Non-destructive mapping of grain orientations in 3D by laboratory X-ray microscopy.
The ability to characterise crystallographic microstructure, non-destructively and in three-dimensions, is a powerful tool for understanding many aspects related to damage and deformation mechanisms in polycrystalline materials. To this end, the technique of X-ray diffraction contrast tomography (DCT) using monochromatic synchrotron and polychromatic laboratory X-ray sources has been shown to be capable of mapping crystal grains and their orientations non-destructively in 3D. Here we describe a novel laboratory-based X-ray DCT modality (LabDCT), enabling the wider accessibility of the DCT technique for routine use and in-depth studies of, for example, temporal changes in crystallographic grain structure non-destructively over time through '4D' in situ time-lapse studies. The capability of the technique is demonstrated by studying a titanium alloy (Ti-β21S) sample. In the current implementation the smallest grains that can be reliably detected are around 40 μm. The individual grain locations and orientations are reconstructed using the LabDCT method and the results are validated against independent measurements from phase contrast tomography and electron backscatter diffraction respectively. Application of the technique promises to provide important insights related to the roles of recrystallization and grain growth on materials properties as well as supporting 3D polycrystalline modelling of materials performance.
Manchester X-ray Imaging Facility, School of Materials, University of Manchester, Manchester, M13 9PL, UK.
S A
SA
McDonald
Xnovo Technology ApS, Galoche Alle 15, 4600 Køge, Denmark.
P
P
Reischig
Carl Zeiss X-ray Microscopy, Inc., 4385 Hopyard Road, Suite 100, Pleasanton, CA 94588, USA.
C
C
Holzner
Xnovo Technology ApS, Galoche Alle 15, 4600 Køge, Denmark.
E M
EM
Lauridsen
Manchester X-ray Imaging Facility, School of Materials, University of Manchester, Manchester, M13 9PL, UK.
P J
PJ
Withers
Carl Zeiss X-ray Microscopy, Inc., 4385 Hopyard Road, Suite 100, Pleasanton, CA 94588, USA.
A P
AP
Merkle
Carl Zeiss X-ray Microscopy, Inc., 4385 Hopyard Road, Suite 100, Pleasanton, CA 94588, USA.
M
M
Feser