title: Mitigating bit flips or single event upsets in epilepsy neurostimulators.
abstract: OBJECTIVE
  The objective of this study was to review software errors known as single event upsets (SEUs) or bit flips due to cosmic rays in epilepsy neurostimulators.
  
  
  METHODS
  A case report of a single event upset or bit flip is discussed; device manufacturers and publicly available data were queried for both incidence and types of error as well as strategies of software error mitigation.
  
  
  RESULTS
  Neurostimulators, like other implanted devices such as pacemakers, are prone to single event upsets. Strategies for SEU mitigation are reviewed.
  
  
  CONCLUSIONS
  Cosmic radiation can threaten RAM and settings of neurostimulators; neuromodulation teams and device designers need to take this threat into account when designing multifunctional neuromodulation systems.
authors.affiliation: Department of Biochemistry, University of Washington, Seattle, WA 98105, USA.
authors.forename: Alice X
authors.initials: AX
authors.lastname: Dong
authors.affiliation: Swedish Epilepsy Center, 550 17th Ave Suite 540, Seattle, WA 98122, USA.
authors.forename: Ryder P
authors.initials: RP
authors.lastname: Gwinn
authors.affiliation: Swedish Epilepsy Center, 550 17th Ave Suite 540, Seattle, WA 98122, USA.
authors.forename: Nicole M
authors.initials: NM
authors.lastname: Warner
authors.affiliation: Swedish Epilepsy Center, 550 17th Ave Suite 540, Seattle, WA 98122, USA.
authors.forename: Lisa M
authors.initials: LM
authors.lastname: Caylor
authors.affiliation: Swedish Epilepsy Center, 550 17th Ave Suite 540, Seattle, WA 98122, USA.
authors.forename: Michael J
authors.initials: MJ
authors.lastname: Doherty
keywords: Cosmic; Epilepsy; Neurostimulation; Neutron; Safety; Software