title: Electron Microscopy of Probability Currents at Atomic Resolution.
abstract: Atomic resolution transmission electron microscopy records the spatially resolved scattered electron density to infer positions, density, and species of atoms. These data are indispensable for studying the relation between structure and properties in solids. Here, we show how this signal can be augmented by the lateral probability current of the scattered electrons in the object plane at similar resolutions and fields of view. The currents are reconstructed from a series of three atomic resolution TEM images recorded under a slight difference of perpendicular line foci. The technique does not rely on the coherence of the electron beam and can be used to reveal electric, magnetic, and strain fields with incoherent electron beams as well as correlations in inelastic transitions, such as electron magnetic chiral dichroism.
authors.affiliation: Triebenberg Laboratory, Institute of Structure Physics, Technische Universität Dresden, 01062 Dresden, Germany.
authors.forename: A
authors.initials: A
authors.lastname: Lubk
authors.affiliation: EMAT, University of Antwerp, Groenenborgerlaan 171, 2020 Antwerp, Belgium.
authors.forename: A
authors.initials: A
authors.lastname: Béché
authors.affiliation: EMAT, University of Antwerp, Groenenborgerlaan 171, 2020 Antwerp, Belgium.
authors.forename: J
authors.initials: J
authors.lastname: Verbeeck