A Noise Reduction Method for Dual-Mass Micro-Electromechanical Gyroscopes Based on Sample Entropy Empirical Mode Decomposition and Time-Frequency Peak Filtering.
The different noise components in a dual-mass micro-electromechanical system (MEMS) gyroscope structure is analyzed in this paper, including mechanical-thermal noise (MTN), electronic-thermal noise (ETN), flicker noise (FN) and Coriolis signal in-phase noise (IPN). The structure equivalent electronic model is established, and an improved white Gaussian noise reduction method for dual-mass MEMS gyroscopes is proposed which is based on sample entropy empirical mode decomposition (SEEMD) and time-frequency peak filtering (TFPF). There is a contradiction in TFPS, i.e., selecting a short window length may lead to good preservation of signal amplitude but bad random noise reduction, whereas selecting a long window length may lead to serious attenuation of the signal amplitude but effective random noise reduction. In order to achieve a good tradeoff between valid signal amplitude preservation and random noise reduction, SEEMD is adopted to improve TFPF. Firstly, the original signal is decomposed into intrinsic mode functions (IMFs) by EMD, and the SE of each IMF is calculated in order to classify the numerous IMFs into three different components; then short window TFPF is employed for low frequency component of IMFs, and long window TFPF is employed for high frequency component of IMFs, and the noise component of IMFs is wiped off directly; at last the final signal is obtained after reconstruction. Rotation experimental and temperature experimental are carried out to verify the proposed SEEMD-TFPF algorithm, the verification and comparison results show that the de-noising performance of SEEMD-TFPF is better than that achievable with the traditional wavelet, Kalman filter and fixed window length TFPF methods.
National Key Laboratory for Electronic Measurement Technology, Key Laboratory of Instrumentation Science &amp; Dynamic Measurement, Ministry of Education, School of Instrument and Electronics, North University of China, Taiyuan 030051, China. shenchong86@163.com.
Chong
C
Shen
National Key Laboratory for Electronic Measurement Technology, Key Laboratory of Instrumentation Science &amp; Dynamic Measurement, Ministry of Education, School of Instrument and Electronics, North University of China, Taiyuan 030051, China. lijie@nuc.edu.cn.
Jie
J
Li
National Key Laboratory for Electronic Measurement Technology, Key Laboratory of Instrumentation Science &amp; Dynamic Measurement, Ministry of Education, School of Instrument and Electronics, North University of China, Taiyuan 030051, China. zxm_auto@nuc.edu.cn.
Xiaoming
X
Zhang
National Key Laboratory for Electronic Measurement Technology, Key Laboratory of Instrumentation Science &amp; Dynamic Measurement, Ministry of Education, School of Instrument and Electronics, North University of China, Taiyuan 030051, China. shiyunbo@nuc.edu.cn.
Yunbo
Y
Shi
National Key Laboratory for Electronic Measurement Technology, Key Laboratory of Instrumentation Science &amp; Dynamic Measurement, Ministry of Education, School of Instrument and Electronics, North University of China, Taiyuan 030051, China. tangjun16@126.com.
Jun
J
Tang
National Key Laboratory for Electronic Measurement Technology, Key Laboratory of Instrumentation Science &amp; Dynamic Measurement, Ministry of Education, School of Instrument and Electronics, North University of China, Taiyuan 030051, China. caohuiliang@nuc.edu.cn.
Huiliang
H
Cao
National Key Laboratory for Electronic Measurement Technology, Key Laboratory of Instrumentation Science &amp; Dynamic Measurement, Ministry of Education, School of Instrument and Electronics, North University of China, Taiyuan 030051, China. liuj@nuc.edu.cn.
Jun
J
Liu
dual-mass MEMS gyroscope; empirical mode decomposition; noise reduction; sample entropy; time-frequency peak filtering