title: Cracks observed to propagate discontinuously on the millisecond timescale.
abstract: Ultra-fast diffraction and phase contrast imaging experiments on crack propagation in silicon, reported in the current issue of IUCrJ, are reviewed in the light of our present knowledge and its industrial importance.
authors.affiliation: Department of Physics, Durham University , South Road, Durham, DH1 3LE, United Kingdom.
authors.forename: Brian K
authors.initials: BK
authors.lastname: Tanner
keywords: X-ray diffraction imaging; crack propagation; phase-contrast X-ray imaging; silicon wafers; time-resolved studies