title: Equal variations of the Fermi level and work function in graphene at the nanoscale.
abstract: If surface effects are neglected, any change of the Fermi level in a semiconductor is expected to result in an equal and opposite change of the work function. However, this is in general not observed in three-dimensional semiconductors, because of Fermi level pinning at the surface. By combining Kelvin probe force microscopy and scanning tunneling spectroscopy on single layer graphene, we measure both the local work function and the charge carrier density. The one-to-one equivalence of changes in the Fermi level and the work function is demonstrated to accurately hold in single layer graphene down to the nanometer scale.
authors: Université Grenoble Alpes, F-38000 Grenoble, France. clemens.winkelmann@neel.cnrs.fr and CNRS, Institut Néel, F-38000 Grenoble, France.
authors: Sayanti
authors: S
authors: Samaddar
authors: Université Grenoble Alpes, F-38000 Grenoble, France. clemens.winkelmann@neel.cnrs.fr and CNRS, Institut Néel, F-38000 Grenoble, France.
authors: Johann
authors: J
authors: Coraux
authors: Université Grenoble Alpes, F-38000 Grenoble, France. clemens.winkelmann@neel.cnrs.fr and CEA, INAC-SBT, F-38000 Grenoble, France.
authors: Sylvain C
authors: SC
authors: Martin
authors: Université Grenoble Alpes, F-38000 Grenoble, France. clemens.winkelmann@neel.cnrs.fr and CEA, INAC-SPrAM, F-38000 Grenoble, France.
authors: Benjamin
authors: B
authors: Grévin
authors: Université Grenoble Alpes, F-38000 Grenoble, France. clemens.winkelmann@neel.cnrs.fr and CNRS, Institut Néel, F-38000 Grenoble, France.
authors: Hervé
authors: H
authors: Courtois
authors: Université Grenoble Alpes, F-38000 Grenoble, France. clemens.winkelmann@neel.cnrs.fr and CNRS, Institut Néel, F-38000 Grenoble, France.
authors: Clemens B
authors: CB
authors: Winkelmann