title: Correcting nonlinear drift distortion of scanning probe and scanning transmission electron microscopies from image pairs with orthogonal scan directions.
abstract: Unwanted motion of the probe with respect to the sample is a ubiquitous problem in scanning probe and scanning transmission electron microscopies, causing both linear and nonlinear artifacts in experimental images. We have designed a procedure to correct these artifacts by using orthogonal scan pairs to align each measurement line-by-line along the slow scan direction, by fitting contrast variation along the lines. We demonstrate the accuracy of our algorithm on both synthetic and experimental data and provide an implementation of our method.
authors.affiliation: National Center for Electron Microscopy, Molecular Foundry, Lawrence Berkeley National Laboratory, Berkeley, CA, United States.
authors.forename: Colin
authors.initials: C
authors.lastname: Ophus
authors.affiliation: National Center for Electron Microscopy, Molecular Foundry, Lawrence Berkeley National Laboratory, Berkeley, CA, United States.
authors.forename: Jim
authors.initials: J
authors.lastname: Ciston
authors.affiliation: Materials Science and Engineering, University of California Berkeley, Berkeley, CA, United States.
authors.forename: Chris T
authors.initials: CT
authors.lastname: Nelson
keywords: Atomic resolution; Drift correction; Image processing; Scanning probe microscopy; Scanning transmission electron microscopy