title: Rigorous Error Bounds for Ewald Summation of Electrostatics at Planar Interfaces.
abstract: We present a rigorous Ewald summation formula to evaluate the electrostatic interactions in two-dimensionally periodic planar interfaces of three-dimensional systems. By rewriting the Fourier part of the summation formula of the original Ewald2D expression with an explicit order N(2) complexity to a closed form Fourier integral, we find that both the previously developed electrostatic layer correction term and the boundary correction term naturally arise from the expression of a rigorous trapezoidal summation of the Fourier integral part. We derive the exact corrections to the trapezoidal summation in a form of contour integrals offering precise error bounds with given parameter sets of mesh size and system length. Numerical calculations of Madelung constants in model ionic crystals of slab geometry have been performed to support our analytical results.
authors.affiliation: State Key Laboratory of Supramolecular Structure and Materials, Jilin University , Changchun, 130012, P. R. China.|Institute of Theoretical Chemistry, Jilin University , Changchun, 130012, P. R. China.
authors.forename: Cong
authors.initials: C
authors.lastname: Pan
authors.affiliation: State Key Laboratory of Supramolecular Structure and Materials, Jilin University , Changchun, 130012, P. R. China.|Institute of Theoretical Chemistry, Jilin University , Changchun, 130012, P. R. China.|Kavli Institute for Theoretical Physics China, CAS , Beijing 100190, P. R. China.
authors.forename: Zhonghan
authors.initials: Z
authors.lastname: Hu