title: Pushing phase and amplitude sensitivity limits in interferometric microscopy.
abstract: Sensitivity of the amplitude and phase measurements in interferometric microscopy is influenced by factors such as instrument design and environmental interferences. Through development of a theoretical framework followed by experimental validation, we show photon shot noise is often the limiting factor in interferometric microscopy measurements. Thereafter, we demonstrate how a state-of-the-art camera with million-level electrons full well capacity can significantly reduce shot noise contribution resulting in a stability of optical path length down to a few picometers even in a near-common-path interferometer.
authors.forename: Poorya
authors.initials: P
authors.lastname: Hosseini
authors.forename: Renjie
authors.initials: R
authors.lastname: Zhou
authors.forename: Yang-Hyo
authors.initials: YH
authors.lastname: Kim
authors.forename: Chiara
authors.initials: C
authors.lastname: Peres
authors.forename: Alberto
authors.initials: A
authors.lastname: Diaspro
authors.forename: Cuifang
authors.initials: C
authors.lastname: Kuang
authors.forename: Zahid
authors.initials: Z
authors.lastname: Yaqoob
authors.forename: Peter T C
authors.initials: PT
authors.lastname: So