title: Origins of polarization-dependent anisotropic X-ray scattering from organic thin films.
abstract: Organic thin films that have no overall in-plane directional ordering often nonetheless produce anisotropic scattering patterns that rotate with the polarization of incident resonant X-rays. Isotropic symmetry is broken by local correlations between molecular orientation and domain structure. Such examples of molecular alignment at domain interfaces and within the bulk of domains, which are both critical to fields such as organic electronics, are simulated and compared with experimental scattering. Anisotropic scattering patterns are found to allow unambiguous identification of the mechanism of local molecular orientation correlations and, as such, promise to be both distinct and complementary to isotropic scattering intensity as a general measure of thin film microstructure.
authors.affiliation: Australian Synchrotron, 800 Blackburn Road, Clayton, Victoria 3168, Australia.
authors.forename: Eliot
authors.initials: E
authors.lastname: Gann
authors.affiliation: Materials Science and Engineering Division, NIST, Gaithersburg, MD 20899-1070, USA.
authors.forename: Brian A
authors.initials: BA
authors.lastname: Collins
authors.affiliation: Department of Physics, NCSU, Raleigh, NC 27695-8202, USA.
authors.forename: Maolong
authors.initials: M
authors.lastname: Tang
authors.affiliation: Department of Physics, NCSU, Raleigh, NC 27695-8202, USA.
authors.forename: John R
authors.initials: JR
authors.lastname: Tumbleston
authors.affiliation: Department of Physics, NCSU, Raleigh, NC 27695-8202, USA.
authors.forename: Subrangsu
authors.initials: S
authors.lastname: Mukherjee
authors.affiliation: Department of Physics, NCSU, Raleigh, NC 27695-8202, USA.
authors.forename: Harald
authors.initials: H
authors.lastname: Ade
keywords: PSoXS; RSoXS; polarization; resonant scattering; scattering; simulation