title: Instrumentation for Reliably Determining Porous Silicon Photoluminescence Responses to Gaseous Analyte Vapors.
abstract: We report new instrumentation for rapidly and reliably measuring the temperature-dependent photoluminescence response from porous silicon as a function of analyte vapor concentration. The new system maintains the porous silicon under inert conditions and it allows on-the-fly steady-state and time-resolved photoluminescence intensity and hyper-spectral measurements between 293 K and 450 K. The new system yields reliable data at least 100-fold faster in comparison to previous instrument platforms.
authors.affiliation: Department of Chemistry, Erie Community College, USA.
authors.forename: Justin M
authors.initials: JM
authors.lastname: Reynard
authors.affiliation: KIK Custom Products, New York, USA.
authors.forename: Nathan S
authors.initials: NS
authors.lastname: Van Gorder
authors.affiliation: Lenape Valley Regional High School, USA.
authors.forename: Caley A
authors.initials: CA
authors.lastname: Richardson
authors.affiliation: Department of Chemistry, SUNY-Buffalo, USA.
authors.forename: Richie D
authors.initials: RD
authors.lastname: Eriacho
authors.affiliation: Department of Chemistry, SUNY-Buffalo, USA chefvb@buffalo.edu.
authors.forename: Frank V
authors.initials: FV
authors.lastname: Bright
keywords: Porous silicon; Stern–Volmer quenching; photoluminescence; temperature dependence