title: Neuroscience: Fault tolerance in the brain.
authors.affiliation: Department of Electrical and Computer Engineering and the Department of Biomedical Engineering, Carnegie Mellon University, Pittsburgh, Pennsylvania 15213, USA.
authors.forename: Byron M
authors.initials: BM
authors.lastname: Yu
mesh_terms: D000818:Animals; D001931:Brain Mapping; D056344:Executive Function / Q000502:physiology*; D005260:Female; D008297:Male; D009044:Motor Cortex / Q000166:cytology* / Q000502:physiology*; D009068:Movement / Q000502:physiology*; D009474:Neurons / Q000502:physiology*