title: Near-field to far-field characterization of speckle patterns generated by disordered nanomaterials.
abstract: We study the intensity spatial correlation function of optical speckle patterns above a disordered dielectric medium in the multiple scattering regime. The intensity distributions are recorded by scanning near-field optical microscopy (SNOM) with sub-wavelength spatial resolution at variable distances from the surface in a range which spans continuously from the near-field (distance ≪ λ) to the far-field regime (distance ≫ λ). The non-universal behavior at sub-wavelength distances reveals the connection between the near-field speckle pattern and the internal structure of the medium.
authors.forename: Valentina
authors.initials: V
authors.lastname: Parigi
authors.forename: Elodie
authors.initials: E
authors.lastname: Perros
authors.forename: Guillaume
authors.initials: G
authors.lastname: Binard
authors.forename: Céline
authors.initials: C
authors.lastname: Bourdillon
authors.forename: Agnès
authors.initials: A
authors.lastname: Maître
authors.forename: Rémi
authors.initials: R
authors.lastname: Carminati
authors.forename: Valentina
authors.initials: V
authors.lastname: Krachmalnicoff
authors.forename: Yannick
authors.initials: Y
authors.lastname: De Wilde