title: Te inclusion-induced electrical field perturbation in CdZnTe single crystals revealed by Kelvin probe force microscopy.
abstract: To understand the effects of tellurium (Te) inclusions on the device performance of CdZnTe radiation detectors, the perturbation of the electrical field in and around Te inclusions was studied in CdZnTe single crystals via Kelvin probe force microscopy (KPFM). Te inclusions were proved to act as lower potential centers with respect to surrounding CdZnTe matrix. Based on the KPFM results, the energy band diagram at the Te/CdZnTe interface was established, and the bias-dependent effects of Te inclusion on carrier transportation is discussed.
authors.affiliation: State Key Laboratory of Solidification Processing, School of Materials Science and Engineering, Northwestern Polytechnical University, Xi'an 710072, PR China; Key Laboratory of Radiation Detection Materials and Devices of Ministry of Industry and Information Technology, Northwestern Polytechnical University, Xi'an 710072, PR China.
authors.forename: Yaxu
authors.initials: Y
authors.lastname: Gu
authors.affiliation: State Key Laboratory of Solidification Processing, School of Materials Science and Engineering, Northwestern Polytechnical University, Xi'an 710072, PR China; Key Laboratory of Radiation Detection Materials and Devices of Ministry of Industry and Information Technology, Northwestern Polytechnical University, Xi'an 710072, PR China. Electronic address: jwq@nwpu.edu.cn.
authors.forename: Wanqi
authors.initials: W
authors.lastname: Jie
authors.affiliation: Multidisciplinary Material Research Center, Frontier Institute of Science and Technology, Xi'an Jiaotong University, Xi'an 710049, PR China.
authors.forename: Linglong
authors.initials: L
authors.lastname: Li
authors.affiliation: State Key Laboratory of Solidification Processing, School of Materials Science and Engineering, Northwestern Polytechnical University, Xi'an 710072, PR China; Key Laboratory of Radiation Detection Materials and Devices of Ministry of Industry and Information Technology, Northwestern Polytechnical University, Xi'an 710072, PR China. Electronic address: xyd220@nwpu.edu.cn.
authors.forename: Yadong
authors.initials: Y
authors.lastname: Xu
authors.affiliation: Multidisciplinary Material Research Center, Frontier Institute of Science and Technology, Xi'an Jiaotong University, Xi'an 710049, PR China.
authors.forename: Yaodong
authors.initials: Y
authors.lastname: Yang
authors.affiliation: State Key Laboratory of Solidification Processing, School of Materials Science and Engineering, Northwestern Polytechnical University, Xi'an 710072, PR China.
authors.forename: Jie
authors.initials: J
authors.lastname: Ren
authors.affiliation: State Key Laboratory of Solidification Processing, School of Materials Science and Engineering, Northwestern Polytechnical University, Xi'an 710072, PR China; Key Laboratory of Radiation Detection Materials and Devices of Ministry of Industry and Information Technology, Northwestern Polytechnical University, Xi'an 710072, PR China.
authors.forename: Gangqiang
authors.initials: G
authors.lastname: Zha
authors.affiliation: State Key Laboratory of Solidification Processing, School of Materials Science and Engineering, Northwestern Polytechnical University, Xi'an 710072, PR China; Key Laboratory of Radiation Detection Materials and Devices of Ministry of Industry and Information Technology, Northwestern Polytechnical University, Xi'an 710072, PR China.
authors.forename: Tao
authors.initials: T
authors.lastname: Wang
authors.affiliation: State Key Laboratory of Solidification Processing, School of Materials Science and Engineering, Northwestern Polytechnical University, Xi'an 710072, PR China; Key Laboratory of Radiation Detection Materials and Devices of Ministry of Industry and Information Technology, Northwestern Polytechnical University, Xi'an 710072, PR China.
authors.forename: Lingyan
authors.initials: L
authors.lastname: Xu
authors.affiliation: State Key Laboratory of Solidification Processing, School of Materials Science and Engineering, Northwestern Polytechnical University, Xi'an 710072, PR China; Key Laboratory of Radiation Detection Materials and Devices of Ministry of Industry and Information Technology, Northwestern Polytechnical University, Xi'an 710072, PR China.
authors.forename: Yihui
authors.initials: Y
authors.lastname: He
authors.affiliation: State Key Laboratory of Solidification Processing, School of Materials Science and Engineering, Northwestern Polytechnical University, Xi'an 710072, PR China; Key Laboratory of Radiation Detection Materials and Devices of Ministry of Industry and Information Technology, Northwestern Polytechnical University, Xi'an 710072, PR China.
authors.forename: Shouzhi
authors.initials: S
authors.lastname: Xi
keywords: Bias dependent; CdZnTe; Electrical property; Kelvin probe force microscopy; Te inclusion