title: Defect Detection in Textures through the Use of Entropy as a Means for Automatically Selecting the Wavelet Decomposition Level.
abstract: This paper presents a robust method for defect detection in textures, entropy-based automatic selection of the wavelet decomposition level (EADL), based on a wavelet reconstruction scheme, for detecting defects in a wide variety of structural and statistical textures. Two main features are presented. One of the new features is an original use of the normalized absolute function value (NABS) calculated from the wavelet coefficients derived at various different decomposition levels in order to identify textures where the defect can be isolated by eliminating the texture pattern in the first decomposition level. The second is the use of Shannon's entropy, calculated over detail subimages, for automatic selection of the band for image reconstruction, which, unlike other techniques, such as those based on the co-occurrence matrix or on energy calculation, provides a lower decomposition level, thus avoiding excessive degradation of the image, allowing a more accurate defect segmentation. A metric analysis of the results of the proposed method with nine different thresholding algorithms determined that selecting the appropriate thresholding method is important to achieve optimum performance in defect detection. As a consequence, several different thresholding algorithms depending on the type of texture are proposed.
authors.affiliation: Divisi&#243;n de Sistemas e Ingenier&#237;a Electr&#243;nica (DSIE), Universidad Polit&#233;cnica de Cartagena, Campus Muralla del Mar, s/n, Cartagena E-30202, Spain. pedroj.navarro@upct.es.
authors.forename: Pedro J
authors.initials: PJ
authors.lastname: Navarro
authors.affiliation: Divisi&#243;n de Sistemas e Ingenier&#237;a Electr&#243;nica (DSIE), Universidad Polit&#233;cnica de Cartagena, Campus Muralla del Mar, s/n, Cartagena E-30202, Spain. carlos.fernandez@upct.es.
authors.forename: Carlos
authors.initials: C
authors.lastname: Fernández-Isla
authors.affiliation: Divisi&#243;n de Sistemas e Ingenier&#237;a Electr&#243;nica (DSIE), Universidad Polit&#233;cnica de Cartagena, Campus Muralla del Mar, s/n, Cartagena E-30202, Spain. pedro.alcover@upct.es.
authors.forename: Pedro María
authors.initials: PM
authors.lastname: Alcover
authors.affiliation: Divisi&#243;n de Innovaci&#243;n en Sistemas Telem&#225;ticos y Tecnolog&#237;a Electr&#243;nica (DINTEL), Universidad Polit&#233;cnica de Cartagena, Campus Muralla del Mar, s/n, Cartagena E-30202, Spain. juan.suardiaz@upct.es.
authors.forename: Juan
authors.initials: J
authors.lastname: Suardíaz
keywords: Shannon entropy; automatic band selection; texture defect detection; wavelet transform