title: In Operando X-Ray Nanodiffraction Reveals Electrically Induced Bending and Lattice Contraction in a Single Nanowire Device.
abstract: Hard X-ray diffraction (XRD) using a nanofocused beam is used to measure both lattice contraction and bending in a single nanowire device under electric bias. The shape of the nanowire is reconstructed in 3D with sub-nanometer precision. As the bias voltage is gradually increased, nonreversible structural changes in the contact regions are observed, correlated with degradation of the electrical conductance.
authors.affiliation: Institute for X-Ray Physics, University of Göttingen, Friedrich-Hund-Platz 1, 37077, Göttingen, Germany.
authors.forename: Jesper
authors.initials: J
authors.lastname: Wallentin
authors.affiliation: Institute for X-Ray Physics, University of Göttingen, Friedrich-Hund-Platz 1, 37077, Göttingen, Germany.
authors.forename: Markus
authors.initials: M
authors.lastname: Osterhoff
authors.affiliation: Institute for X-Ray Physics, University of Göttingen, Friedrich-Hund-Platz 1, 37077, Göttingen, Germany.
authors.forename: Tim
authors.initials: T
authors.lastname: Salditt
keywords: X-ray nanodiffraction; lattice contraction; single nanowire devices