title: Giant Resistive Switching via Control of Ferroelectric Charged Domain Walls.
abstract: Controlled switching of resistivity in ferroelectric thin films is demonstrated by writing and erasing stable, nanoscale, strongly charged domain walls using an in situ transmission electron microscopy technique. The resistance can be read nondestructively and presents the largest off/on ratio (≈10(5) ) ever reported in room-temperature ferroelectric devices, opening new avenues for engineering ferroelectric thin-film devices.
authors.affiliation: Department of Chemical Engineering and Materials Science and Department of Physics and Astronomy, University of California - Irvine, Irvine, CA, 92697, USA.|Department of Materials Science and Engineering, University of Michigan, Ann Arbor, MI, 48109, USA.
authors.forename: Linze
authors.initials: L
authors.lastname: Li
authors.affiliation: Department of Materials Science and Engineering, Penn State University, University Park, PA, 16802, USA.
authors.forename: Jason
authors.initials: J
authors.lastname: Britson
authors.affiliation: Department of Chemical Engineering and Materials Science and Department of Physics and Astronomy, University of California - Irvine, Irvine, CA, 92697, USA.|Department of Materials Science and Engineering, University of Michigan, Ann Arbor, MI, 48109, USA.
authors.forename: Jacob R
authors.initials: JR
authors.lastname: Jokisaari
authors.affiliation: Department of Chemical Engineering and Materials Science and Department of Physics and Astronomy, University of California - Irvine, Irvine, CA, 92697, USA.|Department of Materials Science and Engineering, University of Michigan, Ann Arbor, MI, 48109, USA.
authors.forename: Yi
authors.initials: Y
authors.lastname: Zhang
authors.affiliation: Department of Materials Science and Engineering, Cornell University, Ithaca, NY, 14853, USA.
authors.forename: Carolina
authors.initials: C
authors.lastname: Adamo
authors.affiliation: Department of Materials Science and Engineering, Cornell University, Ithaca, NY, 14853, USA.
authors.forename: Alexander
authors.initials: A
authors.lastname: Melville
authors.affiliation: Department of Materials Science and Engineering, Cornell University, Ithaca, NY, 14853, USA.|Kavli Institute at Cornell for Nanoscale Science, Ithaca, NY, 14853, USA.
authors.forename: Darrell G
authors.initials: DG
authors.lastname: Schlom
authors.affiliation: Department of Materials Science and Engineering, Penn State University, University Park, PA, 16802, USA.
authors.forename: Long-Qing
authors.initials: LQ
authors.lastname: Chen
authors.affiliation: Department of Chemical Engineering and Materials Science and Department of Physics and Astronomy, University of California - Irvine, Irvine, CA, 92697, USA.
authors.forename: Xiaoqing
authors.initials: X
authors.lastname: Pan
keywords: charged domain walls; ferroelectrics; in situ transmission electron microscopy; resistive switching