title: Shot-to-shot diagnostic of the longitudinal photon source position at the SPring-8 Angstrom Compact Free Electron Laser by means of x-ray grating interferometry.
abstract: We present single-shot measurements of the longitudinal photon source position of the SPring-8 Angstrom Compact Free Electron Laser x-ray free electron laser by means of x-ray grating interferometry. The measurements were performed in order to study the behavior of the source under normal operation conditions and as a dependence on the active undulator length. The retrieved experimental results show that x-ray grating interferometry is a powerful in situ monitoring tool for investigating and tuning an x-ray free electron laser.
authors.forename: Yves
authors.initials: Y
authors.lastname: Kayser
authors.forename: Simon
authors.initials: S
authors.lastname: Rutishauser
authors.forename: Tetsuo
authors.initials: T
authors.lastname: Katayama
authors.forename: Takashi
authors.initials: T
authors.lastname: Kameshima
authors.forename: Haruhiko
authors.initials: H
authors.lastname: Ohashi
authors.forename: Uwe
authors.initials: U
authors.lastname: Flechsig
authors.forename: Makina
authors.initials: M
authors.lastname: Yabashi
authors.forename: Christian
authors.initials: C
authors.lastname: David