title: Combining combing and secondary ion mass spectrometry to study DNA on chips using (13)C and (15)N labeling.
abstract: Dynamic secondary ion mass spectrometry ( D-SIMS) imaging of combed DNA - the combing, imaging by SIMS or CIS method - has been developed previously using a standard NanoSIMS 50 to reveal, on the 50 nm scale, individual DNA fibers labeled with different, non-radioactive isotopes in vivo and to quantify these isotopes. This makes CIS especially suitable for determining the times, places and rates of DNA synthesis as well as the detection of the fine-scale re-arrangements of DNA and of molecules associated with combed DNA fibers. Here, we show how CIS may be extended to (13)C-labeling via the detection and quantification of the (13)C (14)N (-) recombinant ion and the use of the (13)C: (12)C ratio, we discuss how CIS might permit three successive labels, and we suggest ideas that might be explored using CIS.
authors.affiliation: Equipe AMMIS, laboratoire MERCI EA 3829, faculté des Sciences et Techniques, University of Rouen, Mont-Saint-Aignan Cedex, France.
authors.forename: Armelle
authors.initials: A
authors.lastname: Cabin-Flaman
authors.affiliation: Equipe AMMIS, laboratoire MERCI EA 3829, faculté des Sciences et Techniques, University of Rouen, Mont-Saint-Aignan Cedex, France.
authors.forename: Anne-Francoise
authors.initials: AF
authors.lastname: Monnier
authors.affiliation: Institute of Electronics, Microelectronics and Nanotechnology (IEMN), UMR CNRS 8520, Lille1 University, Villeneuve d'Ascq, France.
authors.forename: Yannick
authors.initials: Y
authors.lastname: Coffinier
authors.affiliation: Material Research & Technology Department (MRT), Luxembourg Institute of Science and Technology (LIST), Belvaux, Luxembourg.
authors.forename: Jean-Nicolas
authors.initials: JN
authors.lastname: Audinot
authors.affiliation: Equipe AMMIS, laboratoire MERCI EA 3829, faculté des Sciences et Techniques, University of Rouen, Mont-Saint-Aignan Cedex, France.
authors.forename: David
authors.initials: D
authors.lastname: Gibouin
authors.affiliation: Material Research & Technology Department (MRT), Luxembourg Institute of Science and Technology (LIST), Belvaux, Luxembourg.
authors.forename: Tom
authors.initials: T
authors.lastname: Wirtz
authors.affiliation: Institute of Electronics, Microelectronics and Nanotechnology (IEMN), UMR CNRS 8520, Lille1 University, Villeneuve d'Ascq, France.
authors.forename: Rabah
authors.initials: R
authors.lastname: Boukherroub
authors.affiliation: Material Research & Technology Department (MRT), Luxembourg Institute of Science and Technology (LIST), Belvaux, Luxembourg.
authors.forename: Henri-Noël
authors.initials: HN
authors.lastname: Migeon
authors.affiliation: Genomic Vision, Bagneux, France.
authors.forename: Aaron
authors.initials: A
authors.lastname: Bensimon
authors.affiliation: iSSB, Génopole, CNRS, UEVE, Université Paris-Saclay, Evry, France.
authors.forename: Laurent
authors.initials: L
authors.lastname: Jannière
authors.affiliation: Equipe AMMIS, laboratoire MERCI EA 3829, faculté des Sciences et Techniques, University of Rouen, Mont-Saint-Aignan Cedex, France.
authors.forename: Camille
authors.initials: C
authors.lastname: Ripoll
authors.affiliation: Laboratory Microbiology Signals and Environment EA4312, Department of Biology, University of Rouen, Mont-Saint-Aignan Cedex, France.
authors.forename: Victor
authors.initials: V
authors.lastname: Norris
keywords: DNA extraction; DNA isotope labeling; PCR; isotope recombination; silicon chip; surface coating