title: Statistical investigation of the length-dependent deviations in the electrical characteristics of molecular electronic junctions fabricated using the direct metal transfer method.
abstract: We fabricated and analyzed the electrical transport characteristics of vertical type alkanethiolate molecular junctions using the high-yield fabrication method that we previously reported. The electrical characteristics of the molecular electronic junctions were statistically collected and investigated in terms of current density and transport parameters based on the Simmons tunneling model, and we determined representative current-voltage characteristics of the molecular junctions. In particular, we examined the statistical variations in the length-dependent electrical characteristics, especially the Gaussian standard deviation σ of the current density histogram. From the results, we found that the magnitude of the σ value can be dependent on the individual molecular length due to specific microscopic structures in the molecular junctions. The probable origin of the molecular length-dependent deviation of the electrical characteristics is discussed.
authors.affiliation: Department of Physics and Astronomy, Institute of Applied Physics, Seoul National University, Seoul 08826, Korea.
authors.forename: Hyunhak
authors.initials: H
authors.lastname: Jeong
authors.forename: Dongku
authors.initials: D
authors.lastname: Kim
authors.forename: Hyukwoo
authors.initials: H
authors.lastname: Kwon
authors.forename: Wang-Taek
authors.initials: WT
authors.lastname: Hwang
authors.forename: Yeonsik
authors.initials: Y
authors.lastname: Jang
authors.forename: Misook
authors.initials: M
authors.lastname: Min
authors.forename: Kookrin
authors.initials: K
authors.lastname: Char
authors.forename: Dong
authors.initials: D
authors.lastname: Xiang
authors.forename: Heejun
authors.initials: H
authors.lastname: Jeong
authors.forename: Takhee
authors.initials: T
authors.lastname: Lee