title: Highlighting material structure with transmission electron diffraction correlation coefficient maps.
abstract: Correlation coefficient maps are constructed by computing the differences between neighboring diffraction patterns collected in a transmission electron microscope in scanning mode. The maps are shown to highlight material structural features like grain boundaries, second phase particles or dislocations. The inclination of the inner crystal interfaces are directly deduced from the resulting contrast.
authors: Hungarian Academy of Sciences, Research Center for Energy Research, Institute for Technical Physics and Materials Science (MTA EK MFA), Konkoly Thege M. út 29-33, H-1121 Budapest, Hungary; Doctoral School of Molecular- and Nanotechnologies, Faculty of Information Technology, University of Pannonia, Egyetem u. 10., H-8200 Veszprém, Hungary.
authors: Ákos K
authors: ÁK
authors: Kiss
authors: Laboratoire SIMaP, Grenoble INP - CNRS - UJF, Saint Martin D'Hères Cedex 38402, France; CNRS, SIMAP, F-38000 Grenoble, France. Electronic address: edgar.rauch@simap.grenoble-inp.fr.
authors: Edgar F
authors: EF
authors: Rauch
authors: Hungarian Academy of Sciences, Research Center for Energy Research, Institute for Technical Physics and Materials Science (MTA EK MFA), Konkoly Thege M. út 29-33, H-1121 Budapest, Hungary.
authors: János L
authors: JL
authors: Lábár
keywords: Automated crystal orientation mapping (ACOM); Correlation coefficient map; Electron diffraction; Transmission electron microscopy (TEM)