title: Evaluation of a Wobbling Method Applied to Correcting Defective Pixels of CZT Detectors in SPECT Imaging.
abstract: In this paper, we propose a wobbling method to correct bad pixels in cadmium zinc telluride (CZT) detectors, using information of related images. We build up an automated device that realizes the wobbling correction for small animal Single Photon Emission Computed Tomography (SPECT) imaging. The wobbling correction method is applied to various constellations of defective pixels. The corrected images are compared with the results of conventional interpolation method, and the correction effectiveness is evaluated quantitatively using the factor of peak signal-to-noise ratio (PSNR) and structural similarity (SSIM). In summary, the proposed wobbling method, equipped with the automatic mechanical system, provides a better image quality for correcting defective pixels, which could be used for all pixelated detectors for molecular imaging.
authors.affiliation: Department of Biomedical Engineering, Peking University, No. 5, Yiheyuan Road, Beijing 100871, China. xiezhaoheng@163.com.
authors.forename: Zhaoheng
authors.initials: Z
authors.lastname: Xie
authors.affiliation: Department of Biomedical Engineering, Peking University, No. 5, Yiheyuan Road, Beijing 100871, China. lisuying90@163.com.
authors.forename: Suying
authors.initials: S
authors.lastname: Li
authors.affiliation: Department of Control Technology and Instrument, Hebei University, No. 180, Wusi East Road, Baoding 071000, China. yangkun9999@hotmail.com.
authors.forename: Kun
authors.initials: K
authors.lastname: Yang
authors.affiliation: General Hospital of Chinese People's Liberation Army, No. 28 Fuxing Road, Beijing 100039, China. xbx301@163.com.
authors.forename: Baixuan
authors.initials: B
authors.lastname: Xu
authors.affiliation: Department of Biomedical Engineering, Peking University, No. 5, Yiheyuan Road, Beijing 100871, China. renqsh@coe.pku.edu.cn.
authors.forename: Qiushi
authors.initials: Q
authors.lastname: Ren
keywords: CZT; calibration; defective points; semiconductor detector; wobbling method