title: Opportunities and limitations for combined fly-scan ptychography and fluorescence microscopy.
abstract: X-ray fluorescence offers unparalleled sensitivity for imaging the nanoscale distribution of trace elements in micrometer thick samples, while x-ray ptychography offers an approach to image light element containing structures at a resolution beyond that of the x-ray lens used. These methods can be used in combination, and in continuous scan mode for rapid data acquisition when using multiple probe mode reconstruction methods. We discuss here the opportunities and limitations of making use of additional information provided by ptychography to improve x-ray fluorescence images in two ways: by using position-error-correction algorithms to correct for scan distortions in fluorescence scans, and by considering the signal-to-noise limits on previously-demonstrated ptychographic probe deconvolution methods. This highlights the advantages of using a combined approach.
authors.affiliation: Applied Physics, Northwestern University, Evanston, IL 60208, USA.
authors.forename: Junjing
authors.initials: J
authors.lastname: Deng
authors.affiliation: X-ray Science Division, Advanced Photon Source, Argonne National Laboratory, Argonne, IL 60439, USA.
authors.forename: David J
authors.initials: DJ
authors.lastname: Vine
authors.affiliation: X-ray Science Division, Advanced Photon Source, Argonne National Laboratory, Argonne, IL 60439, USA.
authors.forename: Si
authors.initials: S
authors.lastname: Chen
authors.affiliation: Mathematics and Computing Science Division, Argonne National Laboratory, Argonne, IL 60439, USA.
authors.forename: Youssef S G
authors.initials: YS
authors.lastname: Nashed
authors.affiliation: Mathematics and Computing Science Division, Argonne National Laboratory, Argonne, IL 60439, USA.
authors.forename: Tom
authors.initials: T
authors.lastname: Peterka
authors.affiliation: Mathematics and Computing Science Division, Argonne National Laboratory, Argonne, IL 60439, USA.
authors.forename: Rob
authors.initials: R
authors.lastname: Ross
authors.affiliation: X-ray Science Division, Advanced Photon Source, Argonne National Laboratory, Argonne, IL 60439, USA.
authors.forename: Stefan
authors.initials: S
authors.lastname: Vogt
authors.affiliation: X-ray Science Division, Advanced Photon Source, Argonne National Laboratory, Argonne, IL 60439, USA; Department of Physics & Astronomy, Northwestern University, Evanston, IL 60208, USA; Chemistry of Life Processes Institute, Northwestern University, Evanston, IL 60208, USA.
authors.forename: Chris
authors.initials: C
authors.lastname: Jacobsen
keywords: Ptychography; deconvolution; distortion correction; fluorescence microscopy; fly scan; multiple probe modes