title: Oxygen octahedra picker: A software tool to extract quantitative information from STEM images.
abstract: In perovskite oxide based materials and hetero-structures there are often strong correlations between oxygen octahedral distortions and functionality. Thus, atomistic understanding of the octahedral distortion, which requires accurate measurements of atomic column positions, will greatly help to engineer their properties. Here, we report the development of a software tool to extract quantitative information of the lattice and of BO6 octahedral distortions from STEM images. Center-of-mass and 2D Gaussian fitting methods are implemented to locate positions of individual atom columns. The precision of atomic column distance measurements is evaluated on both simulated and experimental images. The application of the software tool is demonstrated using practical examples.
authors.affiliation: Stuttgart Center for Electron Microscopy, Max Planck Institute for Solid State Research, Heisenbergstr. 1, 70569 Stuttgart, Germany. Electronic address: y.wang@fkf.mpg.de.
authors.forename: Yi
authors.initials: Y
authors.lastname: Wang
authors.affiliation: Stuttgart Center for Electron Microscopy, Max Planck Institute for Solid State Research, Heisenbergstr. 1, 70569 Stuttgart, Germany.
authors.forename: Ute
authors.initials: U
authors.lastname: Salzberger
authors.affiliation: Stuttgart Center for Electron Microscopy, Max Planck Institute for Solid State Research, Heisenbergstr. 1, 70569 Stuttgart, Germany.
authors.forename: Wilfried
authors.initials: W
authors.lastname: Sigle
authors.affiliation: Stuttgart Center for Electron Microscopy, Max Planck Institute for Solid State Research, Heisenbergstr. 1, 70569 Stuttgart, Germany.
authors.forename: Y
authors.initials: Y
authors.lastname: Eren Suyolcu
authors.affiliation: Stuttgart Center for Electron Microscopy, Max Planck Institute for Solid State Research, Heisenbergstr. 1, 70569 Stuttgart, Germany.
authors.forename: Peter A
authors.initials: PA
authors.lastname: van Aken
keywords: Annular bright-field (ABF) imaging; Atomic column locating; BO(6) octahedral distortion; Quantitative STEM image analysis