title: Length-extension resonator as a force sensor for high-resolution frequency-modulation atomic force microscopy in air.
abstract: Frequency-modulation atomic force microscopy has turned into a well-established method to obtain atomic resolution on flat surfaces, but is often limited to ultra-high vacuum conditions and cryogenic temperatures. Measurements under ambient conditions are influenced by variations of the dew point and thin water layers present on practically every surface, complicating stable imaging with high resolution. We demonstrate high-resolution imaging in air using a length-extension resonator operating at small amplitudes. An additional slow feedback compensates for changes in the free resonance frequency, allowing stable imaging over a long period of time with changing environmental conditions.
authors.affiliation: Nanotechnology Group, ETH Zürich, Säumerstrasse 4, 8803 Rüschlikon, Switzerland.
authors.forename: Hannes
authors.initials: H
authors.lastname: Beyer
authors.affiliation: Nanotechnology Group, ETH Zürich, Säumerstrasse 4, 8803 Rüschlikon, Switzerland.
authors.forename: Tino
authors.initials: T
authors.lastname: Wagner
authors.affiliation: Nanotechnology Group, ETH Zürich, Säumerstrasse 4, 8803 Rüschlikon, Switzerland.
authors.forename: Andreas
authors.initials: A
authors.lastname: Stemmer
keywords: ambient conditions; drift compensation; frequency-modulation atomic force microscopy; high-resolution; length-extension resonator