title: Mapping the electrostatic force field of single molecules from high-resolution scanning probe images.
abstract: How electronic charge is distributed over a molecule determines to a large extent its chemical properties. Here, we demonstrate how the electrostatic force field, originating from the inhomogeneous charge distribution in a molecule, can be measured with submolecular resolution. We exploit the fact that distortions typically observed in high-resolution atomic force microscopy images are for a significant part caused by the electrostatic force acting between charges of the tip and the molecule of interest. By finding a geometrical transformation between two high-resolution AFM images acquired with two different tips, the electrostatic force field or potential over individual molecules and self-assemblies thereof can be reconstructed with submolecular resolution.
authors.affiliation: Department of Thin Films and Nanostructures, Institute of Physics, Academy of Sciences of the Czech Republic, v.v.i., Cukrovarnická 10, 162 00 Prague, Czech Republic.
authors.forename: Prokop
authors.initials: P
authors.lastname: Hapala
authors.affiliation: Department of Thin Films and Nanostructures, Institute of Physics, Academy of Sciences of the Czech Republic, v.v.i., Cukrovarnická 10, 162 00 Prague, Czech Republic.
authors.forename: Martin
authors.initials: M
authors.lastname: Švec
authors.affiliation: Department of Thin Films and Nanostructures, Institute of Physics, Academy of Sciences of the Czech Republic, v.v.i., Cukrovarnická 10, 162 00 Prague, Czech Republic.
authors.forename: Oleksandr
authors.initials: O
authors.lastname: Stetsovych
authors.affiliation: Department of Chemistry, Condensed Matter and Interfaces, Debye Institute for Nanomaterials Science, Utrecht University, PO Box 80 000, 3508 TA Utrecht, The Netherlands.
authors.forename: Nadine J
authors.initials: NJ
authors.lastname: van der Heijden
authors.affiliation: Department of Thin Films and Nanostructures, Institute of Physics, Academy of Sciences of the Czech Republic, v.v.i., Cukrovarnická 10, 162 00 Prague, Czech Republic.
authors.forename: Martin
authors.initials: M
authors.lastname: Ondráček
authors.affiliation: Department of Chemistry, Condensed Matter and Interfaces, Debye Institute for Nanomaterials Science, Utrecht University, PO Box 80 000, 3508 TA Utrecht, The Netherlands.
authors.forename: Joost
authors.initials: J
authors.lastname: van der Lit
authors.affiliation: Department of Thin Films and Nanostructures, Institute of Physics, Academy of Sciences of the Czech Republic, v.v.i., Cukrovarnická 10, 162 00 Prague, Czech Republic.
authors.forename: Pingo
authors.initials: P
authors.lastname: Mutombo
authors.affiliation: Department of Chemistry, Condensed Matter and Interfaces, Debye Institute for Nanomaterials Science, Utrecht University, PO Box 80 000, 3508 TA Utrecht, The Netherlands.
authors.forename: Ingmar
authors.initials: I
authors.lastname: Swart
authors.affiliation: Department of Thin Films and Nanostructures, Institute of Physics, Academy of Sciences of the Czech Republic, v.v.i., Cukrovarnická 10, 162 00 Prague, Czech Republic.
authors.forename: Pavel
authors.initials: P
authors.lastname: Jelínek