title: Visualizing Optoelectronic Processes at the Nanoscale.
abstract: In this issue of ACS Nano, Nienhaus et al. report the optoelectronic properties of carbon nanotube chiral junctions with nanometer resolution in the presence of strong electric fields (∼1 V/nm). Here, we provide an overview of recent studies that combine scanning tunneling microscope (STM) and laser or microwave illumination. These techniques reveal nanoscale laser- or microwave-induced phenomena utilizing the intrinsic atomic resolution of the tunneling current, and do not require substantial modification of the STM itself. The merits of atomic-scale spatial resolution and chemical sensitivity of the laser or microwave spectroscopes make these techniques useful for nanoscale characterization.
authors.affiliation: Institute of Multidisciplinary Research for Advanced Materials (IMRAM, Tagen), Tohoku University , 2-1-1, Katahira, Aoba-Ku, Sendai 980-0877, Japan.
authors.forename: Puneet
authors.initials: P
authors.lastname: Mishra
authors.affiliation: Institute of Multidisciplinary Research for Advanced Materials (IMRAM, Tagen), Tohoku University , 2-1-1, Katahira, Aoba-Ku, Sendai 980-0877, Japan.|JST, CREST , 4-1-8 Honcho, Kawaguchi, Saitama 332-0012, Japan.
authors.forename: Tadahiro
authors.initials: T
authors.lastname: Komeda