title: Priorities for Standards and Measurements to Accelerate Innovations in Nano-Electrotechnologies: Analysis of the NIST-Energetics-IEC TC 113 Survey.
abstract: In 2008, the National Institute of Standards and Technology and Energetics Incorporated collaborated with the International Electrotechnical Commission Technical Committee 113 (IEC TC 113) on nano-electrotechnologies to survey members of the international nanotechnologies community about priorities for standards and measurements to accelerate innovations in nano-electrotechnologies. In this paper, we analyze the 459 survey responses from 45 countries as one means to begin building a consensus on a framework leading to nano-electrotechnologies standards development by standards organizations and national measurement institutes. The distributions of priority rankings from all 459 respondents are such that there are perceived distinctions with statistical confidence between the relative international priorities for the several items ranked in each of the following five Survey category types: 1) Nano-electrotechnology Properties, 2) Nano-electrotechnology Taxonomy: Products, 3) Nano-electrotechnology Taxonomy: Cross-Cutting Technologies, 4) IEC General Discipline Areas, and 5) Stages of the Linear Economic Model. The global consensus prioritizations for ranked items in the above five category types suggest that the IEC TC 113 should focus initially on standards and measurements for electronic and electrical properties of sensors and fabrication tools that support performance assessments of nano-technology enabled sub-assemblies used in energy, medical, and computer products.
authors: Semiconductor Electronics Division, National Institute of Standards and Technology, Gaithersburg, MD 20899, USA.
authors: Herbert S
authors: HS
authors: Bennett
authors: Energetics Incorporated, Columbia, MD 21046, USA.
authors: Howard
authors: H
authors: Andres
authors: Energetics Incorporated, Columbia, MD 21046, USA.
authors: Joan
authors: J
authors: Pellegrino
authors: Energetics Incorporated, Columbia, MD 21046, USA.
authors: Winnie
authors: W
authors: Kwok
authors: Forschungszentrum Karlsruhe GmbH, Eggenstein-Leoppoldshafen, D-76344 Germany.
authors: Norbert
authors: N
authors: Fabricius
authors: Underwriters Laboratories Inc., Northbrook, IL 60062, USA.
authors: J Thomas
authors: JT
authors: Chapin
keywords: Borda count method; confidence interval; median method; nano-electrotechnologies; priorities; rankings; standards; statistical significance