title: Ion beam production with sub-milligram samples of material from an ECR source for AMS.
abstract: Current accelerator mass spectrometry experiments at the Argonne Tandem Linac Accelerator System facility at Argonne National Laboratory push us to improve the ion source performance with a large number of samples and a need to minimize cross contamination. These experiments can require the creation of ion beams from as little as a few micrograms of material. These low concentration samples push the limit of our current efficiency and stability capabilities of the electron cyclotron resonance ion source. A combination of laser ablation and sputtering techniques coupled with a newly modified multi-sample changer has been used to meet this demand. We will discuss performance, stability, and consumption rates as well as planned improvements.
authors.affiliation: Argonne Tandem Linac Accelerator System (ATLAS), Argonne National Laboratory, Lemont, Illinois 60439, USA.
authors.forename: R
authors.initials: R
authors.lastname: Scott
authors.affiliation: Argonne Tandem Linac Accelerator System (ATLAS), Argonne National Laboratory, Lemont, Illinois 60439, USA.
authors.forename: W
authors.initials: W
authors.lastname: Bauder
authors.affiliation: Argonne Tandem Linac Accelerator System (ATLAS), Argonne National Laboratory, Lemont, Illinois 60439, USA.
authors.forename: T
authors.initials: T
authors.lastname: Palchan-Hazan
authors.affiliation: Argonne Tandem Linac Accelerator System (ATLAS), Argonne National Laboratory, Lemont, Illinois 60439, USA.
authors.forename: R
authors.initials: R
authors.lastname: Pardo
authors.affiliation: Argonne Tandem Linac Accelerator System (ATLAS), Argonne National Laboratory, Lemont, Illinois 60439, USA.
authors.forename: R
authors.initials: R
authors.lastname: Vondrasek