title: Nanoscale chemical imaging by photoinduced force microscopy.
abstract: Correlating spatial chemical information with the morphology of closely packed nanostructures remains a challenge for the scientific community. For example, supramolecular self-assembly, which provides a powerful and low-cost way to create nanoscale patterns and engineered nanostructures, is not easily interrogated in real space via existing nondestructive techniques based on optics or electrons. A novel scanning probe technique called infrared photoinduced force microscopy (IR PiFM) directly measures the photoinduced polarizability of the sample in the near field by detecting the time-integrated force between the tip and the sample. By imaging at multiple IR wavelengths corresponding to absorption peaks of different chemical species, PiFM has demonstrated the ability to spatially map nm-scale patterns of the individual chemical components of two different types of self-assembled block copolymer films. With chemical-specific nanometer-scale imaging, PiFM provides a powerful new analytical method for deepening our understanding of nanomaterials.
authors.affiliation: Molecular Vista Inc., 6840 Via Del Oro, Suite 110, San Jose, CA 95119, USA.
authors.forename: Derek
authors.initials: D
authors.lastname: Nowak
authors.affiliation: Molecular Vista Inc., 6840 Via Del Oro, Suite 110, San Jose, CA 95119, USA.
authors.forename: William
authors.identifier: 0000-0002-1706-1921
authors.initials: W
authors.lastname: Morrison
authors.affiliation: Department of Electrical Engineering and Computer Science, University of California, Irvine, Irvine, CA 92697, USA.
authors.forename: H Kumar
authors.initials: HK
authors.lastname: Wickramasinghe
authors.affiliation: Department of Physics and Astronomy, University of California, Irvine, Irvine, CA 92697, USA.
authors.forename: Junghoon
authors.identifier: 0000-0002-5745-9686
authors.initials: J
authors.lastname: Jahng
authors.affiliation: Department of Chemistry, University of California, Irvine, Irvine, CA 92697, USA.
authors.forename: Eric
authors.initials: E
authors.lastname: Potma
authors.affiliation: HGST San Jose Research Center, 3403 Yerba Buena Road, San Jose, CA 95135, USA.
authors.forename: Lei
authors.initials: L
authors.lastname: Wan
authors.affiliation: HGST San Jose Research Center, 3403 Yerba Buena Road, San Jose, CA 95135, USA.
authors.forename: Ricardo
authors.initials: R
authors.lastname: Ruiz
authors.affiliation: HGST San Jose Research Center, 3403 Yerba Buena Road, San Jose, CA 95135, USA.
authors.forename: Thomas R
authors.initials: TR
authors.lastname: Albrecht
authors.affiliation: IBM Research-Almaden, 650 Harry Road, San Jose, CA 95120, USA.
authors.forename: Kristin
authors.initials: K
authors.lastname: Schmidt
authors.affiliation: IBM Research-Almaden, 650 Harry Road, San Jose, CA 95120, USA.
authors.forename: Jane
authors.identifier: 0000-0002-5198-6127
authors.initials: J
authors.lastname: Frommer
authors.affiliation: IBM Research-Almaden, 650 Harry Road, San Jose, CA 95120, USA.
authors.forename: Daniel P
authors.initials: DP
authors.lastname: Sanders
authors.affiliation: Molecular Vista Inc., 6840 Via Del Oro, Suite 110, San Jose, CA 95119, USA.
authors.forename: Sung
authors.initials: S
authors.lastname: Park
mesh_terms: D018625:Microscopy, Atomic Force / Q000379:methods*; D008956:Models, Chemical; D049329:Nanostructures / Q000737:chemistry*; D011108:Polymers / Q000737:chemistry; D017550:Spectroscopy, Fourier Transform Infrared
chemical_list: D011108:Polymers
keywords: Microscopy; atomic force microscopy; block copolymers; chemical imaging; directed self-assembly; force microscopy; image dipole; midInfared spectroscopy; near-field imaging; polarizability