title: Adjustable hollow-cone output x-ray beam from an ellipsoidal monocapillary with a pinhole and a beam stop.
abstract: A combined shading system (CSS) consisting of a beam stop and a pinhole is proposed to be used between an ellipsoidal monocapillary (EM) and a conventional laboratory x-ray source to obtain an adjustable hollow-cone output beam for different experiments with no need for changing the EM. The CSS can change the incident x-ray beam on the EM by adjusting the position of the beam stop and the pinhole, with the corresponding change of the output beam of the EM. In this study, the adjustable hollow-cone output x-ray beam of an 80-mm-long EM with a CSS was studied in detail with a laboratory Cu x-ray generator with a focal spot diameter of 50 μm. The adjustable range of the focal spot size of the EM was from 8.6 to 58.7 μm. The adjustable range of the gain of the focal spot of the EM was from 0 to 1350. The beam divergence of the hollow-cone output beam of the EM ranged from 6 to 16.75 mrad. The illumination angle of the hollow-cone output beam of the EM ranged from 0 to 5.95 mrad. In addition, the potential application of the proposed adjusting method in testing the performance of the EM is briefly discussed.
authors.forename: Xue-Peng
authors.initials: XP
authors.lastname: Sun
authors.forename: Zhi-Gou
authors.initials: ZG
authors.lastname: Liu
authors.forename: Long-Tao
authors.initials: LT
authors.lastname: Yi
authors.forename: Wei-Yun
authors.initials: WY
authors.lastname: Sun
authors.forename: Fang-Zou
authors.initials: FZ
authors.lastname: Li
authors.forename: Bo-Wen
authors.initials: BW
authors.lastname: Jiang
authors.forename: Yong-Zhong
authors.initials: YZ
authors.lastname: Ma
authors.forename: Tian-Xi
authors.initials: TX
authors.lastname: Sun
mesh_terms: D018360:Crystallography, X-Ray / Q000295:instrumentation; D004577:Electron Probe Microanalysis / Q000295:instrumentation; D018613:Microscopy, Confocal / Q000295:instrumentation; D055096:Optical Devices; D055620:Optical Phenomena; D053838:Scattering, Small Angle; D013052:Spectrometry, X-Ray Emission / Q000295:instrumentation; D014961:X-Ray Diffraction / Q000295:instrumentation; D014965:X-Rays