title: Comparison of online and offline tests in LED accelerated reliability tests under temperature stress.
abstract: Accelerated aging tests are the main method used in the evaluation of LED reliability, and can be performed in either online or offline modes. The goal of this study is to provide the difference between the two test modes. In the experiments, the sample is attached to different heat sinks to acquire the optical parameters under different junction temperatures of LEDs. By measuring the junction temperature in the aging process (Tj1), and the junction temperature in the testing process (Tj2), we achieve consistency with an online test of Tj1 and Tj2 and a difference with an offline test of Tj1 and Tj2. Experimental results show that the degradation rate of the luminous flux rises as Tj2 increases, which yields a difference of projected life L(70%) of 8% to 13%. For color shifts over 5000 h of aging, the online test shows a larger variation of the distance from the Planckian locus, about 40% to 50% more than the normal test at an ambient temperature of 25°C.
authors.forename: Hong-Liang
authors.initials: HL
authors.lastname: Ke
authors.forename: Lei
authors.initials: L
authors.lastname: Jing
authors.forename: Qun
authors.initials: Q
authors.lastname: Gao
authors.forename: Yao
authors.initials: Y
authors.lastname: Wang
authors.forename: Jian
authors.initials: J
authors.lastname: Hao
authors.forename: Qiang
authors.initials: Q
authors.lastname: Sun
authors.forename: Zhi-Jun
authors.initials: ZJ
authors.lastname: Xu