title: Measurement of synchrotron-radiation-excited Kossel patterns.
abstract: Kossel line patterns contain information on the crystalline structure, such as the magnitude and the phase of Bragg reflections. For technical reasons, most of these patterns are obtained using electron beam excitation, which leads to surface sensitivity that limits the spatial extent of the structural information. To obtain the atomic structure in bulk volumes, X-rays should be used as the excitation radiation. However, there are technical problems, such as the need for high resolution, low noise, large dynamic range, photon counting, two-dimensional pixel detectors and the small spot size of the exciting beam, which have prevented the widespread use of Kossel pattern analysis. Here, an experimental setup is described, which can be used for the measurement of Kossel patterns in a reasonable time and with high resolution to recover structural information.
authors.affiliation: Wigner Research Centre for Physics, Institute for Solid State Physics and Optics, POB 49, H-1525 Budapest, Hungary.
authors.forename: G
authors.initials: G
authors.lastname: Bortel
authors.affiliation: Wigner Research Centre for Physics, Institute for Solid State Physics and Optics, POB 49, H-1525 Budapest, Hungary.
authors.forename: G
authors.initials: G
authors.lastname: Faigel
authors.affiliation: Wigner Research Centre for Physics, Institute for Solid State Physics and Optics, POB 49, H-1525 Budapest, Hungary.
authors.forename: M
authors.initials: M
authors.lastname: Tegze
authors.affiliation: ESRF - The European Synchrotron, CS40220, 38043 Grenoble Cedex 9, France.
authors.forename: A
authors.initials: A
authors.lastname: Chumakov
keywords: Kossel pattern; diffraction; fluorescence