title: Fundamental Parameters Line Profile Fitting in Laboratory Diffractometers.
abstract: The fundamental parameters approach to line profile fitting uses physically based models to generate the line profile shapes. Fundamental parameters profile fitting (FPPF) has been used to synthesize and fit data from both parallel beam and divergent beam diffractometers. The refined parameters are determined by the diffractometer configuration. In a divergent beam diffractometer these include the angular aperture of the divergence slit, the width and axial length of the receiving slit, the angular apertures of the axial Soller slits, the length and projected width of the x-ray source, the absorption coefficient and axial length of the sample. In a parallel beam system the principal parameters are the angular aperture of the equatorial analyser/Soller slits and the angular apertures of the axial Soller slits. The presence of a monochromator in the beam path is normally accommodated by modifying the wavelength spectrum and/or by changing one or more of the axial divergence parameters. Flat analyzer crystals have been incorporated into FPPF as a Lorentzian shaped angular acceptance function. One of the intrinsic benefits of the fundamental parameters approach is its adaptability any laboratory diffractometer. Good fits can normally be obtained over the whole 20 range without refinement using the known properties of the diffractometer, such as the slit sizes and diffractometer radius, and emission profile.
authors.affiliation: University of Technology Sydney, Broadway, Sydney, NSW, Australia 2007.
authors.forename: R W
authors.initials: RW
authors.lastname: Cheary
authors.affiliation: Bruker-AXS, Östliche Rheinbrückenstraβe 50, D-76187 Karlsruhe, Germany.
authors.forename: A A
authors.initials: AA
authors.lastname: Coelho
authors.affiliation: National Institute of Standards and Technology, Gaithersburg, MD 20899-8523.
authors.forename: J P
authors.initials: JP
authors.lastname: Cline
keywords: fundamental parameters; microstructure analysis; parafocusing optics; profile convolution; profile fitting; x-ray powder diffraction