title: Impact of Interfacial Microstructure on Charge Carrier Transport in Solution-Processed Conjugated Polymer Field-Effect Transistors.
abstract: The surface roughness of a dielectric is precisely tuned, allowing a fine control solely over the interfacial microstructure in a semicrystalline semiconductor polymer film without affecting the morphology in the upper layers. The interfacial microstructure is found to have only a minor impact on the transport originating from bypassing of interfacial defects by the charge carriers.
authors.affiliation: Max Planck Institute for Polymer Research, Ackermannweg 10, 55128, Mainz, Germany.
authors.forename: Mengmeng
authors.initials: M
authors.lastname: Li
authors.affiliation: Max Planck Institute for Polymer Research, Ackermannweg 10, 55128, Mainz, Germany.
authors.forename: Cunbin
authors.initials: C
authors.lastname: An
authors.affiliation: Max Planck Institute for Polymer Research, Ackermannweg 10, 55128, Mainz, Germany.
authors.forename: Tomasz
authors.initials: T
authors.lastname: Marszalek
authors.affiliation: Max Planck Institute for Polymer Research, Ackermannweg 10, 55128, Mainz, Germany.
authors.forename: Martin
authors.initials: M
authors.lastname: Baumgarten
authors.affiliation: Max Planck Institute for Polymer Research, Ackermannweg 10, 55128, Mainz, Germany.
authors.forename: Klaus
authors.initials: K
authors.lastname: Müllen
authors.affiliation: Max Planck Institute for Polymer Research, Ackermannweg 10, 55128, Mainz, Germany.|Department of Molecular Physics, Faculty of Chemistry, Lodz University of Technology, Zeromskiego 116, 90-924, Lodz, Poland.
authors.forename: Wojciech
authors.initials: W
authors.lastname: Pisula
keywords: interfaces; microstructures; organic field-effect transistors; solution processing; transistors