title: Simulation of FEL pulse length calculation with THz streaking method.
abstract: Having accurate and comprehensive photon diagnostics for the X-ray pulses delivered by free-electron laser (FEL) facilities is of utmost importance. Along with various parameters of the photon beam (such as photon energy, beam intensity, etc.), the pulse length measurements are particularly useful both for the machine operators to measure the beam parameters and monitor the stability of the machine performance, and for the users carrying out pump-probe experiments at such facilities to better understand their measurement results. One of the most promising pulse length measurement techniques used for photon diagnostics is the THz streak camera which is capable of simultaneously measuring the lengths of the photon pulses and their arrival times with respect to the pump laser. This work presents simulations of a THz streak camera performance. The simulation procedure utilizes FEL pulses with two different photon energies in hard and soft X-ray regions, respectively. It recreates the energy spectra of the photoelectrons produced by the photon pulses and streaks them by a single-cycle THz pulse. Following the pulse-retrieval procedure of the THz streak camera, the lengths were calculated from the streaked spectra. To validate the pulse length calculation procedure, the precision and the accuracy of the method were estimated for streaking configuration corresponding to previously performed experiments. The obtained results show that for the discussed setup the method is capable of measuring FEL pulses with about a femtosecond accuracy and precision.
authors.affiliation: Paul Scherrer Institut, 5232 Villigen PSI, Switzerland.
authors.forename: I
authors.initials: I
authors.lastname: Gorgisyan
authors.affiliation: Paul Scherrer Institut, 5232 Villigen PSI, Switzerland.
authors.forename: R
authors.initials: R
authors.lastname: Ischebeck
authors.affiliation: Paul Scherrer Institut, 5232 Villigen PSI, Switzerland.
authors.forename: E
authors.initials: E
authors.lastname: Prat
authors.affiliation: Paul Scherrer Institut, 5232 Villigen PSI, Switzerland.
authors.forename: S
authors.initials: S
authors.lastname: Reiche
authors.affiliation: Paul Scherrer Institut, 5232 Villigen PSI, Switzerland.
authors.forename: L
authors.initials: L
authors.lastname: Rivkin
authors.affiliation: Paul Scherrer Institut, 5232 Villigen PSI, Switzerland.
authors.forename: P
authors.initials: P
authors.lastname: Juranić
keywords: femtosecond metrology; free-electron laser; hard X-rays; simulation; terahertz streaking; time-of-flight spectrometer