title: Convenient visualization of high-resolution tandem mass spectra of synthetic polymer ions using Kendrick mass defect analysis - the case of polysiloxanes.
authors.affiliation: National Institute of Advanced Industrial Science and Technology (AIST), Environmental Measurement Technology Group, Environmental Management Research Institute (EMRI), 16-1 Onogawa, Tsukuba, Ibaraki, 305-8569, Japan.
authors.forename: Thierry
authors.identifier: 0000-0002-9473-9425
authors.initials: T
authors.lastname: Fouquet
authors.affiliation: National Institute of Advanced Industrial Science and Technology (AIST), Environmental Measurement Technology Group, Environmental Management Research Institute (EMRI), 16-1 Onogawa, Tsukuba, Ibaraki, 305-8569, Japan.
authors.forename: Hiroaki
authors.initials: H
authors.lastname: Sato