title: Operando x-ray photoelectron emission microscopy for studying forward and reverse biased silicon p-n junctions.
abstract: Significant progress in the understanding of surfaces and interfaces of materials for new technologies requires operando studies, i.e., measurement of chemical, electronic, and magnetic properties under external stimulus (such as mechanical strain, optical illumination, or electric fields) applied in situ in order to approach real operating conditions. Electron microscopy attracts much interest, thanks to its ability to determine semiconductor doping at various scales in devices. Spectroscopic photoelectron emission microscopy (PEEM) is particularly powerful since it combines high spatial and energy resolution, allowing a comprehensive analysis of local work function, chemistry, and electronic structure using secondary, core level, and valence band electrons, respectively. Here we present the first operando spectroscopic PEEM study of a planar Si p-n junction under forward and reverse bias. The method can be used to characterize a vast range of materials at near device scales such as resistive oxides, conducting bridge memories and domain wall arrays in ferroelectrics photovoltaic devices.
authors.affiliation: SPEC, CEA, CNRS, Université Paris-Saclay, CEA Saclay, 91191 Gif-sur-Yvette Cedex, France.
authors.forename: N
authors.initials: N
authors.lastname: Barrett
authors.affiliation: SPEC, CEA, CNRS, Université Paris-Saclay, CEA Saclay, 91191 Gif-sur-Yvette Cedex, France.
authors.forename: D M
authors.initials: DM
authors.lastname: Gottlob
authors.affiliation: SPEC, CEA, CNRS, Université Paris-Saclay, CEA Saclay, 91191 Gif-sur-Yvette Cedex, France.
authors.forename: C
authors.initials: C
authors.lastname: Mathieu
authors.affiliation: SPEC, CEA, CNRS, Université Paris-Saclay, CEA Saclay, 91191 Gif-sur-Yvette Cedex, France.
authors.forename: C
authors.initials: C
authors.lastname: Lubin
authors.affiliation: SPEC, CEA, CNRS, Université Paris-Saclay, CEA Saclay, 91191 Gif-sur-Yvette Cedex, France.
authors.forename: J
authors.initials: J
authors.lastname: Passicousset
authors.affiliation: University Grenoble-Alpes, 38000 Grenoble, France and CEA, LETI, MINATEC Campus, 38054 Grenoble, France.
authors.forename: O
authors.initials: O
authors.lastname: Renault
authors.affiliation: University Grenoble-Alpes, 38000 Grenoble, France and CEA, LETI, MINATEC Campus, 38054 Grenoble, France.
authors.forename: E
authors.initials: E
authors.lastname: Martinez