title: Energy-filtered real- and k-space secondary and energy-loss electron imaging with Dual Emission Electron spectro-Microscope: Cs/Mo(110).
abstract: Since its introduction the importance of complementary k||-space (LEED) and real space (LEEM) information in the investigation of surface science phenomena has been widely demonstrated over the last five decades. In this paper we report the application of a novel kind of electron spectromicroscope Dual Emission Electron spectroMicroscope (DEEM) with two independent electron optical channels for reciprocal and real space quasi-simultaneous imaging in investigation of a Cs covered Mo(110) single crystal by using the 800eV electron beam from an "in-lens" electron gun system developed for the sample illumination. With the DEEM spectromicroscope it is possible to observe dynamic, irreversible processes at surfaces in the energy-filtered real space and in the corresponding energy-filtered kǁ-space quasi-simultaneously in two independent imaging columns. The novel concept of the high energy electron beam sample illumination in the cathode lens based microscopes allows chemically selective imaging and analysis under laboratory conditions.
authors.affiliation: OPTICON Nanotechnology, Muchoborska 18, PL54-424 Wrocław, Poland. Electronic address: k.grzelakowski@opticon-nanotechnology.com.
authors.forename: Krzysztof P
authors.initials: KP
authors.lastname: Grzelakowski
keywords: DEEM; EELS; EF-PEEM; Electron spectromicroscopy; Imaging AES; Imaging EELS; Imaging ESCA; LEEM; Momentum mapping; Momentum microscopy; XPEEM