title: A study of the interfacial resistive switching mechanism by proton exchange reactions on the SiO(x) layer.
abstract: In this work, we investigated SiO(x)-based interfacial resistive switching in planar metal-insulator-metal structures using physical/chemical/electrical analyses. This work helps clarify the interfacial reaction process and mechanism in SiO(x), and also shows the potential for high temperature operation in future nonvolatile memory applications.
authors.affiliation: Microelectronics Research Center, Department of Electrical and Computer Engineering, The University of Texas at Austin, Austin, Texas 78758, USA. yfchang@utexas.edu.
authors.forename: Fei
authors.initials: F
authors.lastname: Zhou
authors.affiliation: Microelectronics Research Center, Department of Electrical and Computer Engineering, The University of Texas at Austin, Austin, Texas 78758, USA. yfchang@utexas.edu.
authors.forename: Yao-Feng
authors.initials: YF
authors.lastname: Chang
authors.affiliation: Microelectronics Research Center, Department of Electrical and Computer Engineering, The University of Texas at Austin, Austin, Texas 78758, USA. yfchang@utexas.edu.
authors.forename: Ying-Chen
authors.initials: YC
authors.lastname: Chen
authors.affiliation: Microelectronics Research Center, Department of Electrical and Computer Engineering, The University of Texas at Austin, Austin, Texas 78758, USA. yfchang@utexas.edu.
authors.forename: Xiaohan
authors.initials: X
authors.lastname: Wu
authors.affiliation: Microelectronics Research Center, Department of Electrical and Computer Engineering, The University of Texas at Austin, Austin, Texas 78758, USA. yfchang@utexas.edu.
authors.forename: Ye
authors.initials: Y
authors.lastname: Zhang
authors.affiliation: Microelectronics Research Center, Department of Electrical and Computer Engineering, The University of Texas at Austin, Austin, Texas 78758, USA. yfchang@utexas.edu.
authors.forename: Burt
authors.initials: B
authors.lastname: Fowler
authors.affiliation: Microelectronics Research Center, Department of Electrical and Computer Engineering, The University of Texas at Austin, Austin, Texas 78758, USA. yfchang@utexas.edu.
authors.forename: Jack C
authors.initials: JC
authors.lastname: Lee