title: Investigation of the dynamic bending properties of MoS2 thin films by interference colours.
abstract: A non-contact method for the observation of the elastic deformation of 2D molybdenum disulfide (MoS2) thin films using an ordinary optical microscope is reported. A pulsed laser is used to rapidly increase the bending deformation of the MoS2 thin films via heating. The bending angle of the MoS2 thin films shows high stability, changing only 5% in forty days without external forces. However, the bending angle of the MoS2 thin films substantially decreases after being wetted with the volatile polar solvent tetrahydrofuran (THF), because of its low surface tension. By removing the nano-Newton scale forces on the MoS2 thin films, the bending angle increases significantly within 4 minutes, and this feature of the thin films shows great potential for use in the fabrication of micro-force sensors. This is the first attempt to study the mechanical properties of 2D materials by optical methods. Further utilization of industrially manufactured MoS2 thin films for detecting micro-force qualitatively on the basis of their excellent bending properties would significantly reduce the production costs of micro-force sensors.
authors.affiliation: Institute of Super-microstructure and Ultrafast Process in Advanced Materials, School of Physics and Electronics, Central South University, 932 South Lushan Road, Changsha, Hunan 410083, P. R. China.
authors.forename: Peng
authors.initials: P
authors.lastname: Wang
authors.affiliation: Institute of Super-microstructure and Ultrafast Process in Advanced Materials, School of Physics and Electronics, Central South University, 932 South Lushan Road, Changsha, Hunan 410083, P. R. China.
authors.forename: Si
authors.initials: S
authors.lastname: Xiao
authors.affiliation: Institute of Super-microstructure and Ultrafast Process in Advanced Materials, School of Physics and Electronics, Central South University, 932 South Lushan Road, Changsha, Hunan 410083, P. R. China.
authors.forename: Xiaohong
authors.initials: X
authors.lastname: Li
authors.affiliation: Institute of Super-microstructure and Ultrafast Process in Advanced Materials, School of Physics and Electronics, Central South University, 932 South Lushan Road, Changsha, Hunan 410083, P. R. China.
authors.forename: Bosai
authors.initials: B
authors.lastname: Lyu
authors.affiliation: Institute of Super-microstructure and Ultrafast Process in Advanced Materials, School of Physics and Electronics, Central South University, 932 South Lushan Road, Changsha, Hunan 410083, P. R. China.
authors.forename: Yingbao
authors.initials: Y
authors.lastname: Huang
authors.affiliation: Institute of Super-microstructure and Ultrafast Process in Advanced Materials, School of Physics and Electronics, Central South University, 932 South Lushan Road, Changsha, Hunan 410083, P. R. China.
authors.forename: Shubo
authors.initials: S
authors.lastname: Cheng
authors.affiliation: Institute of Super-microstructure and Ultrafast Process in Advanced Materials, School of Physics and Electronics, Central South University, 932 South Lushan Road, Changsha, Hunan 410083, P. R. China.
authors.forename: Han
authors.initials: H
authors.lastname: Huang
authors.affiliation: Institute of Super-microstructure and Ultrafast Process in Advanced Materials, School of Physics and Electronics, Central South University, 932 South Lushan Road, Changsha, Hunan 410083, P. R. China.
authors.forename: Jun
authors.initials: J
authors.lastname: He
authors.affiliation: Institute of Super-microstructure and Ultrafast Process in Advanced Materials, School of Physics and Electronics, Central South University, 932 South Lushan Road, Changsha, Hunan 410083, P. R. China.|Department of Physics and Astronomy, University of Rochester, Rochester, New York 14627, United States.
authors.forename: Yongli
authors.initials: Y
authors.lastname: Gao