title: Gene expression profiling data of Schizosaccharomyces pombe under nitrosative stress using differential display.
abstract: Excess production of nitric oxide (NO) and reactive nitrogen intermediates (RNIs) causes nitrosative stress on cells. Schizosaccharomyces pombe was used as a model to study nitrosative stress response. In the present data article, we have used differential display to identify the differentially expressed genes in the fission yeast under nitrosative stress conditions. We have used pure NO donor compound detaNONOate at final concentrations of 0.1 mM and 1 mM to treat the cells for 15 min alongside control before studying their gene expression profiles. At both the treated conditions, we identified genes which were commonly repressed while several genes were induced upon both 0.1 mM and 1 mM treatments. The differentially expressed genes were further analyzed in DAVID and categorized into several different pathways.
authors: Department of Biochemistry, University of Calcutta, 35, Ballygunge Circular Road, Kolkata 700019, West Bengal, India.
authors: Pranjal
authors: P
authors: Biswas
authors: Department of Biochemistry, University of Calcutta, 35, Ballygunge Circular Road, Kolkata 700019, West Bengal, India.
authors: Uddalak
authors: U
authors: Majumdar
authors: Department of Biochemistry, University of Calcutta, 35, Ballygunge Circular Road, Kolkata 700019, West Bengal, India.
authors: Sanjay
authors: S
authors: Ghosh
keywords: DAVID, Database for annotation, visualization and integrated discovery; Differential display analysis; GO, Gene ontology; KEGG, Kyoto encyclopedia of genes and genomes; NO, Nitric oxide; Nitric oxide; Nitrosative stress; RNIs, Reactive nitrogen intermediates; Schizosaccharomyces pombe