title: Piezoelectric and Dielectric Properties of Multilayered BaTiO3/(Ba,Ca)TiO3/CaTiO3 Thin Films.
abstract: Highly oriented multilayered BaTiO3-(Ba,Ca)TiO3-CaTiO3 thin films were fabricated on Nb-doped (001) SrTiO3 (Nb:STO) substrates by pulsed laser deposition. The configurations of multilayered BaTiO3-(Ba,Ca)TiO3-CaTiO3 thin films are designed with the thickness ratio of 1:1:1 and 2:1:1 and total thickness ∼300 nm. Microstructural characterization by X-ray diffraction indicates that the as-deposited thin films are highly c-axis oriented and large in-plane strain is determined in BaTiO3 and CaTiO3 layers. Piezoresponse force microscopy (PFM) studies reveal an intense in-plane polarization component, whereas the out-of-plane shows inferior phase contrast. The optimized combination is found to be the BaTiO3-(Ba0.85Ca0.15)TiO3-CaTiO3 structure with combination ratio 2:1:1, which displays the largest domain switching amplitude under DC electric field, the largest room-temperature dielectric constant ∼646, a small dielectric loss of 0.03, and the largest dielectric tunability of ∼50% at 400 kV/cm. These results suggest that the enhanced dielectric and tunability performance are greatly associated with the large in-plane polarization component and domain switching.
authors: Laboratory of Dielectric Materials, School of Materials Science and Engineering, Zhejiang University , Hangzhou 310027, China.|Department of Physics and Astronomy, University of Texas at San Antonio , Texas 78249, United States.
authors: Xiao Na
authors: XN
authors: Zhu
authors: Laboratory of Dielectric Materials, School of Materials Science and Engineering, Zhejiang University , Hangzhou 310027, China.
authors: Ting Ting
authors: TT
authors: Gao
authors: Department of Physics and Astronomy, University of Texas at San Antonio , Texas 78249, United States.
authors: Xing
authors: X
authors: Xu
authors: State Key Laboratory of Electronic Thin films and Integrated Devices, University of Electronic Science and Technology of China , Chengdu, Sichuan 610054, China.
authors: Wei Zheng
authors: WZ
authors: Liang
authors: State Key Laboratory of Electronic Thin films and Integrated Devices, University of Electronic Science and Technology of China , Chengdu, Sichuan 610054, China.
authors: Yuan
authors: Y
authors: Lin
authors: Department of Physics and Astronomy, University of Texas at San Antonio , Texas 78249, United States.
authors: Chonglin
authors: C
authors: Chen
authors: Laboratory of Dielectric Materials, School of Materials Science and Engineering, Zhejiang University , Hangzhou 310027, China.
authors: Xiang Ming
authors: XM
authors: Chen
keywords: BaTiO3−CaTiO3; PFM; dielectric properties; ferroelectric thin films; heretostrctures