title: Local coexistence of VO2 phases revealed by deep data analysis.
abstract: We report a synergistic approach of micro-Raman spectroscopic mapping and deep data analysis to study the distribution of crystallographic phases and ferroelastic domains in a defected Al-doped VO2 microcrystal. Bayesian linear unmixing revealed an uneven distribution of the T phase, which is stabilized by the surface defects and uneven local doping that went undetectable by other classical analysis techniques such as PCA and SIMPLISMA. This work demonstrates the impact of information recovery via statistical analysis and full mapping in spectroscopic studies of vanadium dioxide systems, which is commonly substituted by averaging or single point-probing approaches, both of which suffer from information misinterpretation due to low resolving power.
authors.affiliation: Institute for Functional Imaging of Materials and Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831, United States.|Center for Nanoscale Science and Technology, National Institute of Standards and Technology, Gaithersburg, MD 20899, USA.|Maryland Nanocenter, University of Maryland, College Park, MD 20742, USA.
authors.forename: Evgheni
authors.initials: E
authors.lastname: Strelcov
authors.affiliation: Institute for Functional Imaging of Materials and Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831, United States.
authors.forename: Anton
authors.initials: A
authors.lastname: Ievlev
authors.affiliation: Institute for Functional Imaging of Materials and Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831, United States.
authors.forename: Alex
authors.initials: A
authors.lastname: Belianinov
authors.affiliation: Institute for Functional Imaging of Materials and Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831, United States.
authors.forename: Alexander
authors.initials: A
authors.lastname: Tselev
authors.affiliation: Center for Nanoscale Science and Technology, National Institute of Standards and Technology, Gaithersburg, MD 20899, USA.
authors.forename: Andrei
authors.initials: A
authors.lastname: Kolmakov
authors.affiliation: Institute for Functional Imaging of Materials and Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831, United States.
authors.forename: Sergei V
authors.initials: SV
authors.lastname: Kalinin