title: Deterioration of the coercivity due to the diffusion induced interface layer in hard/soft multilayers.
abstract: Hard/soft permanent magnets have aroused many interests in the past two decades because of their potential in achieving giant energy products as well as their rich variety of magnetic behaviors. Nevertheless, the experimental energy products are much smaller than the theoretical ones due to the much smaller coercivity measured in the experiments. In this paper, the deterioration of the coercivity due to the interface atomic diffusion is demonstrated based on a three dimensional (3D) micromagnetic software (OOMMF) and a formula derived for the pinning field in a hard/soft multilayer, which can be applied to both permanent magnets and exchange-coupled-composite (ECC) media. It is found that the formation of the interface layer can decrease the coercivity by roughly 50%, which is responsible for the observed smaller coercivity in both composite and single-phased permanent magnets. A method to enhance the coercivity in these systems is proposed based on the discussions, consistent with recent experiments where excellent magnetic properties are achieved.
authors.affiliation: College of Physics and Electronic Engineering, Sichuan Normal University, Chengdu, 610068, China.
authors.forename: Wenjing
authors.initials: W
authors.lastname: Si
authors.affiliation: College of Physics and Electronic Engineering, Sichuan Normal University, Chengdu, 610068, China.
authors.forename: G P
authors.initials: GP
authors.lastname: Zhao
authors.affiliation: College of Physics and Electronic Engineering, Sichuan Normal University, Chengdu, 610068, China.
authors.forename: N
authors.initials: N
authors.lastname: Ran
authors.affiliation: College of Physics and Electronic Engineering, Sichuan Normal University, Chengdu, 610068, China.
authors.forename: Y
authors.initials: Y
authors.lastname: Peng
authors.affiliation: College of Physics and Electronic Engineering, Sichuan Normal University, Chengdu, 610068, China.
authors.forename: F J
authors.initials: FJ
authors.lastname: Morvan
authors.affiliation: College of Physics and Electronic Engineering, Sichuan Normal University, Chengdu, 610068, China.
authors.forename: X L
authors.initials: XL
authors.lastname: Wan