title: Double micropipettes configuration method of scanning ion conductance microscopy.
abstract: In this paper, a new double micropipettes configuration mode of scanning ion conductance microscopy (SICM) is presented to better overcome ionic current drift and further improve the performance of SICM, which is based on a balance bridge circuit. The article verifies the feasibility of this new configuration mode from theoretical and experimental analyses, respectively, and compares the quality of scanning images in the conventional single micropipette configuration mode and the new double micropipettes configuration mode. The experimental results show that the double micropipettes configuration mode of SICM has better effect on restraining ionic current drift and better performance of imaging. Therefore, this article not only proposes a new direction of overcoming the ionic current drift but also develops a new method of SICM stable imaging.
authors.affiliation: School of Mechanical Engineering, Xi'an Jiao Tong University, Xi'an 710049, People's Republic of China.
authors.forename: Jian
authors.initials: J
authors.lastname: Zhuang
authors.affiliation: School of Mechanical Engineering, Xi'an Jiao Tong University, Xi'an 710049, People's Republic of China.
authors.forename: Zeqing
authors.initials: Z
authors.lastname: Li
authors.affiliation: School of Mechanical Engineering, Xi'an Jiao Tong University, Xi'an 710049, People's Republic of China.
authors.forename: Yangbohan
authors.initials: Y
authors.lastname: Jiao
mesh_terms: D064347:Microscopy, Electrochemical, Scanning / Q000379:methods*; D008962:Models, Theoretical