title: The effect of length scale on the determination of geometrically necessary dislocations via EBSD continuum dislocation microscopy.
abstract: Electron backscatter diffraction (EBSD) dislocation microscopy is an important, emerging field in metals characterization. Currently, calculation of geometrically necessary dislocation (GND) density is problematic because it has been shown to depend on the step size of the EBSD scan used to investigate the sample. This paper models the change in calculated GND density as a function of step size statistically. The model provides selection criteria for EBSD step size as well as an estimate of the total dislocation content. Evaluation of a heterogeneously deformed tantalum specimen is used to asses the method.
authors.affiliation: National Institute of Aerospace, 100 Exploration Way, Hampton, VA 23666, USA; Department of Mechanical Engineering, Brigham Young University, Provo, UT 84602, USA. Electronic address: timmyruggs@gmail.com.
authors.forename: T J
authors.initials: TJ
authors.lastname: Ruggles
authors.affiliation: EDAX Inc., 91 McKee Drive, Mahwah, NJ 07430, USA.
authors.forename: T M
authors.initials: TM
authors.lastname: Rampton
authors.affiliation: Woodruff School of Mechanical Engineering, Georgia Institute of Technology, Atlanta, GA 30332, USA.
authors.forename: A
authors.initials: A
authors.lastname: Khosravani
authors.affiliation: Department of Mechanical Engineering, Brigham Young University, Provo, UT 84602, USA.
authors.forename: D T
authors.initials: DT
authors.lastname: Fullwood
keywords: Continuum dislocation microscopy; Dislocation density; EBSD step size; High resolution EBSD