title: Robust high-resolution imaging and quantitative force measurement with tuned-oscillator atomic force microscopy.
abstract: Atomic force microscopy (AFM) and spectroscopy are based on locally detecting the interactions between a surface and a sharp probe tip. For highest resolution imaging, noncontact modes that avoid tip-sample contact are used; control of the tip's vertical position is accomplished by oscillating the tip and detecting perturbations induced by its interaction with the surface potential. Due to this potential's nonlinear nature, however, achieving reliable control of the tip-sample distance is challenging, so much so that despite its power vacuum-based noncontact AFM has remained a niche technique. Here we introduce a new pathway to distance control that prevents instabilities by externally tuning the oscillator's response characteristics. A major advantage of this operational scheme is that it delivers robust position control in both the attractive and repulsive regimes with only one feedback loop, thereby providing an easy-to-implement route to atomic resolution imaging and quantitative tip-sample interaction force measurement.
authors.affiliation: Department of Mechanical Engineering and Materials Science, Yale University, New Haven, CT 06520, USA. Center for Research on Interface Structures and Phenomena (CRISP), Yale University, New Haven, CT 06520, USA.
authors.forename: Omur E
authors.initials: OE
authors.lastname: Dagdeviren
authors.forename: Jan
authors.initials: J
authors.lastname: Götzen
authors.forename: Hendrik
authors.initials: H
authors.lastname: Hölscher
authors.forename: Eric I
authors.initials: EI
authors.lastname: Altman
authors.forename: Udo D
authors.initials: UD
authors.lastname: Schwarz