title: Publisher's Note: "High sensitivity measurement system for the direct-current, capacitance-voltage, and gate-drain low frequency noise characterization of field effect transistors" [Rev. Sci. Instrum. 87, 044702 (2016)].
authors.affiliation: University of Messina, I-98166 Messina, Italy.
authors.forename: G
authors.initials: G
authors.lastname: Giusi
authors.affiliation: University of Messina, I-98166 Messina, Italy.
authors.forename: O
authors.initials: O
authors.lastname: Giordano
authors.affiliation: University of Messina, I-98166 Messina, Italy.
authors.forename: G
authors.initials: G
authors.lastname: Scandurra
authors.affiliation: IMM-CNR, I-00133 Rome, Italy.
authors.forename: M
authors.initials: M
authors.lastname: Rapisarda
authors.affiliation: IMM-CNR, I-00133 Rome, Italy.
authors.forename: S
authors.initials: S
authors.lastname: Calvi
authors.affiliation: University of Messina, I-98166 Messina, Italy.
authors.forename: C
authors.initials: C
authors.lastname: Ciofi