title: Double moiré structured illumination microscopy with high-index materials.
abstract: Structured illumination microscopy utilizes illumination of periodic light patterns to allow reconstruction of high spatial frequencies, conventionally doubling the microscope's resolving power. This Letter presents a structured illumination microscopy scheme with the ability to achieve 60 nm resolution by using total internal reflection of a double moiré pattern in high-index materials. We propose a realization that provides dynamic control over relative amplitudes and phases of four coherently interfering beams in gallium phosphide and numerically demonstrate its capability.
authors.forename: Yochai
authors.initials: Y
authors.lastname: Blau
authors.forename: Doron
authors.initials: D
authors.lastname: Shterman
authors.forename: Guy
authors.initials: G
authors.lastname: Bartal
authors.forename: Bergin
authors.initials: B
authors.lastname: Gjonaj