title: Study on the bias-dependent effects of proton-induced damage in CdZnTe radiation detectors using ion beam induced charge microscopy.
abstract: The influence of damage induced by 2MeV protons on CdZnTe radiation detectors is investigated using ion beam induced charge (IBIC) microscopy. Charge collection efficiency (CCE) in irradiated region is found to be degraded above a fluence of 3.3×10(11)p/cm(2) and the energy spectrum is severely deteriorated with increasing fluence. Moreover, CCE maps obtained under the applied biases from 50V to 400V suggests that local radiation damage results in significant degradation of CCE uniformity, especially under low bias, i. e., 50V and 100V. The CCE nonuniformity induced by local radiation damage, however, can be greatly improved by increasing the detector applied bias. This bias-dependent effect of 2MeV proton-induced radiation damage in CdZnTe detectors is attributed to the interaction of electron cloud and radiation-induced displacement defects.
authors.affiliation: State Key Laboratory of Solidification Processing, School of Materials Science and Engineering, Northwestern Polytechnical University, Xi'an, 710072, PR China; Key Laboratory of Radiation Detection Materials and Devices of Ministry of Industry and Information Technology, Northwestern Polytechnical University, Xi'an 710072, PR China.
authors.forename: Yaxu
authors.initials: Y
authors.lastname: Gu
authors.affiliation: State Key Laboratory of Solidification Processing, School of Materials Science and Engineering, Northwestern Polytechnical University, Xi'an, 710072, PR China; Key Laboratory of Radiation Detection Materials and Devices of Ministry of Industry and Information Technology, Northwestern Polytechnical University, Xi'an 710072, PR China. Electronic address: jwq@nwpu.edu.cn.
authors.forename: Wanqi
authors.initials: W
authors.lastname: Jie
authors.affiliation: Applied Ion Beam Physics Laboratory, Institute of Modern Physics, Fudan University, Shanghai 200433, PR China.
authors.forename: Caicai
authors.initials: C
authors.lastname: Rong
authors.affiliation: State Key Laboratory of Solidification Processing, School of Materials Science and Engineering, Northwestern Polytechnical University, Xi'an, 710072, PR China; Key Laboratory of Radiation Detection Materials and Devices of Ministry of Industry and Information Technology, Northwestern Polytechnical University, Xi'an 710072, PR China.
authors.forename: Lingyan
authors.initials: L
authors.lastname: Xu
authors.affiliation: State Key Laboratory of Solidification Processing, School of Materials Science and Engineering, Northwestern Polytechnical University, Xi'an, 710072, PR China; Key Laboratory of Radiation Detection Materials and Devices of Ministry of Industry and Information Technology, Northwestern Polytechnical University, Xi'an 710072, PR China.
authors.forename: Yadong
authors.initials: Y
authors.lastname: Xu
authors.affiliation: Applied Ion Beam Physics Laboratory, Institute of Modern Physics, Fudan University, Shanghai 200433, PR China.
authors.forename: Haoyan
authors.initials: H
authors.lastname: Lv
authors.affiliation: Applied Ion Beam Physics Laboratory, Institute of Modern Physics, Fudan University, Shanghai 200433, PR China.
authors.forename: Hao
authors.initials: H
authors.lastname: Shen
authors.affiliation: Materials Research Center, Institute of Modern Physics, Chinese Academy of Sciences, Lanzhou 730000, PR China.
authors.forename: Guanghua
authors.initials: G
authors.lastname: Du
authors.affiliation: Applied Ion Beam Physics Laboratory, Institute of Modern Physics, Fudan University, Shanghai 200433, PR China. Electronic address: 15110200003@fudan.edu.cn.
authors.forename: Na
authors.initials: N
authors.lastname: Guo
authors.affiliation: State Key Laboratory of Solidification Processing, School of Materials Science and Engineering, Northwestern Polytechnical University, Xi'an, 710072, PR China; Key Laboratory of Radiation Detection Materials and Devices of Ministry of Industry and Information Technology, Northwestern Polytechnical University, Xi'an 710072, PR China.
authors.forename: Rongrong
authors.initials: R
authors.lastname: Guo
authors.affiliation: State Key Laboratory of Solidification Processing, School of Materials Science and Engineering, Northwestern Polytechnical University, Xi'an, 710072, PR China; Key Laboratory of Radiation Detection Materials and Devices of Ministry of Industry and Information Technology, Northwestern Polytechnical University, Xi'an 710072, PR China.
authors.forename: Gangqiang
authors.initials: G
authors.lastname: Zha
authors.affiliation: State Key Laboratory of Solidification Processing, School of Materials Science and Engineering, Northwestern Polytechnical University, Xi'an, 710072, PR China; Key Laboratory of Radiation Detection Materials and Devices of Ministry of Industry and Information Technology, Northwestern Polytechnical University, Xi'an 710072, PR China.
authors.forename: Tao
authors.initials: T
authors.lastname: Wang
authors.affiliation: State Key Laboratory of Solidification Processing, School of Materials Science and Engineering, Northwestern Polytechnical University, Xi'an, 710072, PR China; Key Laboratory of Radiation Detection Materials and Devices of Ministry of Industry and Information Technology, Northwestern Polytechnical University, Xi'an 710072, PR China.
authors.forename: Shouzhi
authors.initials: S
authors.lastname: Xi
keywords: Bias dependent; CdZnTe; Ion beam induced charge microscopy; Proton; Radiation damage