title: Diagnosing x-ray power and energy of tungsten wire array z-pinch with a flat spectral response x-ray diode.
abstract: Fast z-pinch is a very efficient way of converting electromagnetic energy to radiation. With an 8-10 MA current on primary test stand facility, about 1 MJ electromagnetic energy is delivered to vacuum chamber, which heats z-pinch plasma to radiate soft x-ray. To develop a pulsed high power x-ray source, we studied the applicability of diagnosing x-ray power from tungsten wire array z-pinch with a flat spectral response x-ray diode (FSR-XRD). The detector was originally developed to diagnose radiation of a hohlraum in SG-III prototype laser facility. It utilized a gold cathode XRD and a specially configured compound gold filter to yield a nearly flat spectral response in photon energy range of 0.1-4 keV. In practice, it was critical to avoid surface contamination of gold cathode. It is illustrated that an exposure of an XRD to multiple shots caused a significant change of response. Thus, in diagnosing x-ray power and energy, we used each XRD in only one shot after calibration. In a shot serial, output of FSR-XRD was compared with output of a nickel bolometer. In these shots, the outputs agreed with each other within their uncertainties which were about 12% for FSR-XRD and about 15% for bolometer. Moreover, the ratios between the FSR-XRD and the bolometer among different shots were explored. In 8 shots, the standard deviation of the ratio was 6%. It is comparable to XRD response change of 7%.
authors.affiliation: Key Laboratory of Pulsed Power Technology, IFP, CAEP, Mianyang 621900, China.
authors.forename: Kun-lun
authors.initials: KL
authors.lastname: Wang
authors.affiliation: Key Laboratory of Pulsed Power Technology, IFP, CAEP, Mianyang 621900, China.
authors.forename: Xiao-dong
authors.initials: XD
authors.lastname: Ren
authors.affiliation: Key Laboratory of Pulsed Power Technology, IFP, CAEP, Mianyang 621900, China.
authors.forename: Xian-bin
authors.initials: XB
authors.lastname: Huang
authors.affiliation: Key Laboratory of Pulsed Power Technology, IFP, CAEP, Mianyang 621900, China.
authors.forename: Si-qun
authors.initials: SQ
authors.lastname: Zhang
authors.affiliation: Key Laboratory of Pulsed Power Technology, IFP, CAEP, Mianyang 621900, China.
authors.forename: Shao-tong
authors.initials: ST
authors.lastname: Zhou
authors.affiliation: Key Laboratory of Pulsed Power Technology, IFP, CAEP, Mianyang 621900, China.
authors.forename: Jia-kun
authors.initials: JK
authors.lastname: Dan
authors.affiliation: Key Laboratory of Pulsed Power Technology, IFP, CAEP, Mianyang 621900, China.
authors.forename: Jing
authors.initials: J
authors.lastname: Li
authors.affiliation: Key Laboratory of Pulsed Power Technology, IFP, CAEP, Mianyang 621900, China.
authors.forename: Qiang
authors.initials: Q
authors.lastname: Xu
authors.affiliation: Key Laboratory of Pulsed Power Technology, IFP, CAEP, Mianyang 621900, China.
authors.forename: Kai
authors.initials: K
authors.lastname: Ouyang
authors.affiliation: Key Laboratory of Pulsed Power Technology, IFP, CAEP, Mianyang 621900, China.
authors.forename: Hong-chun
authors.initials: HC
authors.lastname: Cai
authors.affiliation: Key Laboratory of Pulsed Power Technology, IFP, CAEP, Mianyang 621900, China.
authors.forename: Bing
authors.initials: B
authors.lastname: Wei
authors.affiliation: Key Laboratory of Pulsed Power Technology, IFP, CAEP, Mianyang 621900, China.
authors.forename: Ce
authors.initials: C
authors.lastname: Ji
authors.affiliation: Key Laboratory of Pulsed Power Technology, IFP, CAEP, Mianyang 621900, China.
authors.forename: Shu-ping
authors.initials: SP
authors.lastname: Feng
authors.affiliation: Key Laboratory of Pulsed Power Technology, IFP, CAEP, Mianyang 621900, China.
authors.forename: Meng
authors.initials: M
authors.lastname: Wang
authors.affiliation: Key Laboratory of Pulsed Power Technology, IFP, CAEP, Mianyang 621900, China.
authors.forename: Wei-ping
authors.initials: WP
authors.lastname: Xie
authors.affiliation: Key Laboratory of Pulsed Power Technology, IFP, CAEP, Mianyang 621900, China.
authors.forename: Jian-jun
authors.initials: JJ
authors.lastname: Deng