title: Ultrarobust Thin-Film Devices from Self-Assembled Metal-Terpyridine Oligomers.
abstract: Ultrathin molecular layers of Fe(II) -terpyridine oligomers allow the fabrication of large-area crossbar junctions by conventional electrode vapor deposition. The junctions are electrically stable for over 2.5 years and operate over a wide range of temperatures (150-360 K) and voltages (±3 V) due to the high cohesive energy and packing density of the oligomer layer. Electrical measurements reveal ideal Richardson-Shottky emission in surprising agreement with electrochemical, optical, and photoemission data.
authors.affiliation: Sony Deutschland GmbH, Materials Science Laboratory, Hedelfinger Strasse 61, 70327, Stuttgart, Germany.
authors.forename: Zoi
authors.initials: Z
authors.lastname: Karipidou
authors.affiliation: Dipartimento di Chimica, Università di Ferrara, Via Borsari 46, 44100, Ferrara, Italy.
authors.forename: Barbara
authors.initials: B
authors.lastname: Branchi
authors.affiliation: Sony Deutschland GmbH, Materials Science Laboratory, Hedelfinger Strasse 61, 70327, Stuttgart, Germany.
authors.forename: Mustafa
authors.initials: M
authors.lastname: Sarpasan
authors.affiliation: Sony Deutschland GmbH, Materials Science Laboratory, Hedelfinger Strasse 61, 70327, Stuttgart, Germany.
authors.forename: Nikolaus
authors.initials: N
authors.lastname: Knorr
authors.affiliation: Sony Deutschland GmbH, Materials Science Laboratory, Hedelfinger Strasse 61, 70327, Stuttgart, Germany.
authors.forename: Vadim
authors.initials: V
authors.lastname: Rodin
authors.affiliation: Institute of Nanotechnology, Karlsruhe Institute of Technology, 76021, Karlsruhe, Germany.
authors.forename: Pascal
authors.initials: P
authors.lastname: Friederich
authors.affiliation: Institute of Nanotechnology, Karlsruhe Institute of Technology, 76021, Karlsruhe, Germany.
authors.forename: Tobias
authors.initials: T
authors.lastname: Neumann
authors.affiliation: Institute of Nanotechnology, Karlsruhe Institute of Technology, 76021, Karlsruhe, Germany.
authors.forename: Velimir
authors.initials: V
authors.lastname: Meded
authors.affiliation: Sony Deutschland GmbH, Materials Science Laboratory, Hedelfinger Strasse 61, 70327, Stuttgart, Germany.
authors.forename: Silvia
authors.initials: S
authors.lastname: Rosselli
authors.affiliation: Sony Deutschland GmbH, Materials Science Laboratory, Hedelfinger Strasse 61, 70327, Stuttgart, Germany.
authors.forename: Gabriele
authors.initials: G
authors.lastname: Nelles
authors.affiliation: Institute of Nanotechnology, Karlsruhe Institute of Technology, 76021, Karlsruhe, Germany.
authors.forename: Wolfgang
authors.initials: W
authors.lastname: Wenzel
authors.affiliation: Dipartimento di Chimica, Università di Ferrara, Via Borsari 46, 44100, Ferrara, Italy.
authors.forename: Maria Anita
authors.initials: MA
authors.lastname: Rampi
authors.affiliation: Sony Deutschland GmbH, Materials Science Laboratory, Hedelfinger Strasse 61, 70327, Stuttgart, Germany.
authors.forename: Florian
authors.initials: F
authors.lastname: von Wrochem
keywords: Schottky contacts; large-area junctions; molecular electronics; thermionic emission; thin-film devices; transition-metal complexes