title: Marginal Adaptation of Class V Restorations with a New Universal Adhesive.
abstract: This study aimed to evaluate the microleakage of a new universal adhesive used in self-etch (Se) and etch-and-rinse (Er) mode compared with conventional adhesive systems. Fifty standard Class V caries lesions were prepared on the buccal and lingual surfaces of premolar teeth and randomly divided into five groups (n = 10): Group 1 (control), Adper Single Bond 2 (SB); Group 2, Single Bond Universal applied as Er (SBUEr); Group 3, Single Bond Universal applied as Se (SBUSe); Group 4 (control), Clearfil SE (CSE); and Group 5, Xeno V (XE). On both enamel and dentin, XE showed the highest microleakage scores, and SBU showed similar leakage with the control group.
authors.forename: Emel
authors.initials: E
authors.lastname: Karaman
authors.forename: Eda
authors.initials: E
authors.lastname: Güler
mesh_terms: D000134:Acid Etching, Dental; D001641:Bicuspid; D003188:Composite Resins / Q000737:chemistry*; D003738:Dental Cements / Q000737:chemistry*; D003763:Dental Leakage; D018772:Dental Marginal Adaptation; D003793:Dental Restoration, Permanent / Q000379:methods*; D017220:Dentin-Bonding Agents / Q000737:chemistry*; D006801:Humans; D066298:In Vitro Techniques; D055115:Light-Curing of Dental Adhesives; D011897:Random Allocation; D019279:Resin Cements / Q000737:chemistry*
chemical_list: C554641:Adper single bond 2; C438313:Clearfil SE Bond; D003188:Composite Resins; D003738:Dental Cements; D017220:Dentin-Bonding Agents; C444701:Filtek Z250; D019279:Resin Cements; C575872:Xeno V; C041330:Scotchbond