title: Analog filtering methods improve leading edge timing performance of multiplexed SiPMs.
abstract: Multiplexing many SiPMs to a single readout channel is an attractive option to reduce the readout complexity of high performance time of flight (TOF) PET systems. However, the additional dark counts and shaping from each SiPM cause significant baseline fluctuations in the output waveform, degrading timing measurements using a leading edge threshold. This work proposes the use of a simple analog filtering network to reduce the baseline fluctuations in highly multiplexed SiPM readouts. With 16 SiPMs multiplexed, the FWHM coincident timing resolution for single [Formula: see text] mm LYSO crystals was improved from 401  ±  4 ps without filtering to 248  ±  5 ps with filtering. With 4 SiPMs multiplexed, using an array of [Formula: see text] mm LFS crystals the mean time resolution was improved from 436  ±  6 ps to 249  ±  2 ps. Position information was acquired with a novel binary positioning network. All experiments were performed at room temperature with no active temperature regulation. These results show a promising technique for the construction of high performance multiplexed TOF PET readout systems using analog leading edge timing pickoff.
authors.affiliation: Department of Radiology, Stanford University, Stanford, CA 94305, USA. Molecular Imaging Program at Stanford (MIPS), Stanford, CA 94305, USA. Department of Electrical Engineering, Stanford University, Stanford, CA 94305, USA.
authors.forename: M F
authors.initials: MF
authors.lastname: Bieniosek
authors.forename: J W
authors.initials: JW
authors.lastname: Cates
authors.forename: A M
authors.initials: AM
authors.lastname: Grant
authors.forename: C S
authors.initials: CS
authors.lastname: Levin
mesh_terms: D000669:Amplifiers, Electronic; D005374:Filtration / Q000295:instrumentation*; D006801:Humans; D049268:Positron-Emission Tomography / Q000295:instrumentation* / Q000379:methods; D012588:Scintillation Counting / Q000295:instrumentation* / Q000379:methods; D012825:Silicon / Q000737:chemistry*; D014057:Tomography, X-Ray Computed / Q000295:instrumentation* / Q000379:methods
chemical_list: D012825:Silicon