title: Analysis of small-angle X-ray scattering data in the presence of significant instrumental smearing.
abstract: A laboratory-scale small-angle X-ray scattering instrument with pinhole collimation has been used to assess smearing effects due to instrumental resolution. A new, numerically efficient method to smear ideal model intensities is developed and presented. It allows for directly using measured profiles of isotropic but otherwise arbitrary beams in smearing calculations. Samples of low-polydispersity polymer spheres have been used to show that scattering data can in this way be quantitatively modeled even when there is substantial distortion due to instrumental resolution.
authors.affiliation: Department of Chemistry and Molecular Biology, University of Gothenburg, SE-412 96 Göteborg, Sweden; Division of Physical Chemistry, Center of Chemistry and Chemical Engineering, Lund University, SE-221 00 Lund, Sweden.
authors.forename: Johan
authors.initials: J
authors.lastname: Bergenholtz
authors.affiliation: Department of Chemistry and Molecular Biology, University of Gothenburg, SE-412 96 Göteborg, Sweden.
authors.forename: Jeanette
authors.initials: J
authors.lastname: Ulama
authors.affiliation: Division of Physical Chemistry, Center of Chemistry and Chemical Engineering, Lund University, SE-221 00 Lund, Sweden.
authors.forename: Malin
authors.initials: M
authors.lastname: Zackrisson Oskolkova
keywords: instrumental smearing effects; pinhole collimation; small-angle X-ray scattering