title: Characterization of the Individual Short-Term Frequency Stability of Cryogenic Sapphire Oscillators at the 10(-16) Level.
abstract: We present the characterization of three cryogenic sapphire oscillators (CSOs) using the three-cornered-hat method. Easily implemented with commercial components and instruments, this method reveals itself very useful to analyze the fractional frequency stability limitations of these state-of-the-art ultrastable oscillators. The best unit presents a fractional frequency stability better than 5 ×10(-16) at 1 s and below 2 ×10(-16) for [Formula: see text].
authors.forename: Christophe
authors.initials: C
authors.lastname: Fluhr
authors.forename: Serge
authors.initials: S
authors.lastname: Grop
authors.forename: Benoit
authors.initials: B
authors.lastname: Dubois
authors.forename: Yann
authors.initials: Y
authors.lastname: Kersale
authors.forename: Enrico
authors.initials: E
authors.lastname: Rubiola
authors.forename: Vincent
authors.initials: V
authors.lastname: Giordano