title: Accurate measurement of Seebeck coefficient.
abstract: In this work, it was investigated how to measure Seebeck coefficient accurately. The offset voltages, between the specimen and measurement wires, might influence the results measured significantly and should be eliminated during measuring process. They do not depend on temperature difference but on temperature and include two parts: the intrinsic component related to the materials and the random one related to the contact. The inversion method could eliminate the offset voltages more accurately than the traditional differential methods, and thus measure Seebeck coefficient more accurately. The accuracy of Seebeck coefficient measurement could be further improved by performing a proper temperature difference, optimizing temperature control, and using an electromagnetic screen. The most accurate results were obtained with a standard deviation of 0.06 μV/K, measured under temperature difference of 1 K, temperature variation of 0.002 K, and with an iron electromagnetic screen.
authors.affiliation: State Key Laboratory of Crystal Materials, Shandong University, Jinan 250100, People's Republic of China.
authors.forename: Jian
authors.initials: J
authors.lastname: Liu
authors.affiliation: School of Physics, Shandong University, Jinan 250100, People's Republic of China.
authors.forename: Yacui
authors.initials: Y
authors.lastname: Zhang
authors.affiliation: School of Physics, Shandong University, Jinan 250100, People's Republic of China.
authors.forename: Zhen
authors.initials: Z
authors.lastname: Wang
authors.affiliation: School of Physics, Shandong University, Jinan 250100, People's Republic of China.
authors.forename: Maokui
authors.initials: M
authors.lastname: Li
authors.affiliation: School of Physics, Shandong University, Jinan 250100, People's Republic of China.
authors.forename: Wenbin
authors.initials: W
authors.lastname: Su
authors.affiliation: School of Physics, Shandong University, Jinan 250100, People's Republic of China.
authors.forename: Minglei
authors.initials: M
authors.lastname: Zhao
authors.affiliation: Department of Physics, Xiamen University, Xiamen 361005, People's Republic of China.
authors.forename: Shengli
authors.initials: S
authors.lastname: Huang
authors.affiliation: State Key Laboratory of Crystal Materials, Shandong University, Jinan 250100, People's Republic of China.
authors.forename: Shengqing
authors.initials: S
authors.lastname: Xia
authors.affiliation: State Key Laboratory of Crystal Materials, Shandong University, Jinan 250100, People's Republic of China.
authors.forename: Chunlei
authors.initials: C
authors.lastname: Wang