title: A simplified version of the maximum information per time unit method in computerized adaptive testing.
abstract: In this article, we propose a simplified version of the maximum information per time unit method (MIT; Fan, Wang, Chang, & Douglas, Journal of Educational and Behavioral Statistics 37: 655-670, 2012), or MIT-S, for computerized adaptive testing. Unlike the original MIT method, the proposed MIT-S method does not require fitting a response time model to the individual-level response time data. It is also computationally efficient. The performance of the MIT-S method was compared against that of the maximum information (MI) method in terms of measurement precision, testing time saving, and item pool usage under various item response theory (IRT) models. The results indicated that when the underlying IRT model is the two- or three-parameter logistic model, the MIT-S method maintains measurement precision and saves testing time. It performs similarly to the MI method in exposure control; both result in highly skewed item exposure distributions, due to heavy reliance on the highly discriminating items. If the underlying model is the one-parameter logistic (1PL) model, the MIT-S method maintains the measurement precision and saves a considerable amount of testing time. However, its heavy reliance on time-saving items leads to a highly skewed item exposure distribution. This weakness can be ameliorated by using randomesque exposure control, which successfully balances the item pool usage. Overall, the MIT-S method with randomesque exposure control is recommended for achieving better testing efficiency while maintaining measurement precision and balanced item pool usage when the underlying IRT model is 1PL.
authors.affiliation: Department of Psychology, University of Notre Dame, 118 Haggar Hall, Notre Dame, IN, 46556, USA. ycheng4@nd.edu.
authors.forename: Ying
authors.initials: Y
authors.lastname: Cheng
authors.affiliation: Pacific Metrics Corporation, Monterey, CA, USA.
authors.forename: Qi
authors.initials: Q
authors.lastname: Diao
authors.affiliation: Department of Psychology, University of Notre Dame, 118 Haggar Hall, Notre Dame, IN, 46556, USA.|Advanced Computing and Data Science Lab, Pearson, South Bend, IN, USA.
authors.forename: John T
authors.initials: JT
authors.lastname: Behrens
mesh_terms: D000073978:Academic Performance / Q000706:statistics & numerical data*; D003201:Computers; D006801:Humans; D008960:Models, Psychological; D011930:Reaction Time
keywords: Computerized adaptive testing; Item exposure control; Maximum information per time unit; Response time; Test efficiency