title: 20th International Conference on Secondary Ion Mass Spectrometry (SIMS XX).
authors.affiliation: Departments of Bioengineering and Chemical Engineering, University of Washington, Seattle, Washington 98195-1653.
authors.forename: David G
authors.initials: DG
authors.lastname: Castner
mesh_terms: D001695:Biology / Q000379:methods*; D018629:Spectrometry, Mass, Secondary Ion / Q000295:instrumentation / Q000379:methods*