title: Effects of Curved Wavefronts on Conductor-Backed Reflection-Only Free-Space Material Characterization Techniques.
abstract: A true plane wave is often not physically realizable in a laboratory environment. Therefore, wavefront curvature introduces a form of systematic error into Free-space material characterization methods. Free-space material characterization is important to the determination of the electric permittivity and magnetic permeability of conductor-backed and in situ materials. This paper performs an error analysis of the impact on wavefront curvature on a Free-space method called the two-thickness method. This paper compares the extracted electric and magnetic permeability computed with a plane wave versus a line source for a low-loss dielectric and magnetic radar absorbing material. These steps are conducted for TE and TM plane waves and electric and magnetic line sources.
authors.affiliation: Loyola University Maryland, Baltimore, MD 21210, USA.
authors.forename: Raenita A
authors.initials: RA
authors.lastname: Fenner
authors.affiliation: Michigan State University, East Lansing, MI 48824, USA.
authors.forename: Edward J
authors.initials: EJ
authors.lastname: Rothwell