title: Reconstruction of bremsstrahlung spectra from attenuation data using generalized simulated annealing.
abstract: A generalized simulated annealing algorithm, combined with a suitable smoothing regularization function is used to solve the inverse problem of X-ray spectrum reconstruction from attenuation data. The approach is to set the initial acceptance and visitation temperatures and to standardize the terms of objective function to automate the algorithm to accommodate different spectra ranges. Experiments with both numerical and measured attenuation data are presented. Results show that the algorithm reconstructs spectra shapes accurately. It should be noted that in this algorithm, the regularization function was formulated to guarantee a smooth spectrum, thus, the presented technique does not apply to X-ray spectrum where characteristic radiation are present.
authors.affiliation: Departamento de Física, Faculdade de Filosofia, Ciências e Letras de Ribeirão Preto, Universidade de São Paulo, Av. Bandeirantes 3900, 14040-901, Ribeirão Preto, SP, Brazil; Instituto Federal de Educação, Ciência e Tecnologia de São Paulo, Rua Américo Ambrósio 269, 14169-263, Sertãozinho, SP, Brazil.
authors.forename: O H
authors.initials: OH
authors.lastname: Menin
authors.affiliation: Departamento de Física, Faculdade de Filosofia, Ciências e Letras de Ribeirão Preto, Universidade de São Paulo, Av. Bandeirantes 3900, 14040-901, Ribeirão Preto, SP, Brazil; Instituto Nacional de Ciência e Tecnologia em Sistemas Complexos, Brazil.
authors.forename: A S
authors.initials: AS
authors.lastname: Martinez
authors.affiliation: Departamento de Física, Faculdade de Filosofia, Ciências e Letras de Ribeirão Preto, Universidade de São Paulo, Av. Bandeirantes 3900, 14040-901, Ribeirão Preto, SP, Brazil; Instituto Nacional de Ciência e Tecnologia em Metrologia das Radiações em Medicina, Brazil. Electronic address: amcosta@usp.br.
authors.forename: A M
authors.initials: AM
authors.lastname: Costa
keywords: Generalized functions; Inverse problem; Simulated annealing; X-ray spectrometry