title: A setup for synchrotron-radiation-induced total reflection X-ray fluorescence and X-ray absorption near-edge structure recently commissioned at BESSY II BAMline.
abstract: An automatic sample changer chamber for total reflection X-ray fluorescence (TXRF) and X-ray absorption near-edge structure (XANES) analysis in TXRF geometry was successfully set up at the BAMline at BESSY II. TXRF and TXRF-XANES are valuable tools for elemental determination and speciation, especially where sample amounts are limited (<1 mg) and concentrations are low (ng ml(-1) to µg ml(-1)). TXRF requires a well defined geometry regarding the reflecting surface of a sample carrier and the synchrotron beam. The newly installed chamber allows for reliable sample positioning, remote sample changing and evacuation of the fluorescence beam path. The chamber was successfully used showing accurate determination of elemental amounts in the certified reference material NIST water 1640. Low limits of detection of less than 100 fg absolute (10 pg ml(-1)) for Ni were found. TXRF-XANES on different Re species was applied. An unknown species of Re was found to be Re in the +7 oxidation state.
authors.affiliation: Chemistry Department, Washington State University, Pullman, WA 99164, USA.
authors.forename: U
authors.initials: U
authors.lastname: Fittschen
authors.affiliation: BAM, Bundesanstalt für Materialforschung und -prüfung, 12489 Berlin, Germany.
authors.forename: A
authors.initials: A
authors.lastname: Guilherme
authors.affiliation: Chemistry and Chemistry Education Department, Europa-Universität Flensburg, 24943 Flensburg, Germany.
authors.forename: S
authors.initials: S
authors.lastname: Böttger
authors.affiliation: Chemistry and Chemistry Education Department, Europa-Universität Flensburg, 24943 Flensburg, Germany.
authors.forename: D
authors.initials: D
authors.lastname: Rosenberg
authors.affiliation: Chemistry Department, University of Hamburg, 20146 Hamburg, Germany.
authors.forename: M
authors.initials: M
authors.lastname: Menzel
authors.affiliation: Chemistry and Chemistry Education Department, Europa-Universität Flensburg, 24943 Flensburg, Germany.
authors.forename: W
authors.initials: W
authors.lastname: Jansen
authors.affiliation: Chemistry and Chemistry Education Department, Europa-Universität Flensburg, 24943 Flensburg, Germany.
authors.forename: M
authors.initials: M
authors.lastname: Busker
authors.affiliation: Chemistry Department, Washington State University, Pullman, WA 99164, USA.
authors.forename: Z P
authors.initials: ZP
authors.lastname: Gotlib
authors.affiliation: BAM, Bundesanstalt für Materialforschung und -prüfung, 12489 Berlin, Germany.
authors.forename: M
authors.initials: M
authors.lastname: Radtke
authors.affiliation: BAM, Bundesanstalt für Materialforschung und -prüfung, 12489 Berlin, Germany.
authors.forename: H
authors.initials: H
authors.lastname: Riesemeier
authors.affiliation: Atominstitut, Vienna University of Technology, Vienna 1020, Austria.
authors.forename: P
authors.initials: P
authors.lastname: Wobrauschek
authors.affiliation: Atominstitut, Vienna University of Technology, Vienna 1020, Austria.
authors.forename: C
authors.initials: C
authors.lastname: Streli
mesh_terms: D013052:Spectrometry, X-Ray Emission; D017356:Synchrotrons; D014965:X-Rays
keywords: BAMline; Re-XANES; TXRF; TXRF-XANES; sample changer