title: Wide field-of-view fluorescence image deconvolution with aberration-estimation from Fourier ptychography.
abstract: This paper presents a method to simultaneously acquire an aberration-corrected, wide field-of-view fluorescence image and a high-resolution coherent bright-field image using a computational microscopy method. First, the procedure applies Fourier ptychographic microscopy (FPM) to retrieve the amplitude and phase of a sample, at a resolution that significantly exceeds the cutoff spatial frequency of the microscope objective lens. At the same time, redundancy within the set of acquired FPM bright-field images offers a means to estimate microscope aberrations. Second, the procedure acquires an aberrated fluorescence image, and computationally improves its resolution through deconvolution with the estimated aberration map. An experimental demonstration successfully improves the bright-field resolution of fixed, stained and fluorescently tagged HeLa cells by a factor of 4.9, and reduces the error caused by aberrations in a fluorescence image by up to 31%, over a field of view of 6.2 mm by 9.3 mm. For optimal deconvolution, we show the fluorescence image needs to have a signal-to-noise ratio of at least ~18.
authors.affiliation: Department of Electrical Engineering, California Institute of Technology, Pasadena, CA 91125, USA.
authors.forename: Jaebum
authors.initials: J
authors.lastname: Chung
authors.affiliation: Department of Electrical Engineering, California Institute of Technology, Pasadena, CA 91125, USA.
authors.forename: Jinho
authors.initials: J
authors.lastname: Kim
authors.affiliation: Department of Electrical Engineering, California Institute of Technology, Pasadena, CA 91125, USA.
authors.forename: Xiaoze
authors.initials: X
authors.lastname: Ou
authors.affiliation: Department of Electrical Engineering, California Institute of Technology, Pasadena, CA 91125, USA.
authors.forename: Roarke
authors.initials: R
authors.lastname: Horstmeyer
authors.affiliation: Department of Electrical Engineering, California Institute of Technology, Pasadena, CA 91125, USA.
authors.forename: Changhuei
authors.initials: C
authors.lastname: Yang
keywords: (070.0070) Fourier optics and signal processing; (180.2520) Fluorescence microscopy