title: Electrospray-Differential Mobility Hyphenated with Single Particle Inductively Coupled Plasma Mass Spectrometry for Characterization of Nanoparticles and Their Aggregates.
abstract: The novel hyphenation of electrospray-differential mobility analysis with single particle inductively coupled plasma mass spectrometry (ES-DMA-spICPMS) was demonstrated with the capacity for real-time size, mass, and concentration measurement of nanoparticles (NPs) on a particle-to-particle basis. In this proof-of-concept study, the feasibility of this technique was validated through both concentration and mass calibration using NIST gold NP reference materials. A detection limit of 10(5) NPs mL(-1) was determined under current experimental conditions, which is about 4 orders of magnitude lower in comparison to that of a traditional ES-DMA setup using a condensation particle counter as detector. Furthermore, independent and simultaneous quantification of both size and mass of NPs provides information regarding NP aggregation states. Two demonstrative applications include gold NP mixtures with a broad size range (30-100 nm), and aggregated gold NPs with a primary size of 40 nm. Finally, this technique was shown to be potentially useful for real-world samples with high ionic background due to its ability to remove dissolved ions yielding a cleaner background. Overall, we demonstrate the capacity of this new hyphenated technique for (1) clearly resolving NP populations from a mixture containing a broad size range; (2) accurately measuring a linear relationship, which should inherently exist between mobility size and one-third power of ICPMS mass for spherical NPs; (3) quantifying the early stage propagation of NP aggregation with well-characterized oligomers; and (4) differentiating aggregated NPs and nonaggregated states based on the "apparent density" derived from both DMA size and spICPMS mass.
authors.affiliation: Materials Measurement Science Division , NIST , Gaithersburg, Maryland 20899, United States.|University of Maryland , College Park, Maryland 20742, United States.
authors.forename: Jiaojie
authors.initials: J
authors.lastname: Tan
authors.affiliation: Materials Measurement Science Division , NIST , Gaithersburg, Maryland 20899, United States.
authors.forename: Jingyu
authors.initials: J
authors.lastname: Liu
authors.affiliation: University of Maryland , College Park, Maryland 20742, United States.|Chemical Sciences Division , NIST , Gaithersburg, Maryland 20899, United States.
authors.forename: Mingdong
authors.initials: M
authors.lastname: Li
authors.affiliation: Materials Measurement Science Division , NIST , Gaithersburg, Maryland 20899, United States.
authors.forename: Hind
authors.initials: H
authors.lastname: El Hadri
authors.affiliation: Materials Measurement Science Division , NIST , Gaithersburg, Maryland 20899, United States.
authors.forename: Vincent A
authors.initials: VA
authors.lastname: Hackley
authors.affiliation: University of Maryland , College Park, Maryland 20742, United States.|Chemical Sciences Division , NIST , Gaithersburg, Maryland 20899, United States.
authors.forename: Michael R
authors.initials: MR
authors.lastname: Zachariah