Uniqueness of one-dimensional Néel wall profiles.
We study the domain wall structure in thin uniaxial ferromagnetic films in the presence of an in-plane applied external field in the direction normal to the easy axis. Using the reduced one-dimensional thin-film micromagnetic model, we analyse the critical points of the obtained non-local variational problem. We prove that the minimizer of the one-dimensional energy functional in the form of the Néel wall is the unique (up to translations) critical point of the energy among all monotone profiles with the same limiting behaviour at infinity. Thus, we establish uniqueness of the one-dimensional monotone Néel wall profile in the considered setting. We also obtain some uniform estimates for general one-dimensional domain wall profiles.
Department of Mathematics , New Jersey Institute of Technology , Newark, NJ 07102, USA.
Cyrill B
0000-0002-3337-6165
CB
Muratov
Department of Mathematics , University of Connecticut , Storrs, CT 06269, USA.
Xiaodong
0000-0002-1300-5498
X
Yan
critical point; domain wall; uniqueness