title: Developing a microspectrophotometer to measure the dependence of broadband refractive indices on Ge-doped concentrations in GRIN rods.
abstract: A confocal microspectrophotometer is utilized to scan the surface reflectivities of a polished gradient-index (GRIN) rod in the range of 400 to 900 nm. The pure fused silica is used to be a reference standard for deducing the absolute reflectivities of the Ge-doped core. Then, multi-wavelength refractive index profiles of the Ge-doped core can be further determined based on the Fresnel equation. Moreover, this work shows a connection between the material dispersion of the GRIN rod and the Ge-doped concentrations measured by an energy dispersive spectrometer. Finally, the dependence of the refractive index of the Ge-doped core on the doping concentrations at a certain wavelength can be easily expressed as a linear form.
authors.forename: Chun-Jen
authors.initials: CJ
authors.lastname: Weng
authors.forename: Ken-Yuh
authors.initials: KY
authors.lastname: Hsu
authors.forename: Cheng-Yeh
authors.initials: CY
authors.lastname: Lee
authors.forename: Yung-Fu
authors.initials: YF
authors.lastname: Chen