title: Quantitative correlation between facets defects of RDX crystals and their laser sensitivity.
abstract: In this work, the {210} facets of cyclotrimethylenetrinitramine (RDX) single crystals with different quality were studied by scanning electron microscopy and atomic force microscopy. Their laser sensitivity was then assessed using a direct laser ignition test irradiated with ultraviolet laser (wavelength: 355nm, pulse width: 6.4ns). Quantitative relationships between laser sensitivity and surface defects of RDX (210) and (2¯1¯0) facets were investigated. It is determined that the laser sensitivity exhibits significant correlation with the surface roughness, size of which is comparable with scales of laser wavelength. 3D FDTD simulations disclose that this relationship can be well explained with light intensity modulation effects induced by micro-defects on the initial plane wave.
authors.affiliation: School of Physical Electronics, University of Electronic Science and Technology of China, Chengdu 610054, China; Research Center of Laser Fusion, China Academy of Engineering Physics, Mianyang 621900, China.
authors.forename: Zhonghua
authors.initials: Z
authors.lastname: Yan
authors.affiliation: School of Physical Electronics, University of Electronic Science and Technology of China, Chengdu 610054, China. Electronic address: weiliu@uestc.edu.cn.
authors.forename: Wei
authors.initials: W
authors.lastname: Liu
authors.affiliation: Research Center of Laser Fusion, China Academy of Engineering Physics, Mianyang 621900, China.
authors.forename: Chuanchao
authors.initials: C
authors.lastname: Zhang
authors.affiliation: School of Physical Electronics, University of Electronic Science and Technology of China, Chengdu 610054, China.
authors.forename: Xuming
authors.initials: X
authors.lastname: Wang
authors.affiliation: Institute of Chemical Materials, China Academy of Engineering Physics, Mianyang 621900, China.
authors.forename: Jinshan
authors.initials: J
authors.lastname: Li
authors.affiliation: Institute of Chemical Materials, China Academy of Engineering Physics, Mianyang 621900, China.
authors.forename: Zongwei
authors.initials: Z
authors.lastname: Yang
authors.affiliation: School of Physical Electronics, University of Electronic Science and Technology of China, Chengdu 610054, China.
authors.forename: Xia
authors.initials: X
authors.lastname: Xiang
authors.affiliation: Institute of Chemical Materials, China Academy of Engineering Physics, Mianyang 621900, China.
authors.forename: Ming
authors.initials: M
authors.lastname: Huang
authors.affiliation: Institute of Chemical Materials, China Academy of Engineering Physics, Mianyang 621900, China.
authors.forename: Bisheng
authors.initials: B
authors.lastname: Tan
authors.affiliation: Research Center of Laser Fusion, China Academy of Engineering Physics, Mianyang 621900, China.
authors.forename: Guorui
authors.initials: G
authors.lastname: Zhou
authors.affiliation: Research Center of Laser Fusion, China Academy of Engineering Physics, Mianyang 621900, China.
authors.forename: Wei
authors.initials: W
authors.lastname: Liao
authors.affiliation: School of Physical Electronics, University of Electronic Science and Technology of China, Chengdu 610054, China.
authors.forename: Zhijie
authors.initials: Z
authors.lastname: Li
authors.affiliation: School of Physical Electronics, University of Electronic Science and Technology of China, Chengdu 610054, China.
authors.forename: Li
authors.initials: L
authors.lastname: Li
authors.affiliation: Research Center of Laser Fusion, China Academy of Engineering Physics, Mianyang 621900, China.
authors.forename: Hongwei
authors.initials: H
authors.lastname: Yan
authors.affiliation: Research Center of Laser Fusion, China Academy of Engineering Physics, Mianyang 621900, China. Electronic address: yxd66my@163.com.
authors.forename: Xiaodong
authors.initials: X
authors.lastname: Yuan
authors.affiliation: School of Physical Electronics, University of Electronic Science and Technology of China, Chengdu 610054, China; Institute of Fundamental and Frontier Sciences, University of Electronic Science and Technology of China, Chengdu 610054, China. Electronic address: xtzu@uestc.edu.cn.
authors.forename: Xiaotao
authors.initials: X
authors.lastname: Zu
keywords: Ignition threshold; Laser sensitivity; RDX crystal facet; Surface defects