title: Electric-Field-Driven Dual Vacancies Evolution in Ultrathin Nanosheets Realizing Reversible Semiconductor to Half-Metal Transition.
abstract: Fabricating a flexible room-temperature ferromagnetic resistive-switching random access memory (RRAM) device is of fundamental importance to integrate nonvolatile memory and spintronics both in theory and practice for modern information technology and has the potential to bring about revolutionary new foldable information-storage devices. Here, we show that a relatively low operating voltage (+1.4 V/-1.5 V, the corresponding electric field is around 20,000 V/cm) drives the dual vacancies evolution in ultrathin SnO2 nanosheets at room temperature, which causes the reversible transition between semiconductor and half-metal, accompanyied by an abrupt conductivity change up to 10(3) times, exhibiting room-temperature ferromagnetism in two resistance states. Positron annihilation spectroscopy and electron spin resonance results show that the Sn/O dual vacancies in the ultrathin SnO2 nanosheets evolve to isolated Sn vacancy under electric field, accounting for the switching behavior of SnO2 ultrathin nanosheets; on the other hand, the different defect types correspond to different conduction natures, realizing the transition between semiconductor and half-metal. Our result represents a crucial step to create new a information-storage device realizing the reversible transition between semiconductor and half-metal with flexibility and room-temperature ferromagnetism at low energy consumption. The as-obtained half-metal in the low-resistance state broadens the application of the device in spintronics and the semiconductor to half-metal transition on the basis of defects evolution and also opens up a new avenue for exploring random access memory mechanisms and finding new half-metals for spintronics.
authors.forename: Mengjie
authors.initials: M
authors.lastname: Lyu
authors.forename: Youwen
authors.initials: Y
authors.lastname: Liu
authors.forename: Yuduo
authors.initials: Y
authors.lastname: Zhi
authors.forename: Chong
authors.initials: C
authors.lastname: Xiao
authors.forename: Bingchuan
authors.initials: B
authors.lastname: Gu
authors.forename: Xuemin
authors.initials: X
authors.lastname: Hua
authors.forename: Shaojuan
authors.initials: S
authors.lastname: Fan
authors.forename: Yue
authors.initials: Y
authors.lastname: Lin
authors.forename: Wei
authors.initials: W
authors.lastname: Bai
authors.affiliation: High Magnetic Field Laboratory, Chinese Academy of Sciences , Hefei, Anhui 230031, PR China.
authors.forename: Wei
authors.initials: W
authors.lastname: Tong
authors.affiliation: High Magnetic Field Laboratory, Chinese Academy of Sciences , Hefei, Anhui 230031, PR China.
authors.forename: Youming
authors.initials: Y
authors.lastname: Zou
authors.forename: Bicai
authors.initials: B
authors.lastname: Pan
authors.forename: Bangjiao
authors.initials: B
authors.lastname: Ye
authors.forename: Yi
authors.initials: Y
authors.lastname: Xie