title: Enhanced model for determining the number of graphene layers and their distribution from X-ray diffraction data.
abstract: A model consisting of an equation that includes graphene thickness distribution is used to calculate theoretical 002 X-ray diffraction (XRD) peak intensities. An analysis was performed upon graphene samples produced by two different electrochemical procedures: electrolysis in aqueous electrolyte and electrolysis in molten salts, both using a nonstationary current regime. Herein, the model is enhanced by a partitioning of the corresponding 2θ interval, resulting in significantly improved accuracy of the results. The model curves obtained exhibit excellent fitting to the XRD intensities curves of the studied graphene samples. The employed equation parameters make it possible to calculate the j-layer graphene region coverage of the graphene samples, and hence the number of graphene layers. The results of the thorough analysis are in agreement with the calculated number of graphene layers from Raman spectra C-peak position values and indicate that the graphene samples studied are few-layered.
authors.affiliation: Faculty of Technology and Metallurgy, SS Cyril and Methodius University, Rugjer Boskovik 16, 1000 Skopje, Macedonia.
authors.forename: Beti
authors.initials: B
authors.lastname: Andonovic
authors.affiliation: Faculty of Technology and Metallurgy, SS Cyril and Methodius University, Rugjer Boskovik 16, 1000 Skopje, Macedonia.
authors.forename: Abdulakim
authors.initials: A
authors.lastname: Ademi
authors.affiliation: Faculty of Technology and Metallurgy, SS Cyril and Methodius University, Rugjer Boskovik 16, 1000 Skopje, Macedonia.
authors.forename: Anita
authors.initials: A
authors.lastname: Grozdanov
authors.affiliation: Faculty of Technology and Metallurgy, SS Cyril and Methodius University, Rugjer Boskovik 16, 1000 Skopje, Macedonia.
authors.forename: Perica
authors.initials: P
authors.lastname: Paunović
authors.affiliation: Faculty of Technology and Metallurgy, SS Cyril and Methodius University, Rugjer Boskovik 16, 1000 Skopje, Macedonia.
authors.forename: Aleksandar T
authors.initials: AT
authors.lastname: Dimitrov
keywords: X-ray diffraction; electrochemical production; graphene; layers