title: New Approaches for Correction of Interlayer Absorption Effects in X-ray Fluorescence Imaging of Paintings.
abstract: The X-ray fluorescence imaging technique allows not only the imaging itself but also the identification of the hidden paint layers what makes it much more versatile as compared with X-ray radiography. One of the main disadvantages of the former method is the fact that the characteristic X-rays from the deeper paint layers are absorbed in the covering layers. This effect is manifested by some artifacts that impede a proper interpretation of the acquired images. In this work, it is shown that the methodology for correction of the interlayer absorption effects can be extended to the case of polychromatic excitation. Additionally, a new approach for determination of the optimal correction parameters has also been presented. The methodology was verified using either the test painting or the mock-up painting both measured with a table-top micro-XRF setup.
authors.affiliation: AGH University of Science and Technology , Faculty of Physics and Applied Computer Science, al. A. Mickiewicza 30, 30-059 Krakow, Poland.
authors.forename: Paweł M
authors.initials: PM
authors.lastname: Wróbel
authors.affiliation: The Laboratory of Analysis and Nondestructive Investigation of Heritage Objects, The National Museum in Krakow , ul. J. Piłsudskiego 14, 31-109 Krakow, Poland.
authors.forename: Piotr
authors.initials: P
authors.lastname: Frączek
authors.affiliation: AGH University of Science and Technology , Faculty of Physics and Applied Computer Science, al. A. Mickiewicza 30, 30-059 Krakow, Poland.
authors.forename: Marek
authors.initials: M
authors.lastname: Lankosz