title: An alternative approach for ζ-factor measurement using pure element nanoparticles.
abstract: It is very challenging to measure the chemical composition of hetero nanostructures in a reliable and quantitative manner. Here, we propose a novel and straightforward approach that can be used to quantify energy dispersive X-ray spectra acquired in a transmission electron microscope. Our method is based on a combination of electron tomography and the so-called ζ-factor technique. We will demonstrate the reliability of our approach as well as its applicability by investigating Au-Ag and Au-Pt hetero nanostructures. Given its simplicity, we expect that the method could become a new standard in the field of chemical characterization using electron microscopy.
authors.affiliation: EMAT, University of Antwerp, Groenenborgerlaan 171, B-2020 Antwerp, Belgium.
authors.forename: Daniele
authors.initials: D
authors.lastname: Zanaga
authors.affiliation: EMAT, University of Antwerp, Groenenborgerlaan 171, B-2020 Antwerp, Belgium.
authors.forename: Thomas
authors.initials: T
authors.lastname: Altantzis
authors.affiliation: EMAT, University of Antwerp, Groenenborgerlaan 171, B-2020 Antwerp, Belgium.
authors.forename: Jonathan
authors.initials: J
authors.lastname: Sanctorum
authors.affiliation: FEI Company, Building AAE, Achtseweg Noord 5, Eindhoven, The Netherlands.
authors.forename: Bert
authors.initials: B
authors.lastname: Freitag
authors.affiliation: EMAT, University of Antwerp, Groenenborgerlaan 171, B-2020 Antwerp, Belgium. Electronic address: sara.bals@uantwerpen.be.
authors.forename: Sara
authors.initials: S
authors.lastname: Bals
keywords: Bimetallic nanoparticles; EDXS quantification; Electron tomography