title: Improved velocimetry in optical coherence tomography using Bayesian analysis.
abstract: OCT is a popular cross-sectional microscale imaging modality in medicine and biology. While structural imaging using OCT is a mature technology in many respects, flow and motion estimation using OCT remains an intense area of research. In particular, there is keen interest in maximizing information extraction from the complex-valued OCT signal. Here, we introduce a Bayesian framework into the data workflow in OCT-based velocimetry. We demonstrate that using prior information in this Bayesian framework can significantly improve velocity estimate precision in a correlation-based, model-based framework for Doppler and transverse velocimetry. We show results in calibrated flow phantoms as well as in vivo in a Drosophila melanogaster (fruit fly) heart. Thus, our work improves upon the current approaches in terms of improved information extraction from the complex-valued OCT signal.
authors.affiliation: Department of Biomedical Engineering, Yale University, 55 Prospect St., New Haven, Connecticut 06520, USA.
authors.forename: Kevin C
authors.initials: KC
authors.lastname: Zhou
authors.affiliation: Department of Biomedical Engineering, Yale University, 55 Prospect St., New Haven, Connecticut 06520, USA.
authors.forename: Brendan K
authors.initials: BK
authors.lastname: Huang
authors.affiliation: Department of Biomedical Engineering, Yale University, 55 Prospect St., New Haven, Connecticut 06520, USA ; Department of Diagnostic Radiology, Yale University, 333 Cedar St., New Haven, Connecticut 06510, USA ; Department of Electrical Engineering, Yale University, 10 Hillhouse Ave., New Haven, Connecticut 06520, USA.
authors.forename: Hemant
authors.initials: H
authors.lastname: Tagare
authors.affiliation: Department of Biomedical Engineering, Yale University, 55 Prospect St., New Haven, Connecticut 06520, USA ; Department of Diagnostic Radiology, Yale University, 333 Cedar St., New Haven, Connecticut 06510, USA ; Department of Pediatrics, Yale University, 333 Cedar St., New Haven, Connecticut 06510, USA ; Department of Applied Physics, Yale University, P.O. Box 208267, New Haven, Connecticut 06520, USA.
authors.forename: Michael A
authors.initials: MA
authors.lastname: Choma
keywords: (000.5490) Probability theory, stochastic processes, and statistics; (030.6140) Speckle; (110.4153) Motion estimation and optical flow; (110.4500) Optical coherence tomography; (170.3880) Medical and biological imaging; (290.5820) Scattering measurements