title: Scaling like behaviour of resistivity observed in LaNiO₃ thin films grown on SrTiO₃ substrate by pulsed laser deposition.
abstract: We discuss the origin of the temperature dependence of resistivity ρ observed in highly oriented LaNiO3 thin films grown on SrTiO3 substrate by a pulsed laser deposition technique. All the experimental data are found to collapse into a single universal curve ρ(T, d) ∝ [T/T(sf)(d)]3/2 for the entire temperature interval (20K<T<300 K) with T(sf)(d) being the onset temperature for triggering a resonant scattering of conduction electrons by spin fluctuations in LaNiO3/SrTiO3 heterostructure.
authors.affiliation: Departamento de Física, CCEN, Universidade Federal da Paraíba, 58051-970 João Pessoa, PB, Brazil. Departamento de Física, Universidade Federal de São Carlos, 13565-905 São Carlos, SP, Brazil.
authors.forename: S
authors.initials: S
authors.lastname: Sergeenkov
authors.forename: L
authors.initials: L
authors.lastname: Cichetto
authors.forename: M
authors.initials: M
authors.lastname: Zampieri
authors.forename: E
authors.initials: E
authors.lastname: Longo
authors.forename: F M
authors.initials: FM
authors.lastname: Araújo-Moreira