title: Depth enhancement in spectral domain optical coherence tomography using bidirectional imaging modality with a single spectrometer.
abstract: A method for depth enhancement is presented using a bidirectional imaging modality for spectral domain optical coherence tomography (SD-OCT). Two precisely aligned sample arms along with two reference arms were utilized in the optical configuration to scan the samples. Using exemplary images of the optical resolution target, Scotch tape, a silicon sheet with two needles, and a leaf, we demonstrated how the developed bidirectional SD-OCT imaging method increases the ability to characterize depth-enhanced images. The results of the developed system were validated by comparing the images with the standard OCT configuration (single-sample arm setup). Given the advantages of higher resolution and the ability to visualize deep morphological structures, this method can be utilized to increase the depth dependent fall-off in samples with limited thickness. Thus, the proposed bidirectional imaging modality is apt for cross-sectional imaging of entire samples, which has the potential capability to improve the diagnostic ability.
authors.affiliation: Kyungpook National University, School of Electronics Engineering, College of IT Engineering, 80 Daehak-ro, Buk-gu, Daegu 41566, Republic of Korea.
authors.forename: Naresh Kumar
authors.initials: NK
authors.lastname: Ravichandran
authors.affiliation: Kyungpook National University, School of Electronics Engineering, College of IT Engineering, 80 Daehak-ro, Buk-gu, Daegu 41566, Republic of Korea.
authors.forename: Ruchire Eranga
authors.initials: RE
authors.lastname: Wijesinghe
authors.affiliation: Kyungpook National University, School of Electronics Engineering, College of IT Engineering, 80 Daehak-ro, Buk-gu, Daegu 41566, Republic of Korea.
authors.forename: Muhammad Faizan
authors.initials: MF
authors.lastname: Shirazi
authors.affiliation: Kyungpook National University, School of Electronics Engineering, College of IT Engineering, 80 Daehak-ro, Buk-gu, Daegu 41566, Republic of Korea.
authors.forename: Kibeom
authors.initials: K
authors.lastname: Park
authors.affiliation: Kyungpook National University, School of Electronics Engineering, College of IT Engineering, 80 Daehak-ro, Buk-gu, Daegu 41566, Republic of Korea.
authors.forename: Mansik
authors.initials: M
authors.lastname: Jeon
authors.affiliation: Ulsan National Institute of Science and Technology, Department of Biomedical Engineering, 50 UNIST-gil, Ulsan 44919, Republic of Korea.
authors.forename: Woonggyu
authors.initials: W
authors.lastname: Jung
authors.affiliation: Kyungpook National University, School of Electronics Engineering, College of IT Engineering, 80 Daehak-ro, Buk-gu, Daegu 41566, Republic of Korea.
authors.forename: Jeehyun
authors.initials: J
authors.lastname: Kim
mesh_terms: D012031:Refractometry; D015203:Reproducibility of Results; D041623:Tomography, Optical Coherence / Q000295:instrumentation / Q000379:methods*