title: Simulation of ion beam injection and extraction in an EBIS.
abstract: An example simulation of Au+ charge breeding using FAR-TECH's integrated EBIS (electron beam ion source) modeling toolset is presented with the emphasis on ion beam injection and extraction. The trajectories of injected ions are calculated with PBGUNS (particle beam gun simulation) self-consistently by including the space charges from both ions and electrons. The ion beam, starting with initial conditions within the 100% acceptance of the electron beam, is then tracked by EBIS-PIC (particle-in-cell EBIS simulation code). In the trap, the evolution of the ion charge state distribution is estimated by charge state estimator. The extraction of charge bred ions is simulated with PBGUNS. The simulations of the ion injections show significant ion space charge effects on beam capture efficiency and the ionization efficiency.
authors.affiliation: FAR-TECH, Inc., San Diego, California 92121, USA.
authors.forename: L
authors.initials: L
authors.lastname: Zhao
authors.affiliation: FAR-TECH, Inc., San Diego, California 92121, USA.
authors.forename: J S
authors.initials: JS
authors.lastname: Kim