title: Highly Stretchable Electrodes on Wrinkled Polydimethylsiloxane Substrates.
abstract: This paper demonstrates a fabrication technology of Ag wrinkled electrodes with application in highly stretchable wireless sensors. Ag wrinkled thin films that were formed by vacuum deposition on top of pre-strained and relaxed polydimethylsiloxane (PDMS) substrates which have been treated using an O2 plasma and a surface chemical functionalization process can reach a strain limit up to 200%, while surface adhesion area can reach 95%. The electrical characteristics of components such as resistors, inductors and capacitors made from such Ag conductors have remained stable under stretching exhibiting low temperature and humidity coefficients. This technology was then demonstrated for wireless wearable electronics using compatible processing with established micro/nano fabrication technology.
authors.affiliation: Science and Technology on Electronic Test &Measurement Laboratory, Ministry of Education, Shanxi, 030051, China.|Key Laboratory of Instrumentation Science &Dynamic Measurement (North University of China), Ministry of Education, Shanxi, 030051, China.
authors.forename: Jun
authors.initials: J
authors.lastname: Tang
authors.affiliation: Science and Technology on Electronic Test &Measurement Laboratory, Ministry of Education, Shanxi, 030051, China.|Key Laboratory of Instrumentation Science &Dynamic Measurement (North University of China), Ministry of Education, Shanxi, 030051, China.
authors.forename: Hao
authors.initials: H
authors.lastname: Guo
authors.affiliation: Science and Technology on Electronic Test &Measurement Laboratory, Ministry of Education, Shanxi, 030051, China.|Key Laboratory of Instrumentation Science &Dynamic Measurement (North University of China), Ministry of Education, Shanxi, 030051, China.
authors.forename: Miaomiao
authors.initials: M
authors.lastname: Zhao
authors.affiliation: Science and Technology on Electronic Test &Measurement Laboratory, Ministry of Education, Shanxi, 030051, China.|Key Laboratory of Instrumentation Science &Dynamic Measurement (North University of China), Ministry of Education, Shanxi, 030051, China.
authors.forename: Jiangtao
authors.initials: J
authors.lastname: Yang
authors.affiliation: Department of Applied Physics, National Technical University of Athens, GR-15780 Zografou, Greece.
authors.forename: Dimitris
authors.initials: D
authors.lastname: Tsoukalas
authors.affiliation: Science and Technology on Electronic Test &Measurement Laboratory, Ministry of Education, Shanxi, 030051, China.|Key Laboratory of Instrumentation Science &Dynamic Measurement (North University of China), Ministry of Education, Shanxi, 030051, China.
authors.forename: Binzhen
authors.initials: B
authors.lastname: Zhang
authors.affiliation: Science and Technology on Electronic Test &Measurement Laboratory, Ministry of Education, Shanxi, 030051, China.|Key Laboratory of Instrumentation Science &Dynamic Measurement (North University of China), Ministry of Education, Shanxi, 030051, China.
authors.forename: Jun
authors.initials: J
authors.lastname: Liu
authors.affiliation: Science and Technology on Electronic Test &Measurement Laboratory, Ministry of Education, Shanxi, 030051, China.|Key Laboratory of Instrumentation Science &Dynamic Measurement (North University of China), Ministry of Education, Shanxi, 030051, China.
authors.forename: Chenyang
authors.initials: C
authors.lastname: Xue
authors.affiliation: Science and Technology on Electronic Test &Measurement Laboratory, Ministry of Education, Shanxi, 030051, China.|Key Laboratory of Instrumentation Science &Dynamic Measurement (North University of China), Ministry of Education, Shanxi, 030051, China.
authors.forename: Wendong
authors.initials: W
authors.lastname: Zhang