title: A single probe for imaging photons, electrons and physical forces.
abstract: The combination of complementary measurement techniques has become a frequent approach to improve scientific knowledge. Pairing of the high lateral resolution scanning force microscopy (SFM) with the spectroscopic information accessible through scanning transmission soft x-ray microscopy (STXM) permits assessing physical and chemical material properties with high spatial resolution. We present progress from the NanoXAS instrument towards using an SFM probe as an x-ray detector for STXM measurements. Just by the variation of one parameter, the SFM probe can be utilised to detect either sample photo-emitted electrons or transmitted photons. This allows the use of a single probe to detect electrons, photons and physical forces of interest. We also show recent progress and demonstrate the current limitations of using a high aspect ratio coaxial SFM probe to detect photo-emitted electrons with very high lateral resolution. Novel probe designs are proposed to further progress in using an SFM probe as a STXM detector.
authors.affiliation: Paul Scherrer Institut, CH-5232 Villigen PSI, Switzerland.
authors.forename: Nicolas
authors.initials: N
authors.lastname: Pilet
authors.forename: Yuliya
authors.initials: Y
authors.lastname: Lisunova
authors.forename: Fabio
authors.initials: F
authors.lastname: Lamattina
authors.forename: Stephanie E
authors.initials: SE
authors.lastname: Stevenson
authors.forename: Giancarlo
authors.initials: G
authors.lastname: Pigozzi
authors.forename: Patrycja
authors.initials: P
authors.lastname: Paruch
authors.forename: Rainer H
authors.initials: RH
authors.lastname: Fink
authors.forename: Hans J
authors.initials: HJ
authors.lastname: Hug
authors.forename: Christoph
authors.initials: C
authors.lastname: Quitmann
authors.forename: Joerg
authors.initials: J
authors.lastname: Raabe