title: The role of low-energy electrons in focused electron beam induced deposition: four case studies of representative precursors.
abstract: Focused electron beam induced deposition (FEBID) is a single-step, direct-write nanofabrication technique capable of writing three-dimensional metal-containing nanoscale structures on surfaces using electron-induced reactions of organometallic precursors. Currently FEBID is, however, limited in resolution due to deposition outside the area of the primary electron beam and in metal purity due to incomplete precursor decomposition. Both limitations are likely in part caused by reactions of precursor molecules with low-energy (<100 eV) secondary electrons generated by interactions of the primary beam with the substrate. These low-energy electrons are abundant both inside and outside the area of the primary electron beam and are associated with reactions causing incomplete ligand dissociation from FEBID precursors. As it is not possible to directly study the effects of secondary electrons in situ in FEBID, other means must be used to elucidate their role. In this context, gas phase studies can obtain well-resolved information on low-energy electron-induced reactions with FEBID precursors by studying isolated molecules interacting with single electrons of well-defined energy. In contrast, ultra-high vacuum surface studies on adsorbed precursor molecules can provide information on surface speciation and identify species desorbing from a substrate during electron irradiation under conditions more representative of FEBID. Comparing gas phase and surface science studies allows for insight into the primary deposition mechanisms for individual precursors; ideally, this information can be used to design future FEBID precursors and optimize deposition conditions. In this review, we give a summary of different low-energy electron-induced fragmentation processes that can be initiated by the secondary electrons generated in FEBID, specifically, dissociative electron attachment, dissociative ionization, neutral dissociation, and dipolar dissociation, emphasizing the different nature and energy dependence of each process. We then explore the value of studying these processes through comparative gas phase and surface studies for four commonly-used FEBID precursors: MeCpPtMe3, Pt(PF3)4, Co(CO)3NO, and W(CO)6. Through these case studies, it is evident that this combination of studies can provide valuable insight into potential mechanisms governing deposit formation in FEBID. Although further experiments and new approaches are needed, these studies are an important stepping-stone toward better understanding the fundamental physics behind the deposition process and establishing design criteria for optimized FEBID precursors.
authors.affiliation: Science Institute and Department of Chemistry, University of Iceland, Reykjavík, Iceland ; Department of Chemistry, Johns Hopkins University, Baltimore, Maryland, USA.
authors.forename: Rachel M
authors.initials: RM
authors.lastname: Thorman
authors.affiliation: Science Institute and Department of Chemistry, University of Iceland, Reykjavík, Iceland.
authors.forename: Ragesh
authors.initials: R
authors.lastname: Kumar T P
authors.affiliation: Department of Chemistry, Johns Hopkins University, Baltimore, Maryland, USA.
authors.forename: D Howard
authors.initials: DH
authors.lastname: Fairbrother
authors.affiliation: Science Institute and Department of Chemistry, University of Iceland, Reykjavík, Iceland.
authors.forename: Oddur
authors.initials: O
authors.lastname: Ingólfsson
keywords: dipolar dissociation; dissociative electron attachment; dissociative ionization; focused electron beam induced deposition (FEBID); low-energy electron-induced fragmentation; neutral dissociation