title: Electron Diffraction Using Transmission Electron Microscopy.
abstract: Electron diffraction via the transmission electron microscope is a powerful method for characterizing the structure of materials, including perfect crystals and defect structures. The advantages of electron diffraction over other methods, e.g., x-ray or neutron, arise from the extremely short wavelength (≈2 pm), the strong atomic scattering, and the ability to examine tiny volumes of matter (≈10 nm(3)). The NIST Materials Science and Engineering Laboratory has a history of discovery and characterization of new structures through electron diffraction, alone or in combination with other diffraction methods. This paper provides a survey of some of this work enabled through electron microscopy.
authors: National Institute of Standards and Technology, Gaithersburg, MD 20899-8554.
authors: L A
authors: LA
authors: Bendersky
authors: National Institute of Standards and Technology, Gaithersburg, MD 20899-8554.
authors: F W
authors: FW
authors: Gayle
keywords: crystal structure; crystallography; defects; electron diffraction; phase transitions; quasicrystals; transmission electron microscopy