title: Gritty Surface Sample Holder Invented To Obtain Correct X-ray Absorption Fine Structure Spectra for Concentrated Materials by Fluorescence Yield.
abstract: A gritty surface sample holder has been invented to obtain correct XAFS spectra for concentrated samples by fluorescence yield (FY). Materials are usually mixed with boron nitride (BN) to prepare proper concentrations to measure XAFS spectra. Some materials, however, could not be mixed with BN and would be measured in too concentrated conditions to obtain correct XAFS spectra. Consequently, XAFS spectra will be incorrect typically with decreased intensities of the peaks. We have invented the gritty surface sample holders to obtain correct XAFS spectra even for concentrated materials for FY measurements. Pure Cu and CuO powders were measured mounted on the sample holders, and the same spectra were obtained as transmission spectra of properly prepared samples. This sample holder is useful to measure XAFS for any concentrated materials.
authors.affiliation: Institute of Materials Structure Science, High Energy Accelerator Research Organization , 1-1 Oho, Tsukuba, Ibaraki 305-0801, Japan.|Department of Materials Structure Science, School of High Energy Accelerator Science, SOKENDAI (the Graduate University for Advanced Studies) , 1-1 Oho, Tsukuba, Ibaraki 305-0801, Japan.|ACCEL, Japan Science and Technology Agency , 4-1-8 Honcho, Kawaguchi, Saitama 332-0012, Japan.
authors.forename: Hitoshi
authors.initials: H
authors.lastname: Abe
authors.affiliation: Institute of Materials Structure Science, High Energy Accelerator Research Organization , 1-1 Oho, Tsukuba, Ibaraki 305-0801, Japan.
authors.forename: Yasuhiro
authors.initials: Y
authors.lastname: Niwa
authors.affiliation: Institute of Materials Structure Science, High Energy Accelerator Research Organization , 1-1 Oho, Tsukuba, Ibaraki 305-0801, Japan.|Department of Materials Structure Science, School of High Energy Accelerator Science, SOKENDAI (the Graduate University for Advanced Studies) , 1-1 Oho, Tsukuba, Ibaraki 305-0801, Japan.
authors.forename: Masao
authors.initials: M
authors.lastname: Kimura
authors.affiliation: Institute of Materials Structure Science, High Energy Accelerator Research Organization , 1-1 Oho, Tsukuba, Ibaraki 305-0801, Japan.|Department of Materials Structure Science, School of High Energy Accelerator Science, SOKENDAI (the Graduate University for Advanced Studies) , 1-1 Oho, Tsukuba, Ibaraki 305-0801, Japan.
authors.forename: Youichi
authors.initials: Y
authors.lastname: Murakami
authors.affiliation: ACCEL, Japan Science and Technology Agency , 4-1-8 Honcho, Kawaguchi, Saitama 332-0012, Japan.|Materials Research Center for Element Strategy, Tokyo Institute of Technology , 4259 Nagatsuta, Midori-ku, Yokohama 226-8503, Japan.
authors.forename: Toshiharu
authors.initials: T
authors.lastname: Yokoyama
authors.affiliation: ACCEL, Japan Science and Technology Agency , 4-1-8 Honcho, Kawaguchi, Saitama 332-0012, Japan.|Materials Research Center for Element Strategy, Tokyo Institute of Technology , 4259 Nagatsuta, Midori-ku, Yokohama 226-8503, Japan.|Materials and Structures Laboratory, Tokyo Institute of Technology , 4259 Nagatsuta, Midori-ku, Yokohama 226-8503, Japan.|Frontier Research Center, Tokyo Institute of Technology , 4259 Nagatsuta, Midori-ku, Yokohama 226-8503, Japan.
authors.forename: Hideo
authors.initials: H
authors.lastname: Hosono