title: Characterizing the carrier-envelope offset in an optical frequency comb without traditional f-to-2f interferometry.
abstract: We present a new method to measure the frequency noise and modulation response of the carrier-envelope offset (CEO) beat of an optical frequency comb that does not make use of the traditional f-to-2f interferometry. Instead, we use an appropriate combination of different signals to extract the contribution of the CEO frequency without directly detecting it. We present a proof-of-principle validation realized with a commercial Er:fiber frequency comb and show an excellent agreement with the results obtained using a standard f-to-2f interferometer. This approach is attractive for the characterization of novel frequency comb technologies for which self-referencing is challenging, such as semiconductor mode-locked lasers, microresonator-based systems, or GHz repetition rate lasers.
authors.forename: Pierre
authors.initials: P
authors.lastname: Brochard
authors.forename: Stéphane
authors.initials: S
authors.lastname: Schilt
authors.forename: Valentin J
authors.initials: VJ
authors.lastname: Wittwer
authors.forename: Thomas
authors.initials: T
authors.lastname: Südmeyer