title: Scanning Kelvin Probe Microscopy Investigation of the Role of Minority Carriers on the Switching Characteristics of Organic Field-Effect Transistors.
abstract: A method based on scanning Kelvin probe microscopy is developed to probe the effects of minority carriers on the switching characteristics of organic field-effect transistors. The mobility of the minority carriers is extracted and the role they play in screening of the gate potential in the OFF state and in recombination of trapped majority carriers trapped after an ON state is understood.
authors.affiliation: Cavendish Laboratory, University of Cambridge, Cambridge, CB3 0HE, UK.
authors.forename: Yuanyuan
authors.initials: Y
authors.lastname: Hu
authors.affiliation: Cavendish Laboratory, University of Cambridge, Cambridge, CB3 0HE, UK.
authors.forename: Vincenzo
authors.initials: V
authors.lastname: Pecunia
authors.affiliation: Cavendish Laboratory, University of Cambridge, Cambridge, CB3 0HE, UK.
authors.forename: Lang
authors.initials: L
authors.lastname: Jiang
authors.affiliation: Beijing National Laboratory for Molecular Sciences Key Laboratory of Organic Solids, Institute of Chemistry, Chinese Academy of Sciences, Beijing, 100190, P. R. China.
authors.forename: Chong-An
authors.initials: CA
authors.lastname: Di
authors.affiliation: Laboratory of Materials Science, Shanghai Institute of Organic Chemistry, Chinese Academy of Sciences, Shanghai, 200032, P. R. China.
authors.forename: Xike
authors.initials: X
authors.lastname: Gao
authors.affiliation: Cavendish Laboratory, University of Cambridge, Cambridge, CB3 0HE, UK.
authors.forename: Henning
authors.initials: H
authors.lastname: Sirringhaus
keywords: minority carriers; organic transistors; scanning Kelvin probe microscopy