title: Spectrally resolved white light interferometry to measure material dispersion over a wide spectral band in a single acquisition.
abstract: In this paper we apply spectrally resolved white light interferometry to measure refractive and group index over a wide spectral band from 400 to 1000 nm. The output of a Michelson interferometer is spectrally decomposed by a homemade prism spectrometer with a high resolution camera. The group index is determined directly from the phase extracted from the spectral interferogram while the refractive index is estimated once its value at a given wavelength is known.
authors.forename: Yago
authors.initials: Y
authors.lastname: Arosa
authors.forename: Elena López
authors.initials: EL
authors.lastname: Lago
authors.forename: Luis Miguel
authors.initials: LM
authors.lastname: Varela
authors.forename: Raúl
authors.initials: R
authors.lastname: de la Fuente