title: Low-frequency fluctuations in an external-cavity laser leading to extreme events.
abstract: We experimentally investigate the dynamical regimes of a laser diode subject to external optical feedback in light of extreme-event (EE) analysis. We observe EEs in the low-frequency fluctuations (LFFs) regime. This number decreases to negligible values when the laser transitions towards fully developed coherence collapse as the injection current is increased. Moreover, we show that EEs observed in the LFF regime are linked to high-frequency pulsing events observed after a power dropout. Finally, we prove experimentally that the observation of EEs in the LFF regimes is robust to changes in operational parameters.
authors.affiliation: UMI 2958 Georgia Tech-CNRS, Georgia Tech Lorraine, 2 Rue Marconi F-57070, Metz, France.|School of Electrical and Computer Engineering, Georgia Institute of Technology, Atlanta, Georgia 30332-0250, USA.
authors.forename: Daeyoung
authors.initials: D
authors.lastname: Choi
authors.affiliation: UMI 2958 Georgia Tech-CNRS, Georgia Tech Lorraine, 2 Rue Marconi F-57070, Metz, France.|School of Electrical and Computer Engineering, Georgia Institute of Technology, Atlanta, Georgia 30332-0250, USA.
authors.forename: Michael J
authors.initials: MJ
authors.lastname: Wishon
authors.affiliation: UMI 2958 Georgia Tech-CNRS, Georgia Tech Lorraine, 2 Rue Marconi F-57070, Metz, France.|School of Electrical and Computer Engineering, Georgia Institute of Technology, Atlanta, Georgia 30332-0250, USA.
authors.forename: J
authors.initials: J
authors.lastname: Barnoud
authors.affiliation: UMI 2958 Georgia Tech-CNRS, Georgia Tech Lorraine, 2 Rue Marconi F-57070, Metz, France.|School of Physics, Georgia Institute of Technology, Atlanta, Georgia 30332-0430, USA.
authors.forename: C Y
authors.initials: CY
authors.lastname: Chang
authors.affiliation: UMI 2958 Georgia Tech-CNRS, Georgia Tech Lorraine, 2 Rue Marconi F-57070, Metz, France.|School of Electrical and Computer Engineering, Georgia Institute of Technology, Atlanta, Georgia 30332-0250, USA.
authors.forename: Y
authors.initials: Y
authors.lastname: Bouazizi
authors.affiliation: UMI 2958 Georgia Tech-CNRS, Georgia Tech Lorraine, 2 Rue Marconi F-57070, Metz, France.|School of Electrical and Computer Engineering, Georgia Institute of Technology, Atlanta, Georgia 30332-0250, USA.
authors.forename: A
authors.initials: A
authors.lastname: Locquet
authors.affiliation: UMI 2958 Georgia Tech-CNRS, Georgia Tech Lorraine, 2 Rue Marconi F-57070, Metz, France.|School of Electrical and Computer Engineering, Georgia Institute of Technology, Atlanta, Georgia 30332-0250, USA.
authors.forename: D S
authors.initials: DS
authors.lastname: Citrin