title: Shape critical properties of patterned Permalloy thin films.
abstract: The effects of shape and edges in magnetic elements with reduced dimensions on the magnetization reversal of cross- and framed cross-shaped Ni79Fe21(30nm) films were studied. Remagnetization details in the stripes of the patterned structures, which had 3 μm to 30 μm widths and ~100 μm lengths, were visualized by the magneto-optical indicator film technique. The magneto-optic images revealed three different types of the domain structure formation and evolution in the samples during their magnetization reversal: (i) spin rotation with growth and annihilation of a cross-tie structure in the stripes perpendicular to the applied field, (ii) nucleation and fast motion of special boundaries, which consist of a number of coupled vortices located along both edges of the stripes parallel to the applied field, and (iii) nonuniform magnetization rotation with macrodomain nucleation and domain wall motion in the large unpatterned part of the films. It was experimentally revealed that there exists a dependence of the critical field for nucleation and motion of domain walls in the parallel-to-field stripes on their width and frame width. In particular, an inverse proportionality between this nucleation field and stripe width was found. Both experimental and simulation results show that, in cases (i) and (ii), the magnetostatic fields, which are formed on the edges of the stripes and at their intersections, play a crucial role in the formation of spin inhomogeneities and switching of the samples.
authors.affiliation: National Institute of Standards and Technology, Gaithersburg, MD, 20899, USA.
authors.forename: R D
authors.initials: RD
authors.lastname: Shull
authors.affiliation: Institute for Solid State Physics, RAS, Chernogolovka, Moscow distr., 14243,2 Russia.
authors.forename: Yu P
authors.initials: YP
authors.lastname: Kabanov
authors.affiliation: Institute for Solid State Physics, RAS, Chernogolovka, Moscow distr., 14243,2 Russia.
authors.forename: V S
authors.initials: VS
authors.lastname: Gornakov
authors.affiliation: National Institute of Standards and Technology, Gaithersburg, MD, 20899, USA.
authors.forename: P J
authors.initials: PJ
authors.lastname: Chen
authors.affiliation: National Institute of Standards and Technology, Gaithersburg, MD, 20899, USA; Institute for Solid State Physics, RAS, Chernogolovka, Moscow distr., 14243,2 Russia.
authors.forename: V I
authors.initials: VI
authors.lastname: Nikitenko
keywords: Domain structure; Magnetic microstructure; Magneto optical imaging; Patterned thin film; Spin vortex