title: Polarization Control via He-Ion Beam Induced Nanofabrication in Layered Ferroelectric Semiconductors.
abstract: Rapid advances in nanoscience rely on continuous improvements of material manipulation at near-atomic scales. Currently, the workhorse of nanofabrication is resist-based lithography and its various derivatives. However, the use of local electron, ion, and physical probe methods is expanding, driven largely by the need for fabrication without the multistep preparation processes that can result in contamination from resists and solvents. Furthermore, probe-based methods extend beyond nanofabrication to nanomanipulation and to imaging which are all vital for a rapid transition to the prototyping and testing of devices. In this work we study helium ion interactions with the surface of bulk copper indium thiophosphate CuM(III)P2X6 (M = Cr, In; X= S, Se), a novel layered 2D material, with a Helium Ion Microscope (HIM). Using this technique, we are able to control ferrielectric domains and grow conical nanostructures with enhanced conductivity whose material volumes scale with the beam dosage. Compared to the copper indium thiophosphate (CITP) from which they grow, the nanostructures are oxygen rich, sulfur poor, and with virtually unchanged copper concentration as confirmed by energy-dispersive X-ray spectroscopy (EDX). Scanning electron microscopy (SEM) imaging contrast as well as scanning microwave microscopy (SMM) measurements suggest enhanced conductivity in the formed particles, whereas atomic force microscopy (AFM) measurements indicate that the produced structures have lower dissipation and are softer as compared to the CITP.
authors.affiliation: The Institute for Functional Imaging of Materials and the Center for Nanophase Materials Sciences, ‡Center for Nanophase Materials Sciences, and ⊥Materials Sciences and Technology Division, Oak Ridge National Laboratory , Oak Ridge, Tennessee 37831, United States.|Department of Physics and Astronomy and ∥Department of Materials Science and Engineering, University of Tennessee , Knoxville, Tennessee 37996, United States.
authors.forename: Alex
authors.initials: A
authors.lastname: Belianinov
authors.affiliation: The Institute for Functional Imaging of Materials and the Center for Nanophase Materials Sciences, ‡Center for Nanophase Materials Sciences, and ⊥Materials Sciences and Technology Division, Oak Ridge National Laboratory , Oak Ridge, Tennessee 37831, United States.|Department of Physics and Astronomy and ∥Department of Materials Science and Engineering, University of Tennessee , Knoxville, Tennessee 37996, United States.
authors.forename: Vighter
authors.initials: V
authors.lastname: Iberi
authors.affiliation: The Institute for Functional Imaging of Materials and the Center for Nanophase Materials Sciences, ‡Center for Nanophase Materials Sciences, and ⊥Materials Sciences and Technology Division, Oak Ridge National Laboratory , Oak Ridge, Tennessee 37831, United States.|Department of Physics and Astronomy and ∥Department of Materials Science and Engineering, University of Tennessee , Knoxville, Tennessee 37996, United States.
authors.forename: Alexander
authors.initials: A
authors.lastname: Tselev
authors.affiliation: The Institute for Functional Imaging of Materials and the Center for Nanophase Materials Sciences, ‡Center for Nanophase Materials Sciences, and ⊥Materials Sciences and Technology Division, Oak Ridge National Laboratory , Oak Ridge, Tennessee 37831, United States.|Department of Physics and Astronomy and ∥Department of Materials Science and Engineering, University of Tennessee , Knoxville, Tennessee 37996, United States.
authors.forename: Michael A
authors.initials: MA
authors.lastname: Susner
authors.affiliation: The Institute for Functional Imaging of Materials and the Center for Nanophase Materials Sciences, ‡Center for Nanophase Materials Sciences, and ⊥Materials Sciences and Technology Division, Oak Ridge National Laboratory , Oak Ridge, Tennessee 37831, United States.|Department of Physics and Astronomy and ∥Department of Materials Science and Engineering, University of Tennessee , Knoxville, Tennessee 37996, United States.
authors.forename: Michael A
authors.initials: MA
authors.lastname: McGuire
authors.affiliation: The Institute for Functional Imaging of Materials and the Center for Nanophase Materials Sciences, ‡Center for Nanophase Materials Sciences, and ⊥Materials Sciences and Technology Division, Oak Ridge National Laboratory , Oak Ridge, Tennessee 37831, United States.|Department of Physics and Astronomy and ∥Department of Materials Science and Engineering, University of Tennessee , Knoxville, Tennessee 37996, United States.
authors.forename: David
authors.initials: D
authors.lastname: Joy
authors.affiliation: The Institute for Functional Imaging of Materials and the Center for Nanophase Materials Sciences, ‡Center for Nanophase Materials Sciences, and ⊥Materials Sciences and Technology Division, Oak Ridge National Laboratory , Oak Ridge, Tennessee 37831, United States.|Department of Physics and Astronomy and ∥Department of Materials Science and Engineering, University of Tennessee , Knoxville, Tennessee 37996, United States.
authors.forename: Stephen
authors.initials: S
authors.lastname: Jesse
authors.affiliation: The Institute for Functional Imaging of Materials and the Center for Nanophase Materials Sciences, ‡Center for Nanophase Materials Sciences, and ⊥Materials Sciences and Technology Division, Oak Ridge National Laboratory , Oak Ridge, Tennessee 37831, United States.|Department of Physics and Astronomy and ∥Department of Materials Science and Engineering, University of Tennessee , Knoxville, Tennessee 37996, United States.
authors.forename: Adam J
authors.initials: AJ
authors.lastname: Rondinone
authors.affiliation: The Institute for Functional Imaging of Materials and the Center for Nanophase Materials Sciences, ‡Center for Nanophase Materials Sciences, and ⊥Materials Sciences and Technology Division, Oak Ridge National Laboratory , Oak Ridge, Tennessee 37831, United States.|Department of Physics and Astronomy and ∥Department of Materials Science and Engineering, University of Tennessee , Knoxville, Tennessee 37996, United States.
authors.forename: Sergei V
authors.initials: SV
authors.lastname: Kalinin
authors.affiliation: The Institute for Functional Imaging of Materials and the Center for Nanophase Materials Sciences, ‡Center for Nanophase Materials Sciences, and ⊥Materials Sciences and Technology Division, Oak Ridge National Laboratory , Oak Ridge, Tennessee 37831, United States.|Department of Physics and Astronomy and ∥Department of Materials Science and Engineering, University of Tennessee , Knoxville, Tennessee 37996, United States.
authors.forename: Olga S
authors.initials: OS
authors.lastname: Ovchinnikova
keywords: 2D crystals; atomic force microscopy; ferroelectricity; helium ion microscopy; layered materials