title: Ultrafast electron diffraction optimized for studying structural dynamics in thin films and monolayers.
abstract: A compact electron source specifically designed for time-resolved diffraction studies of free-standing thin films and monolayers is presented here. The sensitivity to thin samples is achieved by extending the established technique of ultrafast electron diffraction to the "medium" energy regime (1-10 kV). An extremely compact design, in combination with low bunch charges, allows for high quality diffraction in a lensless geometry. The measured and simulated characteristics of the experimental system reveal sub-picosecond temporal resolution, while demonstrating the ability to produce high quality diffraction patterns from atomically thin samples.
authors.affiliation: Max Planck Institute for the Structure and Dynamics of Matter, Hamburg Centre for Ultrafast Imaging, Department of Physics, University of Hamburg , Luruper Chaussee 149, Hamburg 22761, Germany.
authors.forename: D S
authors.initials: DS
authors.lastname: Badali
authors.affiliation: Max Planck Institute for the Structure and Dynamics of Matter, Hamburg Centre for Ultrafast Imaging, Department of Physics, University of Hamburg , Luruper Chaussee 149, Hamburg 22761, Germany.
authors.forename: R Y N
authors.initials: RY
authors.lastname: Gengler
authors.forename: R J D
authors.initials: RJ
authors.lastname: Miller