title: On the scaling of multicrystal data sets collected at high-intensity X-ray and electron sources.
abstract: The need for data-scaling has become increasingly evident as time-resolved pump-probe photocrystallography is rapidly developing at high intensity X-ray sources. Several aspects of the scaling of data sets collected at synchrotrons, XFELs (X-ray Free Electron Lasers) and high-intensity pulsed electron sources are discussed. They include laser-ON/laser-OFF data scaling, inter- and intra-data set scaling.
authors.affiliation: Chemistry Department, University at Buffalo, State University of New York , Buffalo, New York 14260-3000, USA.
authors.forename: Philip
authors.initials: P
authors.lastname: Coppens
authors.affiliation: Chemistry Department, University at Buffalo, State University of New York , Buffalo, New York 14260-3000, USA.
authors.forename: Bertrand
authors.initials: B
authors.lastname: Fournier