title: Radiation hardness assessment of the charge-integrating hybrid pixel detector JUNGFRAU 1.0 for photon science.
abstract: JUNGFRAU (adJUstiNg Gain detector FoR the Aramis User station) is a two-dimensional hybrid pixel detector for photon science applications in free electron lasers, particularly SwissFEL, and synchrotron light sources. JUNGFRAU is an automatic gain switching, charge-integrating detector which covers a dynamic range of more than 10(4) photons of an energy of 12 keV with a good linearity, uniformity of response, and spatial resolving power. The JUNGFRAU 1.0 application-specific integrated circuit (ASIC) features a 256 × 256 pixel matrix of 75 × 75 μm(2) pixels and is bump-bonded to a 320 μm thick Si sensor. Modules of 2 × 4 chips cover an area of about 4 × 8 cm(2). Readout rates in excess of 2 kHz enable linear count rate capabilities of 20 MHz (at 12 keV) and 50 MHz (at 5 keV). The tolerance of JUNGFRAU to radiation is a key issue to guarantee several years of operation at free electron lasers and synchrotrons. The radiation hardness of JUNGFRAU 1.0 is tested with synchrotron radiation up to 10 MGy of delivered dose. The effect of radiation-induced changes on the noise, baseline, gain, and gain switching is evaluated post-irradiation for both the ASIC and the hybridized assembly. The bare JUNGFRAU 1.0 chip can withstand doses as high as 10 MGy with minor changes to its noise and a reduction in the preamplifier gain. The hybridized assembly, in particular the sensor, is affected by the photon irradiation which mainly shows as an increase in the leakage current. Self-healing of the system is investigated during a period of 11 weeks after the delivery of the radiation dose. Annealing radiation-induced changes by bake-out at 100 °C is investigated. It is concluded that the JUNGFRAU 1.0 pixel is sufficiently radiation-hard for its envisioned applications at SwissFEL and synchrotron beam lines.
authors.affiliation: Paul Scherrer Institute, 5232 Villigen PSI, Switzerland.
authors.forename: J H
authors.initials: JH
authors.lastname: Jungmann-Smith
authors.affiliation: Paul Scherrer Institute, 5232 Villigen PSI, Switzerland.
authors.forename: A
authors.initials: A
authors.lastname: Bergamaschi
authors.affiliation: Paul Scherrer Institute, 5232 Villigen PSI, Switzerland.
authors.forename: M
authors.initials: M
authors.lastname: Brückner
authors.affiliation: Paul Scherrer Institute, 5232 Villigen PSI, Switzerland.
authors.forename: S
authors.initials: S
authors.lastname: Cartier
authors.affiliation: Paul Scherrer Institute, 5232 Villigen PSI, Switzerland.
authors.forename: R
authors.initials: R
authors.lastname: Dinapoli
authors.affiliation: Paul Scherrer Institute, 5232 Villigen PSI, Switzerland.
authors.forename: D
authors.initials: D
authors.lastname: Greiffenberg
authors.affiliation: Paul Scherrer Institute, 5232 Villigen PSI, Switzerland.
authors.forename: A
authors.initials: A
authors.lastname: Jaggi
authors.affiliation: Paul Scherrer Institute, 5232 Villigen PSI, Switzerland.
authors.forename: D
authors.initials: D
authors.lastname: Maliakal
authors.affiliation: Paul Scherrer Institute, 5232 Villigen PSI, Switzerland.
authors.forename: D
authors.initials: D
authors.lastname: Mayilyan
authors.affiliation: Synchrotron Soleil, L'Orme des Merisiers, Saint-Aubin-BP 48, 91192 GIF-sur-Yvette Cedex, France.
authors.forename: K
authors.initials: K
authors.lastname: Medjoubi
authors.affiliation: Paul Scherrer Institute, 5232 Villigen PSI, Switzerland.
authors.forename: D
authors.initials: D
authors.lastname: Mezza
authors.affiliation: Paul Scherrer Institute, 5232 Villigen PSI, Switzerland.
authors.forename: A
authors.initials: A
authors.lastname: Mozzanica
authors.affiliation: Paul Scherrer Institute, 5232 Villigen PSI, Switzerland.
authors.forename: M
authors.initials: M
authors.lastname: Ramilli
authors.affiliation: Paul Scherrer Institute, 5232 Villigen PSI, Switzerland.
authors.forename: Ch
authors.initials: Ch
authors.lastname: Ruder
authors.affiliation: Paul Scherrer Institute, 5232 Villigen PSI, Switzerland.
authors.forename: L
authors.initials: L
authors.lastname: Schädler
authors.affiliation: Paul Scherrer Institute, 5232 Villigen PSI, Switzerland.
authors.forename: B
authors.initials: B
authors.lastname: Schmitt
authors.affiliation: Paul Scherrer Institute, 5232 Villigen PSI, Switzerland.
authors.forename: X
authors.initials: X
authors.lastname: Shi
authors.affiliation: Paul Scherrer Institute, 5232 Villigen PSI, Switzerland.
authors.forename: G
authors.initials: G
authors.lastname: Tinti
mesh_terms: D016477:Artifacts; D004581:Electronics / Q000295:instrumentation*; D004867:Equipment Design; D004868:Equipment Failure; D019544:Equipment Failure Analysis; D010783:Photometry / Q000295:instrumentation*; D017785:Photons; D011874:Radiometry / Q000295:instrumentation*; D015203:Reproducibility of Results; D012666:Semiconductors; D012680:Sensitivity and Specificity; D059629:Signal-To-Noise Ratio; D055672:Static Electricity