title: Big Data Analytics for Scanning Transmission Electron Microscopy Ptychography.
abstract: Electron microscopy is undergoing a transition; from the model of producing only a few micrographs, through the current state where many images and spectra can be digitally recorded, to a new mode where very large volumes of data (movies, ptychographic and multi-dimensional series) can be rapidly obtained. Here, we discuss the application of so-called "big-data" methods to high dimensional microscopy data, using unsupervised multivariate statistical techniques, in order to explore salient image features in a specific example of BiFeO3 domains. Remarkably, k-means clustering reveals domain differentiation despite the fact that the algorithm is purely statistical in nature and does not require any prior information regarding the material, any coexisting phases, or any differentiating structures. While this is a somewhat trivial case, this example signifies the extraction of useful physical and structural information without any prior bias regarding the sample or the instrumental modality. Further interpretation of these types of results may still require human intervention. However, the open nature of this algorithm and its wide availability, enable broad collaborations and exploratory work necessary to enable efficient data analysis in electron microscopy.
authors.affiliation: The Institute for Functional Imaging of Materials, Oak Ridge National Laboratory, Oak Ridge, TN 37831, USA.|The Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN 37831, USA.
authors.forename: S
authors.initials: S
authors.lastname: Jesse
authors.affiliation: The Institute for Functional Imaging of Materials, Oak Ridge National Laboratory, Oak Ridge, TN 37831, USA.|The Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN 37831, USA.
authors.forename: M
authors.initials: M
authors.lastname: Chi
authors.affiliation: The Institute for Functional Imaging of Materials, Oak Ridge National Laboratory, Oak Ridge, TN 37831, USA.|The Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN 37831, USA.
authors.forename: A
authors.initials: A
authors.lastname: Belianinov
authors.affiliation: Florida State University Department of Physics Tallahassee, FL 32306, USA.|National High Magnetic Field Laboratory, 1800 E Paul Dirac Dr, Tallahassee, FL, 32310, USA.
authors.forename: C
authors.initials: C
authors.lastname: Beekman
authors.affiliation: The Institute for Functional Imaging of Materials, Oak Ridge National Laboratory, Oak Ridge, TN 37831, USA.|The Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN 37831, USA.
authors.forename: S V
authors.initials: SV
authors.lastname: Kalinin
authors.affiliation: The Institute for Functional Imaging of Materials, Oak Ridge National Laboratory, Oak Ridge, TN 37831, USA.|Materials Sciences and Technology Division, Oak Ridge National Laboratory, Oak Ridge, TN 37831, USA.
authors.forename: A Y
authors.initials: AY
authors.lastname: Borisevich
authors.affiliation: The Institute for Functional Imaging of Materials, Oak Ridge National Laboratory, Oak Ridge, TN 37831, USA.|Materials Sciences and Technology Division, Oak Ridge National Laboratory, Oak Ridge, TN 37831, USA.
authors.forename: A R
authors.initials: AR
authors.lastname: Lupini