title: Atomic force microscopy of starch systems.
abstract: Atomic force microscopy (AFM) generates information on topography, adhesion, and elasticity of sample surface by touching with a tip. Under suitable experimental settings, AFM can image biopolymers of few nanometers. Starch is a major food and industrial component. AFM has been used to probe the morphology, properties, modifications, and interactions of starches from diverse botanical origins at both micro- and nano-structural levels. The structural information obtained by AFM supports the blocklet structure of the granules, and provides qualitative and quantitative basis for some physicochemical properties of diverse starch systems. It becomes evident that AFM can complement other microscopic techniques to provide novel structural insights for starch systems.
authors.affiliation: a School of Chemical Sciences , University of Auckland , Auckland , New Zealand.
authors.forename: Fan
authors.initials: F
authors.lastname: Zhu
mesh_terms: D004548:Elasticity; D018625:Microscopy, Atomic Force / Q000379:methods*; D013213:Starch / Q000737:chemistry / Q000648:ultrastructure*
chemical_list: D013213:Starch
keywords: Atomic force microscopy; processing; starch; structure; structure–property relationship; surface