title: Differential-interference-contrast digital in-line holography microscopy based on a single-optical-element.
abstract: Both digital in-line holography (DIH) and zone plate-based microscopy have received considerable interest as powerful imaging tools. However, the former suffers from a twin-image noise problem. The latter suffers from low efficiency and difficulty in fabrication. Here, we present an effective and efficient phase-contrast imaging approach, named differential-interference-contrast digital in-line holography (DIC-DIH), by using a single optical element to split the incident light into a plane wave and a converging spherical wave and generate a two-dimensional (2D) DIC effect simultaneously. Specifically, to improve image contrast, we present a new single optical element, termed 2D DIC compound photon sieves, by combining two overlaid binary gratings and a compound photon sieve through two logical XOR operations. The proof-of-concept experiments demonstrate that the proposed technique can eliminate the twin-image noise problem and improve image contrast with high efficiency. Additionally, we present an example of the phase-contrast imaging nonuniform thick photoresist development process.
authors.forename: Yuchao
authors.initials: Y
authors.lastname: Zhang
authors.forename: Changqing
authors.initials: C
authors.lastname: Xie
mesh_terms: D004867:Equipment Design; D019544:Equipment Failure Analysis; D006696:Holography / Q000379:methods*; D007089:Image Enhancement / Q000295:instrumentation; D021621:Imaging, Three-Dimensional / Q000295:instrumentation*; D007909:Lenses; D008857:Microscopy, Interference / Q000295:instrumentation*; D008904:Miniaturization; D019047:Phantoms, Imaging; D015203:Reproducibility of Results; D012680:Sensitivity and Specificity; D012815:Signal Processing, Computer-Assisted / Q000295:instrumentation*