title: Determination of Mean Inner Potential and Inelastic Mean Free Path of ZnTe Using Off-Axis Electron Holography and Dynamical Effects Affecting Phase Determination.
abstract: The mean inner potential (MIP) and inelastic mean free path (IMFP) of undoped ZnTe are determined using a combination of off-axis electron holography and convergent beam electron diffraction. The ZnTe MIP is measured to be 13.7±0.6 V, agreeing with previously reported simulations, and the IMFP at 200 keV is determined to be 46±2 nm for a collection angle of 0.75 mrad. Dynamical effects affecting holographic phase imaging as a function of incident beam direction for several common semiconductors are systematically studied and compared using Bloch wave simulations. These simulation results emphasize the need for careful choice of specimen orientation when carrying out quantitative electron holography studies in order to avoid erroneous phase measurements.
authors.affiliation: 1Department of Physics,Arizona State University,Tempe,AZ 85287,USA.
authors.forename: Zhaofeng
authors.initials: Z
authors.lastname: Gan
authors.affiliation: 2School of Electrical, Computer and Energy Engineering,Arizona State University,Tempe,AZ 85287,USA.
authors.forename: Michael
authors.initials: M
authors.lastname: DiNezza
authors.affiliation: 2School of Electrical, Computer and Energy Engineering,Arizona State University,Tempe,AZ 85287,USA.
authors.forename: Yong-Hang
authors.initials: YH
authors.lastname: Zhang
authors.affiliation: 1Department of Physics,Arizona State University,Tempe,AZ 85287,USA.
authors.forename: David J
authors.initials: DJ
authors.lastname: Smith
authors.affiliation: 1Department of Physics,Arizona State University,Tempe,AZ 85287,USA.
authors.forename: Martha R
authors.initials: MR
authors.lastname: McCartney
keywords: ZnTe; dynamic effects; electron holography; inelastic mean free path; mean inner potential