title: De novo phasing with optimized XFEL data.
abstract: Nass et al. [IUCrJ (2016), 3, 180-191] have demonstrated that serial femtosecond crystallography (SFX) data collected at X-ray free-electron lasers (XFELs) can be successfully phased using only the weak anomalous scattering from the native S atoms.
authors.affiliation: School of Biomedical Sciences, L04-48 Laboratory Block, University of Hong Kong , 21 Sassoon Road, Hong Kong.
authors.forename: Quan
authors.initials: Q
authors.lastname: Hao
keywords: SAD phasing; XFEL; serial crystallography