title: Microstrain distribution mapping on CuInSe2 thin films by means of electron backscatter diffraction, X-ray diffraction, and Raman microspectroscopy.
abstract: The investigation of the microstructure in functional, polycrystalline thin films is an important contribution to the enhanced understanding of structure-property relationships in corresponding devices. Linear and planar defects within individual grains may affect substantially the performance of the device. These defects are closely related to strain distributions. The present work compares electron and X-ray diffraction as well as Raman microspectroscopy, which provide access to microstrain distributions within individual grains. CuInSe2 thin films for solar cells are used as a model system. High-resolution electron backscatter diffraction and X-ray microdiffraction as well as Raman microspectroscopy were applied for this comparison. Consistently, microstrain values were determined of the order of 10(-4) by these three techniques. However, only electron backscatter diffraction, X-ray microdiffraction exhibit sensitivities appropriate for mapping local strain changes at the submicrometer level within individual grains in polycrystalline materials.
authors.affiliation: Helmholtz-Zentrum Berlin für Materialien und Energie GmbH, Institute Nano-architectures for Energy Conversion (EE-IN), Hahn-Meitner-Platz 1, 14109 Berlin, Germany. Electronic address: norbert.schaefer@helmholtz-berlin.de.
authors.forename: Norbert
authors.initials: N
authors.lastname: Schäfer
authors.affiliation: Department of Materials, University of Oxford, Parks Road, Oxford OX1 3PH, UK.
authors.forename: Angus J
authors.initials: AJ
authors.lastname: Wilkinson
authors.affiliation: Federal Institute for Materials Research and Testing, Richard-Willsttter-Str. 11, 12489 Berlin, Germany.
authors.forename: Thomas
authors.initials: T
authors.lastname: Schmid
authors.affiliation: Bruker Nano GmbH, D-12489 Berlin, Germany.
authors.forename: Aimo
authors.initials: A
authors.lastname: Winkelmann
authors.affiliation: ESRF - The European Synchrotron, CS 40220, 38043 Grenoble Cédex 9, France.
authors.forename: Gilbert A
authors.initials: GA
authors.lastname: Chahine
authors.affiliation: ESRF - The European Synchrotron, CS 40220, 38043 Grenoble Cédex 9, France.
authors.forename: Tobias U
authors.initials: TU
authors.lastname: Schülli
authors.affiliation: Helmholtz-Zentrum Berlin für Materialien und Energie GmbH, Institute Nano-architectures for Energy Conversion (EE-IN), Hahn-Meitner-Platz 1, 14109 Berlin, Germany.
authors.forename: Thorsten
authors.initials: T
authors.lastname: Rissom
authors.affiliation: Helmholtz-Zentrum Berlin für Materialien und Energie GmbH, Institute Nano-architectures for Energy Conversion (EE-IN), Hahn-Meitner-Platz 1, 14109 Berlin, Germany; Freie Universitaet Berlin, Institute of Geological Sciences, Malteserstr. 74-100, 12249 Berlin, Germany.
authors.forename: Julien
authors.initials: J
authors.lastname: Marquardt
authors.affiliation: Helmholtz-Zentrum Berlin für Materialien und Energie GmbH, Institute Nano-architectures for Energy Conversion (EE-IN), Hahn-Meitner-Platz 1, 14109 Berlin, Germany; Freie Universitaet Berlin, Institute of Geological Sciences, Malteserstr. 74-100, 12249 Berlin, Germany.
authors.forename: Susan
authors.initials: S
authors.lastname: Schorr
authors.affiliation: Helmholtz-Zentrum Berlin für Materialien und Energie GmbH, Institute Nano-architectures for Energy Conversion (EE-IN), Hahn-Meitner-Platz 1, 14109 Berlin, Germany.
authors.forename: Daniel
authors.initials: D
authors.lastname: Abou-Ras
keywords: EBSD; Microstrain; Raman microspectroscopy; Thin film; X-ray microdiffraction