title: Tailoring electromagnetically induced transparency with different coupling mechanisms.
abstract: Tailoring electromagnetically induced transparency with two different coupling mechanisms has been numerically demonstrated. The results show that EIT based on simultaneous electric resonance and magnetic resonance has relatively larger coupling distance compared with that based on electric resonance near field coupling to magnetic resonance. The relatively large coupling distance is due to the relatively small susceptibility change. For EIT based on simultaneous electric resonance and magnetic resonance, not only incident electric field but also the incident magnetic field pays a role on the susceptibility of system. The influence of the incident magnetic field leads to relatively smaller susceptibility change compared with that based on electric resonance near field coupling to magnetic resonance.
authors.affiliation: Key Laboratory of Radar Imaging and Microwave Photonics, Nanjing University of Aeronautics and Astronautics, Nanjing, 210016, China.
authors.forename: Hai-ming
authors.initials: HM
authors.lastname: Li
authors.affiliation: Key Laboratory of Radar Imaging and Microwave Photonics, Nanjing University of Aeronautics and Astronautics, Nanjing, 210016, China.
authors.forename: Shao-bin
authors.initials: SB
authors.lastname: Liu
authors.affiliation: Research Center of Applied Electromagnetics, Nanjing University of Information Science &Technology, Nanjing, 210044, China.
authors.forename: Shen-yun
authors.initials: SY
authors.lastname: Wang
authors.affiliation: Key Laboratory of Radar Imaging and Microwave Photonics, Nanjing University of Aeronautics and Astronautics, Nanjing, 210016, China.
authors.forename: Si-yuan
authors.initials: SY
authors.lastname: Liu
authors.affiliation: Key Laboratory of Radar Imaging and Microwave Photonics, Nanjing University of Aeronautics and Astronautics, Nanjing, 210016, China.
authors.forename: Yan
authors.initials: Y
authors.lastname: Hu
authors.affiliation: College of Materials and Chemical Engineering, Anhui Jianzhu University, Hefei 230022, China.
authors.forename: Hai-bin
authors.initials: HB
authors.lastname: Li