title: Strongly enhanced ultraviolet emission of an Au@SiO2/ZnO plasmonic hybrid nanostructure.
abstract: We present the surface plasmon polariton (SPP)-enhanced ultraviolet (UV) emission of an Au@SiO2/ZnO hybrid nanostructure. We achieved approximately 20- and 8-fold enhancements of the UV-emitting intensities from Au-SPP coupled nanometre- and micrometre-scaled ZnO wires through an optimized 5 nm-thick SiO2 spacer compared to that obtained from bare ZnO on a Si substrate without SPP coupling. Cathodoluminescence measurements and simulations demonstrated that the plasmonic hybrid nanostructure enables the strong localization of the SPP field, resulting in significantly enhanced UV emission. This plasmonic structure paves the way to nanoscale UV-optical lasers and sensors.
authors.affiliation: Institute of Microstructure and Property of Advanced Materials, Beijing University of Technology, Beijing, 100124, P.R. China. jiyuan@bjut.edu.cn xdhan@bjut.edu.cn and Beijing Key Lab of Microstructure and Property of Advanced Material, Beijing University of Technology, Beijing, 100124, P.R. China.
authors.forename: Li
authors.initials: L
authors.lastname: Wang
authors.affiliation: Institute of Microstructure and Property of Advanced Materials, Beijing University of Technology, Beijing, 100124, P.R. China. jiyuan@bjut.edu.cn xdhan@bjut.edu.cn and Beijing Key Lab of Microstructure and Property of Advanced Material, Beijing University of Technology, Beijing, 100124, P.R. China.
authors.forename: Xiaodong
authors.initials: X
authors.lastname: Wang
authors.affiliation: Institute of Microstructure and Property of Advanced Materials, Beijing University of Technology, Beijing, 100124, P.R. China. jiyuan@bjut.edu.cn xdhan@bjut.edu.cn and Beijing Key Lab of Microstructure and Property of Advanced Material, Beijing University of Technology, Beijing, 100124, P.R. China.
authors.forename: Shengcheng
authors.initials: S
authors.lastname: Mao
authors.affiliation: College of Electronic Information & Control Engineering, Beijing University of Technology, Beijing, 100124, P.R. China.
authors.forename: Hua
authors.initials: H
authors.lastname: Wu
authors.affiliation: College of Electronic Information & Control Engineering, Beijing University of Technology, Beijing, 100124, P.R. China.
authors.forename: Xia
authors.initials: X
authors.lastname: Guo
authors.affiliation: Institute of Microstructure and Property of Advanced Materials, Beijing University of Technology, Beijing, 100124, P.R. China. jiyuan@bjut.edu.cn xdhan@bjut.edu.cn and Beijing Key Lab of Microstructure and Property of Advanced Material, Beijing University of Technology, Beijing, 100124, P.R. China.
authors.forename: Yuan
authors.initials: Y
authors.lastname: Ji
authors.affiliation: Institute of Microstructure and Property of Advanced Materials, Beijing University of Technology, Beijing, 100124, P.R. China. jiyuan@bjut.edu.cn xdhan@bjut.edu.cn and Beijing Key Lab of Microstructure and Property of Advanced Material, Beijing University of Technology, Beijing, 100124, P.R. China.
authors.forename: Xiaodong
authors.initials: X
authors.lastname: Han