title: Direct Measurement of the Electron Energy Relaxation Dynamics in Metallic Wires.
abstract: We present measurements of the dynamical response of thermal noise to an ac excitation in conductors at low temperature. From the frequency dependence of this response function-the (noise) thermal impedance-in the range 1 kHz-1 GHz we obtain direct determinations of the inelastic relaxation times relevant in metallic wires at low temperature: the electron-phonon scattering time and the diffusion time of electrons along the wires. Combining these results with that of resistivity provides a measurement of heat capacity of samples made of thin film. The simplicity and reliability of this technique makes it very promising for future applications in other systems.
authors.affiliation: Département de Physique, Université de Sherbrooke, Sherbrooke, Québec J1K 2R1, Canada.
authors.forename: Edouard
authors.initials: E
authors.lastname: Pinsolle
authors.affiliation: Département de Physique, Université de Sherbrooke, Sherbrooke, Québec J1K 2R1, Canada.
authors.forename: Alexandre
authors.initials: A
authors.lastname: Rousseau
authors.affiliation: Département de Physique, Université de Sherbrooke, Sherbrooke, Québec J1K 2R1, Canada.
authors.forename: Christian
authors.initials: C
authors.lastname: Lupien
authors.affiliation: Département de Physique, Université de Sherbrooke, Sherbrooke, Québec J1K 2R1, Canada.
authors.forename: Bertrand
authors.initials: B
authors.lastname: Reulet