and <15  μm in height.
authors.forename: J Josiah
authors.initials: JJ
authors.lastname: Steckenrider
authors.forename: J Scott
authors.initials: JS
authors.lastname: Steckenrider