title: Defect segregation and optical emission in ZnO nano- and microwires.
abstract: The spatial distribution of defect related deep band emission has been studied in zinc oxide (ZnO) nano- and microwires using depth resolved cathodoluminescence spectroscopy (DRCLS) in a hyperspectral imaging (HSI) mode within a UHV scanning electron microscope (SEM). Three sets of wires were examined that had been grown by pulsed laser deposition or vapor transport methods and ranged in diameter from 200 nm-2.7 μm. This data was analyzed by developing a 3D DRCLS simulation and using it to estimate the segregation depth and decay profile of the near surface defects. We observed different dominant defects from each growth process as well as diameter-dependent defect segregation behavior.
authors.affiliation: Department of Physics, The Ohio State University, Columbus, Ohio 43210, USA. ruane.3@osu.edu.
authors.forename: W T
authors.initials: WT
authors.lastname: Ruane
authors.affiliation: University of Oslo, Centre for Materials Science and Nanotechnology, 0318 Oslo, Norway.
authors.forename: K M
authors.initials: KM
authors.lastname: Johansen
authors.affiliation: Air Force Research Laboratory, Sensors Directorate, WPAFB, OH 45433, USA.
authors.forename: K D
authors.initials: KD
authors.lastname: Leedy
authors.affiliation: Air Force Research Laboratory, Sensors Directorate, WPAFB, OH 45433, USA and Semiconductor Research Center, Wright State University, Dayton, OH 45435, USA.
authors.forename: D C
authors.initials: DC
authors.lastname: Look
authors.affiliation: Institut für Experimentelle Physik II, Universität Leipzig, Linnéstr. 5, 04103 Leipzig, Germany.
authors.forename: H
authors.initials: H
authors.lastname: von Wenckstern
authors.affiliation: Institut für Experimentelle Physik II, Universität Leipzig, Linnéstr. 5, 04103 Leipzig, Germany.
authors.forename: M
authors.initials: M
authors.lastname: Grundmann
authors.affiliation: Department of Physics, Wright State University, Dayton, OH 45435, USA.
authors.forename: G C
authors.initials: GC
authors.lastname: Farlow
authors.affiliation: Department of Physics and Department of Electrical & Computer Engineering, The Ohio State University, Columbus, OH 43210, USA.
authors.forename: L J
authors.initials: LJ
authors.lastname: Brillson