title: Studies on Structural, Morphological and Optical Properties of Chemically Deposited CdS(1-x)Se(x) Thin Films.
abstract: The thin films of CdS(1-x)Se(x) were successfully deposited over glass substrates by chemical bath deposition technique. Cadmium acetate, thiourea and sodium selenosulfate were used as source materials for Cd(2+), S(2-) and Se(2-) ions, while 2-mercaptoethanol was used as capping agent. The various deposition conditions such as precursor concentration, deposition temperature, pH and deposition time were optimized for the deposition of CdS(1-x)Se(x) thin films of good quality and the films were annealed at 200° and 300 °C. The structural, morphological, chemical and optical properties were examined by various characterization techniques and discussed in detail. The optical band gap of CdS(1-x)Se(x) thin film samples were estimated and found in the range from 2.11 to 1.79 eV for as-deposited and annealed thin films.
authors.affiliation: Dr. Ira Nimdeokar P.G. & Research Centre for Chemistry, Department of Chemistry, Hislop College, Nagpur, -440002, India.
authors.forename: Soumya R
authors.initials: SR
authors.lastname: Deo
authors.affiliation: Department of Chemistry, Govt. V. Y. T. P. G. Autonomous College, Durg, 491001, India. ajayaksingh_au@yahoo.co.in.
authors.forename: Ajaya K
authors.initials: AK
authors.lastname: Singh
authors.affiliation: Dr. Ira Nimdeokar P.G. & Research Centre for Chemistry, Department of Chemistry, Hislop College, Nagpur, -440002, India.
authors.forename: Lata
authors.initials: L
authors.lastname: Deshmukh
authors.affiliation: Department of Chemistry, Udai Pratap Autonomous PG College, Varanasi, UP, India.
authors.forename: Narendra Pratap
authors.initials: NP
authors.lastname: Singh
authors.affiliation: Department of Microelectronics, Technical University of Sofia, 8 St.Kliment Ohridski Boulevard, 1756, Sofia, Bulgaria.
authors.forename: Mariya P
authors.initials: MP
authors.lastname: Aleksandrova
keywords: 2-ME; Annealing; Cadmium sulfoselenide; Optical properties; SEM; XRD