title: Transmission electron microscopy of bulk specimens over 10µm in thickness.
abstract: We succeeded the observation of microstructures in bulk-sized specimens of over 10µm in thickness by employing a technique that combines transmission electron microscopy (TEM) with energy-filtered imaging based on electron energy-loss spectroscopy (EELS). This method is unique in that it incorporates the inelastically scattered electrons into the imaging process. Using this technique, bright and sharp images of dislocations in crystalline silicon specimens as thick as 10µm were obtained. A calibration curve to determine foil thickness of such a thick specimen was also derived. This method simply extends the observable thickness range in TEM. If combined with tilt series of observation over a significant range of angle, it will disclose three dimensional nanostructures in a µm-order block of a specimen, promoting our understanding of the controlling mechanisms behind various bulky material properties.
authors.affiliation: Department of Mechanical Engineering, Kagoshima University, Korimoto, Kagoshima 890-0065, Japan. Electronic address: sadamatsu@mech.kagoshima-u.ac.jp.
authors.forename: Sunao
authors.initials: S
authors.lastname: Sadamatsu
authors.affiliation: Department of Materials Science and Engineering, Kyushu University, Nishi-ku, Fukuoka 819-0395, Japan.
authors.forename: Masaki
authors.initials: M
authors.lastname: Tanaka
authors.affiliation: Department of Materials Science and Engineering, Kyushu University, Nishi-ku, Fukuoka 819-0395, Japan.
authors.forename: Kenji
authors.initials: K
authors.lastname: Higashida
authors.affiliation: Department of Applied Quantum Physics and Nuclear Engineering, Kyushu University, Nishi-ku, Fukuoka 819-0395, Japan; Ultramicroscopy Research Center, Kyushu University, Nishi-ku, Fukuoka 819-0395, Japan.
authors.forename: Syo
authors.initials: S
authors.lastname: Matsumura
keywords: Bulk nanostructure; Chromatic aberration; Dislocation; Electron energy-loss spectroscopy; High-voltage electron microscopy