title: Probing of multiple magnetic responses in magnetic inductors using atomic force microscopy.
abstract: Even though nanoscale analysis of magnetic properties is of significant interest, probing methods are relatively less developed compared to the significance of the technique, which has multiple potential applications. Here, we demonstrate an approach for probing various magnetic properties associated with eddy current, coil current and magnetic domains in magnetic inductors using multidimensional magnetic force microscopy (MMFM). The MMFM images provide combined magnetic responses from the three different origins, however, each contribution to the MMFM response can be differentiated through analysis based on the bias dependence of the response. In particular, the bias dependent MMFM images show locally different eddy current behavior with values dependent on the type of materials that comprise the MI. This approach for probing magnetic responses can be further extended to the analysis of local physical features.
authors: School of Advanced Materials Science and Engineering, Sungkyunkwan University (SKKU), Suwon 440-746, Republic of Korea.
authors: Seongjae
authors: S
authors: Park
authors: School of Advanced Materials Science and Engineering, Sungkyunkwan University (SKKU), Suwon 440-746, Republic of Korea.
authors: Hosung
authors: H
authors: Seo
authors: School of Advanced Materials Science and Engineering, Sungkyunkwan University (SKKU), Suwon 440-746, Republic of Korea.
authors: Daehee
authors: D
authors: Seol
authors: Fundamental Technology Group, Central R&D Institute, Samsung Electro-Mechanics Co., Suwon 443-743, Republic of Korea.
authors: Young-Hwan
authors: YH
authors: Yoon
authors: Fundamental Technology Group, Central R&D Institute, Samsung Electro-Mechanics Co., Suwon 443-743, Republic of Korea.
authors: Mi Yang
authors: MY
authors: Kim
authors: School of Advanced Materials Science and Engineering, Sungkyunkwan University (SKKU), Suwon 440-746, Republic of Korea.
authors: Yunseok
authors: Y
authors: Kim