title: Interfacial Atomic Structure of Twisted Few-Layer Graphene.
abstract: A twist in bi- or few-layer graphene breaks the local symmetry, introducing a number of intriguing physical properties such as opening new bandgaps. Therefore, determining the twisted atomic structure is critical to understanding and controlling the functional properties of graphene. Combining low-angle annular dark-field electron microscopy with image simulations, we directly determine the atomic structure of twisted few-layer graphene in terms of a moiré superstructure which is parameterized by a single twist angle and lattice constant. This method is shown to be a powerful tool for accurately determining the atomic structure of two-dimensional materials such as graphene, even in the presence of experimental errors. Using coincidence-site-lattice and displacement-shift-complete theories, we show that the in-plane translation state between layers is not a significant structure parameter, explaining why the present method is adequate not only for bilayer graphene but also a few-layered twisted graphene.
authors.affiliation: Institute of Engineering Innovation, University of Tokyo, Bunkyo, Tokyo 113-8656, Japan.
authors.forename: Ryo
authors.initials: R
authors.lastname: Ishikawa
authors.affiliation: Institute of Engineering Innovation, University of Tokyo, Bunkyo, Tokyo 113-8656, Japan.
authors.forename: Nathan R
authors.initials: NR
authors.lastname: Lugg
authors.affiliation: World Premier International Research Center, Advanced Institute for Materials Research, Tohoku University, Sendai, 980-8577, Japan.
authors.forename: Kazutoshi
authors.initials: K
authors.lastname: Inoue
authors.affiliation: Electron Optics Division, JEOL Ltd., Tokyo 196-8558, Japan.
authors.forename: Hidetaka
authors.initials: H
authors.lastname: Sawada
authors.affiliation: Advanced Key Technologies Division, National Institute for Materials Science, Tsukuba 305-0044, Japan.
authors.forename: Takashi
authors.initials: T
authors.lastname: Taniguchi
authors.affiliation: Institute of Engineering Innovation, University of Tokyo, Bunkyo, Tokyo 113-8656, Japan.
authors.forename: Naoya
authors.initials: N
authors.lastname: Shibata
authors.affiliation: Institute of Engineering Innovation, University of Tokyo, Bunkyo, Tokyo 113-8656, Japan.|World Premier International Research Center, Advanced Institute for Materials Research, Tohoku University, Sendai, 980-8577, Japan.
authors.forename: Yuichi
authors.initials: Y
authors.lastname: Ikuhara