title: Steady-state photoluminescent excitation characterization of semiconductor carrier recombination.
abstract: Photoluminescence excitation spectroscopy is a contactless characterization technique that can provide valuable information about the surface and bulk recombination parameters of a semiconductor device, distinct from other sorts of photoluminescent measurements. For this technique, a temperature-tuned light emitting diode (LED) has several advantages over other light sources. The large radiation density offered by LEDs from near-infrared to ultraviolet region at a low cost enables efficient and fast photoluminescence measurements. A simple and inexpensive LED-based setup facilitates measurement of surface recombination velocity and bulk Shockley-Read-Hall lifetime, which are key parameters to assess device performance. Under the right conditions, this technique can also provide a contactless way to measure the external quantum efficiency of a solar cell.
authors.affiliation: Intel Corporation, Hillsboro, Oregon 97124, USA.
authors.forename: J S
authors.initials: JS
authors.lastname: Bhosale
authors.affiliation: Department of Electrical and Computer Engineering, Purdue University, West Lafayette, Indiana 47907, USA.
authors.forename: J E
authors.initials: JE
authors.lastname: Moore
authors.affiliation: Department of Electrical and Computer Engineering, Purdue University, West Lafayette, Indiana 47907, USA.
authors.forename: X
authors.initials: X
authors.lastname: Wang
authors.affiliation: Department of Electrical and Computer Engineering, Purdue University, West Lafayette, Indiana 47907, USA.
authors.forename: P
authors.initials: P
authors.lastname: Bermel
authors.affiliation: Department of Electrical and Computer Engineering, Purdue University, West Lafayette, Indiana 47907, USA.
authors.forename: M S
authors.initials: MS
authors.lastname: Lundstrom