title: Closing the gap between electron and X-ray crystallography.
abstract: The development of a proper refinement algorithm that takes into account dynamical scattering guarantees, for electron crystallography, results approaching X-rays in terms of precision, accuracy and reliability. The combination of such dynamical refinement and electron diffraction tomography establishes a complete pathway for the structure characterization of single sub-micrometric crystals.
authors.affiliation: Dipartimento di Scienze Fisiche, della Terra e dell'Ambiente, Università degli Studi di Siena, Via Laterino 8, 53100 Siena, Italy.
authors.forename: Enrico
authors.initials: E
authors.lastname: Mugnaioli
keywords: dynamical diffraction; electron crystallography; electron diffraction tomography