title: In situ non-destructive measurement of biofilm thickness and topology in an interferometric optical microscope.
abstract: Biofilms are ubiquitous and impact the environment, human health, dental hygiene, and a wide range of industrial processes. Biofilms are difficult to characterize when fully hydrated, especially in a non-destructive manner, because of their soft structure and water-like bulk properties. Herein a method of measuring and monitoring the thickness and topology of live biofilms of using white light interferometry is described. Using this technique, surface morphology, surface roughness, and biofilm thickness were measured over time without while the biofilm continued to grow. The thickness and surface topology of a P. putida biofilm were monitored growing from initial colonization to a mature biofilm. Measured thickness followed expected trends for bacterial growth. Surface roughness also increased over time and was a leading indicator of biofilm growth.
authors.affiliation: Pacific Northwest National Laboratory, Battelle for the USDOE, PO Box 999, MSIN P7-50, Richland, WA, 99354, USA.
authors.forename: Curtis
authors.initials: C
authors.lastname: Larimer
authors.affiliation: Pacific Northwest National Laboratory, Battelle for the USDOE, PO Box 999, MSIN P7-50, Richland, WA, 99354, USA.
authors.forename: Jonathan D
authors.initials: JD
authors.lastname: Suter
authors.affiliation: Pacific Northwest National Laboratory, Battelle for the USDOE, PO Box 999, MSIN P7-50, Richland, WA, 99354, USA.
authors.forename: George
authors.initials: G
authors.lastname: Bonheyo
authors.affiliation: Pacific Northwest National Laboratory, Battelle for the USDOE, PO Box 999, MSIN P7-50, Richland, WA, 99354, USA. Raymond.Addleman@pnnl.gov.
authors.forename: Raymond Shane
authors.initials: RS
authors.lastname: Addleman
mesh_terms: D018441:Biofilms; D008857:Microscopy, Interference; D016958:Pseudomonas putida / Q000254:growth & development
keywords: Optical profilometry; biofilm; biofouling; interferometric microscopy; white light interferometry