title: The Optics and Alignment of the Divergent Beam Laboratory X-ray Powder Diffractometer and its Calibration Using NIST Standard Reference Materials.
abstract: The laboratory X-ray powder diffractometer is one of the primary analytical tools in materials science. It is applicable to nearly any crystalline material, and with advanced data analysis methods, it can provide a wealth of information concerning sample character. Data from these machines, however, are beset by a complex aberration function that can be addressed through calibration with the use of NIST Standard Reference Materials (SRMs). Laboratory diffractometers can be set up in a range of optical geometries; considered herein are those of Bragg-Brentano divergent beam configuration using both incident and diffracted beam monochromators. We review the origin of the various aberrations affecting instruments of this geometry and the methods developed at NIST to align these machines in a first principles context. Data analysis methods are considered as being in two distinct categories: those that use empirical methods to parameterize the nature of the data for subsequent analysis, and those that use model functions to link the observation directly to a specific aspect of the experiment. We consider a multifaceted approach to instrument calibration using both the empirical and model based data analysis methods. The particular benefits of the fundamental parameters approach are reviewed.
authors.affiliation: National Institute of Standards and Technology, Gaithersburg, MD 20899 USA.
authors.forename: James P
authors.initials: JP
authors.lastname: Cline
authors.affiliation: National Institute of Standards and Technology, Gaithersburg, MD 20899 USA.
authors.forename: Marcus H
authors.initials: MH
authors.lastname: Mendenhall
authors.affiliation: National Institute of Standards and Technology, Gaithersburg, MD 20899 USA.
authors.forename: David
authors.initials: D
authors.lastname: Black
authors.affiliation: National Institute of Standards and Technology, Gaithersburg, MD 20899 USA.
authors.forename: Donald
authors.initials: D
authors.lastname: Windover
authors.affiliation: National Institute of Standards and Technology, Gaithersburg, MD 20899 USA.
authors.forename: Albert
authors.initials: A
authors.lastname: Henins
keywords: Rietveld analysis; Standard Reference Material; X-ray powder diffraction; calibration; fundamental parameters approach; instrument alignment; lattice parameters; profile fitting