title: Polarization-sensitive interferometric synthetic aperture microscopy.
abstract: Three-dimensional optical microscopy suffers from the well-known compromise between transverse resolution and depth-of-field. This is true for both structural imaging methods and their functional extensions. Interferometric synthetic aperture microscopy (ISAM) is a solution to the 3D coherent microscopy inverse problem that provides depth-independent transverse resolution. We demonstrate the extension of ISAM to polarization sensitive imaging, termed polarization-sensitive interferometric synthetic aperture microscopy (PS-ISAM). This technique is the first functionalization of the ISAM method and provides improved depth-of-field for polarization-sensitive imaging. The basic assumptions of polarization-sensitive imaging are explored, and refocusing of birefringent structures is experimentally demonstrated. PS-ISAM enables high-resolution volumetric imaging of birefringent materials and tissue.
authors.forename: Fredrick A
authors.initials: FA
authors.lastname: South
authors.forename: Yuan-Zhi
authors.initials: YZ
authors.lastname: Liu
authors.forename: Yang
authors.initials: Y
authors.lastname: Xu
authors.forename: Nathan D
authors.initials: ND
authors.lastname: Shemonski
authors.forename: P Scott
authors.initials: PS
authors.lastname: Carney
authors.forename: Stephen A
authors.initials: SA
authors.lastname: Boppart