title: Planar scanning method for detecting refraction characteristics of two-dimensional photonic quasi-crystal wedge-shaped prisms.
abstract: In this study, a planar scanning method is proposed. This novel method adapts two monitors moving along double planar tracks that can be used to detect refraction characteristics of two-dimensional (2D) photonic quasi-crystal (PQC) wedge-shaped prisms. Refraction of a decagonal Penrose-type PQC prism is analyzed for a given incident beam and two polarization modes at different incident positions in the prism using this method. Refraction from the prism is irregular, indicating that nonuniformity in the arrangement of scatterers in the prism causes Bragg-like scattering irregularities. Numerical results show that this method can be used for guiding the design of a 2D PQC prism and for the analysis of its refraction characteristics.
authors.forename: Jianjun
authors.initials: J
authors.lastname: Liu
authors.forename: Wei
authors.initials: W
authors.lastname: Tan
authors.forename: Exian
authors.initials: E
authors.lastname: Liu
authors.forename: Haili
authors.initials: H
authors.lastname: Hu
authors.forename: Zhigang
authors.initials: Z
authors.lastname: Fan
authors.forename: Tianhua
authors.initials: T
authors.lastname: Zhang
authors.forename: Xiong
authors.initials: X
authors.lastname: Zhang