title: Are X-rays the key to integrated computational materials engineering?
abstract: An IUCrJ paper by Levine et al. highlights the promise and challenge of 3D X-ray structural microscopy as a unique tool to test predictive models of materials behavior.
authors.affiliation: Materials Science and Technology Division, Oak Ridge National Laboratory , PO Box 2008, Oak Ridge, TN 37831-6132, USA.
authors.forename: Gene
authors.initials: G
authors.lastname: Ice
keywords: integrated computational materials engineering; nondestructive crystal structure mapping; stress tensor measurement