title: Gradient Permittivity Meta-Structure model for Wide-field Super-resolution imaging with a sub-45 nm resolution.
abstract: A gradient permittivity meta-structure (GPMS) model and its application in super-resolution imaging were proposed and discussed in this work. The proposed GPMS consists of alternate metallic and dielectric films with a gradient permittivity which can support surface plasmons (SPs) standing wave interference patterns with a super resolution. By employing the rigorous numerical FDTD simulation method, the GPMS was carefully simulated to find that the period of the SPs interference pattern is only 84 nm for a 532 nm incident light. Furthermore, the potential application of the GPMS for wide-field super-resolution imaging was also discussed and the simulation results show that an imaging resolution of sub-45 nm can be achieved based on the plasmonic structure illumination microscopic method, which means a 5.3-fold improvement on resolution has been achieved in comparison with conventional epifluorescence microscopy. Moreover, besides the super-resolution imaging application, the proposed GPMS model can also be applied for nanolithography and other areas where super resolution patterns are needed.
authors.affiliation: State Key Laboratory of Applied Optics, Changchun Institute of Optics, Fine Mechanics &Physics, Chinese Academy of Sciences, No.3888, Dongnanhu Road, Changchun, Jilin, P. R. China.|University of the Chinese Academy of Sciences, Beijing, 10039, P. R. China.
authors.forename: Shun
authors.initials: S
authors.lastname: Cao
authors.affiliation: State Key Laboratory of Applied Optics, Changchun Institute of Optics, Fine Mechanics &Physics, Chinese Academy of Sciences, No.3888, Dongnanhu Road, Changchun, Jilin, P. R. China.
authors.forename: Taisheng
authors.initials: T
authors.lastname: Wang
authors.affiliation: State Key Laboratory of Applied Optics, Changchun Institute of Optics, Fine Mechanics &Physics, Chinese Academy of Sciences, No.3888, Dongnanhu Road, Changchun, Jilin, P. R. China.
authors.forename: Wenbin
authors.initials: W
authors.lastname: Xu
authors.affiliation: State Key Laboratory of Applied Optics, Changchun Institute of Optics, Fine Mechanics &Physics, Chinese Academy of Sciences, No.3888, Dongnanhu Road, Changchun, Jilin, P. R. China.
authors.forename: Hua
authors.initials: H
authors.lastname: Liu
authors.affiliation: State Key Laboratory of Applied Optics, Changchun Institute of Optics, Fine Mechanics &Physics, Chinese Academy of Sciences, No.3888, Dongnanhu Road, Changchun, Jilin, P. R. China.
authors.forename: Hongxin
authors.initials: H
authors.lastname: Zhang
authors.affiliation: Key Laboratory of Spectral Imaging Technology, Xi'an Institute of Optics and Precision Mechanics, Chinese Academy of Sciences, No.17, Xinxi Road, Xian 710119, P. R. China.
authors.forename: Bingliang
authors.initials: B
authors.lastname: Hu
authors.affiliation: Key Laboratory of Spectral Imaging Technology, Xi'an Institute of Optics and Precision Mechanics, Chinese Academy of Sciences, No.17, Xinxi Road, Xian 710119, P. R. China.
authors.forename: Weixing
authors.initials: W
authors.lastname: Yu