title: A novel lobster-eye imaging system based on Schmidt-type objective for X-ray-backscattering inspection.
abstract: This paper presents a novel lobster-eye imaging system for X-ray-backscattering inspection. The system was designed by modifying the Schmidt geometry into a treble-lens structure in order to reduce the resolution difference between the vertical and horizontal directions, as indicated by ray-tracing simulations. The lobster-eye X-ray imaging system is capable of operating over a wide range of photon energies up to 100 keV. In addition, the optics of the lobster-eye X-ray imaging system was tested to verify that they meet the requirements. X-ray-backscattering imaging experiments were performed in which T-shaped polymethyl-methacrylate objects were imaged by the lobster-eye X-ray imaging system based on both the double-lens and treble-lens Schmidt objectives. The results show similar resolution of the treble-lens Schmidt objective in both the vertical and horizontal directions. Moreover, imaging experiments were performed using a second treble-lens Schmidt objective with higher resolution. The results show that for a field of view of over 200 mm and with a 500 mm object distance, this lobster-eye X-ray imaging system based on a treble-lens Schmidt objective offers a spatial resolution of approximately 3 mm.
authors.affiliation: MOE Key Laboratory of Advanced Micro-Structured Materials, No. 1239 Siping Road, Shanghai 200092, China.
authors.forename: Jie
authors.initials: J
authors.lastname: Xu
authors.affiliation: MOE Key Laboratory of Advanced Micro-Structured Materials, No. 1239 Siping Road, Shanghai 200092, China.
authors.forename: Xin
authors.initials: X
authors.lastname: Wang
authors.affiliation: MOE Key Laboratory of Advanced Micro-Structured Materials, No. 1239 Siping Road, Shanghai 200092, China.
authors.forename: Qi
authors.initials: Q
authors.lastname: Zhan
authors.affiliation: MOE Key Laboratory of Advanced Micro-Structured Materials, No. 1239 Siping Road, Shanghai 200092, China.
authors.forename: Shengling
authors.initials: S
authors.lastname: Huang
authors.affiliation: MOE Key Laboratory of Advanced Micro-Structured Materials, No. 1239 Siping Road, Shanghai 200092, China.
authors.forename: Yifan
authors.initials: Y
authors.lastname: Chen
authors.affiliation: MOE Key Laboratory of Advanced Micro-Structured Materials, No. 1239 Siping Road, Shanghai 200092, China.
authors.forename: Baozhong
authors.initials: B
authors.lastname: Mu
mesh_terms: D008962:Models, Theoretical; D019904:Polymethyl Methacrylate; D014961:X-Ray Diffraction / Q000295:instrumentation* / Q000379:methods*
chemical_list: D019904:Polymethyl Methacrylate