title: In-line three-dimensional holography of nanocrystalline objects at atomic resolution.
abstract: Resolution and sensitivity of the latest generation aberration-corrected transmission electron microscopes allow the vast majority of single atoms to be imaged with sub-Ångstrom resolution and their locations determined in an image plane with a precision that exceeds the 1.9-pm wavelength of 300 kV electrons. Such unprecedented performance allows expansion of electron microscopic investigations with atomic resolution into the third dimension. Here we report a general tomographic method to recover the three-dimensional shape of a crystalline particle from high-resolution images of a single projection without the need for sample rotation. The method is compatible with low dose rate electron microscopy, which improves on signal quality, while minimizing electron beam-induced structure modifications even for small particles or surfaces. We apply it to germanium, gold and magnesium oxide particles, and achieve a depth resolution of 1-2 Å, which is smaller than inter-atomic distances.
authors.affiliation: Department of Engineering and System Science, National Tsing-Hua University, 101 Kuang-Fu Road, Hsin Chu 300, Taiwan.
authors.forename: F-R
authors.initials: FR
authors.lastname: Chen
authors.affiliation: EMAT, Department of Physics, University of Antwerp, 2020 Antwerpen, Belgium.
authors.forename: D
authors.initials: D
authors.lastname: Van Dyck
authors.affiliation: Lawrence Berkeley National Laboratory, The Molecular Foundry and Joint Center for Artificial Photosynthesis, One Cyclotron Road, Berkeley California 94720 USA.
authors.forename: C
authors.initials: C
authors.lastname: Kisielowski