title: A mechanism of basal spacing reduction in sodium smectitic clay materials in contact with DNAPL wastes.
abstract: There has been concern regarding the possible attack of clays in aquitards, slurry walls and landfill liners by dense nonaqueous phase liquid (DNAPL) wastes, resulting in cracking. Despite the fact that a reduction in basal spacing in sodium smectitic clay materials has been linked to cracking, no plausible mechanism by which this reduction occurs in contact with waste DNAPLs has been formulated. To elucidate a mechanism, screening studies were conducted that showed that the combination of an anionic surfactant (AOT), a nonionic surfactant (TritonX-100) and a chlorinated solvent, tetrachloroethylene (PCE), could replicate the basal spacing reduction and cracking behavior of water-saturated bentonite caused by two waste DNAPLs obtained from the field. FTIR measurements of this system showed a displacement of the HOH bending band of water symptomatic of desiccation. Sorption measurements showed that the uptake of AOT by bentonite increased eight fold in the presence of TritonX-100 and PCE. The evidence presented here supports a mechanism of syneresis, involving the extraction of water from the interlayer space of the clay through the synergistic sorption of a nonionic and anionic surfactant mixture. It is speculated that the solvation of water in reverse micellar aggregates is the process driving the syneresis.
authors.affiliation: Department of Civil and Environmental Engineering, University of Michigan, Ann Arbor, MI 48109-2125, USA.
authors.forename: Derya
authors.initials: D
authors.lastname: Ayral-Cinar
authors.affiliation: Department of Civil and Environmental Engineering, University of Michigan, Ann Arbor, MI 48109-2125, USA.
authors.forename: Margarita
authors.initials: M
authors.lastname: Otero-Diaz
authors.affiliation: Department of Civil and Environmental Engineering, University of Michigan, Ann Arbor, MI 48109-2125, USA. Electronic address: averyd@umich.edu.
authors.forename: Avery H
authors.initials: AH
authors.lastname: Demond
mesh_terms: D000538:Aluminum Silicates / Q000737:chemistry*; D001546:Bentonite / Q000737:chemistry; D000077215:Clay; D017640:Silicates / Q000737:chemistry*; D012964:Sodium; D012997:Solvents; D013501:Surface-Active Agents / Q000737:chemistry; D013750:Tetrachloroethylene / Q000737:chemistry; D064091:Waste Disposal Facilities; D014866:Waste Products / Q000009:adverse effects*; D014867:Water / Q000737:chemistry; D014874:Water Pollutants, Chemical / Q000032:analysis
chemical_list: D000538:Aluminum Silicates; D017640:Silicates; D012997:Solvents; D013501:Surface-Active Agents; D014866:Waste Products; D014874:Water Pollutants, Chemical; D014867:Water; D001546:Bentonite; D012964:Sodium; C033214:Smectite; D000077215:Clay; D013750:Tetrachloroethylene
keywords: Clay; Cracking; DNAPL; Hazardous waste; Surfactant; Syneresis