title: Detailed Study of the Influence of InGaAs Matrix on the Strain Reduction in the InAs Dot-In-Well Structure.
abstract: InAs/InGaAs dot-in-well (DWELL) structures have been investigated with the systematically varied InGaAs thickness. Both the strained buffer layer (SBL) below the dot layer and the strain-reducing layer (SRL) above the dot layer were found to be responsible for the redshift in photoluminescence (PL) emission of the InAs/InGaAs DWELL structure. A linear followed by a saturation behavior of the emission redshift was observed as a function of the SBL and SRL thickness, respectively. The PL intensity is greatly enhanced by applying both of the SRL and SBL. Finite element analysis simulation and transmission electron microscopy (TEM) measurement were carried out to analyze the strain distribution in the InAs QD and the InGaAs SBL. The results clearly indicate the strain reduction in the QD induced by the SBL, which are likely the main cause for the emission redshift.
authors.affiliation: State Key Laboratory of Functional Materials for Informatics, Shanghai Institute of Microsystem and Information Technology, Chinese Academy of Sciences, Shanghai, 200050, China. xiamenwp@163.com.|School of Physics, University of Chinese Academy of Sciences, 19 Yuquan Road, Beijing, 100049, China. xiamenwp@163.com.
authors.forename: Peng
authors.initials: P
authors.lastname: Wang
authors.affiliation: State Key Laboratory of Functional Materials for Informatics, Shanghai Institute of Microsystem and Information Technology, Chinese Academy of Sciences, Shanghai, 200050, China. cqm@mail.sim.ac.cn.|School of Physics, University of Chinese Academy of Sciences, 19 Yuquan Road, Beijing, 100049, China. cqm@mail.sim.ac.cn.
authors.forename: Qimiao
authors.initials: Q
authors.lastname: Chen
authors.affiliation: State Key Laboratory of Functional Materials for Informatics, Shanghai Institute of Microsystem and Information Technology, Chinese Academy of Sciences, Shanghai, 200050, China. wuxiaoyanphy@mail.sim.ac.cn.|School of Physics, University of Chinese Academy of Sciences, 19 Yuquan Road, Beijing, 100049, China. wuxiaoyanphy@mail.sim.ac.cn.
authors.forename: Xiaoyan
authors.initials: X
authors.lastname: Wu
authors.affiliation: State Key Laboratory of Functional Materials for Informatics, Shanghai Institute of Microsystem and Information Technology, Chinese Academy of Sciences, Shanghai, 200050, China. ccf@mail.sim.ac.cn.
authors.forename: Chunfang
authors.initials: C
authors.lastname: Cao
authors.affiliation: State Key Laboratory of Functional Materials for Informatics, Shanghai Institute of Microsystem and Information Technology, Chinese Academy of Sciences, Shanghai, 200050, China. shumin@mail.sim.ac.cn.|Department of Microtechnology and Nanoscience, Chalmers University of Technology, 41296, Gothenburg, Sweden. shumin@mail.sim.ac.cn.
authors.forename: Shumin
authors.initials: S
authors.lastname: Wang
authors.affiliation: State Key Laboratory of Functional Materials for Informatics, Shanghai Institute of Microsystem and Information Technology, Chinese Academy of Sciences, Shanghai, 200050, China. qgong@mail.sim.ac.cn.
authors.forename: Qian
authors.initials: Q
authors.lastname: Gong
keywords: AFM; Dot-in-well; Finite element; InAs/InGaAs; InGaAs matrix; Photoluminescence; Quantum dots; TEM